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个人简介 2014年毕业于华南理工大学,获工学博士学位,硕士生导师,广西“千骨计划”人选,目前为桂林电子科技大学广西自治区特聘专家团队成员,广东省焊接技术研究所特聘研究员,指导在读研究生6人。研究内容包括电子微连接、电子器件可靠性、焊接材料与工艺等。近年来主持与主要参加的省(厅)级以上科研项目20余项,其中主持项目包括:国家自然科学基金项(No.51505095, 2016.01-2018.12)、广西自治区重点实验室主任课题1项(No.15-140-30-003Z, 已结题)、广西有色金属及特色材料加工国家重点实验室培育基地开放课题项目(No.14KF-3, 已结题)、广东省创新驱动项目(2018GDASCX0113, 2018.1-2020.1)、广西自然科学基金青年项目(2016GXNSFBA380114, 2016.5-2019.5)、广西自然科学基金面上项目(2018GXNSFAA281222,2019.1-2021.12)以及广西人才和基地项目等。此外参与省部级以上项目十余项并参与多项企业项目。曾获 IEEE-CMPT和中国电子学会颁发的 Cisco&ASE Best Student Paper Awards(2014,排名第一)、广西区教学成果奖一等奖(2017年)和桂林电子科技大学本科教学质量优秀奖二等奖(2017年)。近五年发表SCI或EI收录论文40余篇,其中第一作者或通讯作者20余篇。所指导研究生和本科生多人获得“国家奖学金”,获得学校“优秀研究生指导教师”称号。目前经费充足,待遇优厚,欢迎肯吃苦同学报考。 工作经历 2015.01-至今 桂林电子科技大学机电工程学院,讲师,副教授,教授(校聘) 教学信息 《材料力学》,《微连接技术原理》,《电子封装材料》,《机电专业外语》,《大学物理》 科研项目 一、主持省(厅)级以上项目 1. 国家自然科学基金项目,51505095,倒装芯片微焊点微观组织不均匀性和电迁移行为之间的相互影响及作用机制研究,2016/01-2018/12,在研,主持。 2. 广西制造系统与先进制造技术重点实验室主任课题项目:15-140-30-003Z,微观组织不均匀性对电迁移行为的影响及电迁移可靠性优化设计,已结题,主持。 3. 广西有色金属及特色材料加工国家重点实验室培育基地开放基金项目:14KF-3,Al-Mg-Si合金微观组织和阻尼性能研究,已结题,主持。 4. 广西自然科学基金项目,项目编号2016GXNSFBA380114,基于石墨烯纳米复合材料的MEMS电化学传感器电极修饰材料制备与应用研究,2016/09-2019/09,在研,主持。 5. 广东省创新驱动项目,新型Ni3Al基高温合金IC10宽间隙瞬间液相扩散焊技术研究,2018GDASCX-1005,2018/01-2020/01,在研,主持。 6. 广西自然科学基金面上项目,项目编号2018GXNSFAA281222,高密度封装微焊点组织不均匀性与物相各向异性研究。2019/01-2021/12,在研,主持。 7. 广西人才和基地项目,电子工业微焊点电迁移可靠性研究和评估,2019/01-2021/12,在研,主持。 二、部分参与项目 1、教育部高等学校博士点科研基金,20130172120055,高密度电子封装微焊点界面IMC?相的异质形核与演化机制及焊点可靠性,2014/01-2016/12,在研,参加。 2、国家自然科学基金面上项目,51275178,BGA?结构无铅微焊点在电-热-力多场作用下迁移和失效行为及其尺寸效应,2013/01-2016/12,在研,参加。 3、国家自然科学基金青年基金项目,51205135,NiTi记忆合金智能材料与结构在热-力耦合下相变和组织演变的相场法模拟研究,2013/01-2015/12, 4、中央高校基本科研资助项目,2013ZM0026,三维封装微小体积焊点特殊界面反应和凝固行为的尺寸效应及焊点可靠性,2013/01-2014/12,已结题,参加。 5、中央高校基本科研资助项目:基于相场法的含纳米缺陷NiTi?合金智能结构材料的基础相变问题及其微结构调控,项目批准号:2013ZM0023;项目起止时间:2013/01-2014/12,已结题,参加。 6、教育部高等学校博士点科研基金,20110172110003,无铅微尺度焊点形成时的界面反应和过冷凝固行为及其对微互连可靠性的影响,2011/01-2013/12,已结题,参加。 7、中央高校基本科研资助项目,2011ZB0007,NiTi?智能减振器在应力场作用下的相变行为及微观结构演变的多尺度模拟研究,2011/01-2012/12,已结题,参加。 8、先进焊接与连接国家重点实验室基金,AWPT-Z04,TLP?工艺制备窄间隙新型微互连焊点及其蠕变疲劳和阻尼行为研究,2011/01-2012/12,已结题,参加。 9、广东省重大科技专项,2009A080204005,典型家电产品低成本无铅制造共性技术研究与应用-无铅钎料子项目,2009/01-2011/12,已结题,参加。 10. 国家重点研发计划重点专项项目,稀贵金属焊接/装联导电材料制备技术,2017YFB0305700,2017.7-2020.6,参与在研 知识产权 1. 秦红波;王瑛;王珊珊;冯闯;栾兴贺;杨道国.一种基于图像识别的快速有限元建模和求解分析方法. CN106446421A(发明专利) 2. 江鸿杰;刘崇宇;罗鲲;秦红波;李伯炳. 一种造孔剂烧结制备泡沫纯铝材料的方法. CN106498218A(发明专利) 3. 江鸿杰;秦红波;杨振兴;李飞龙;寻茁圃. 一种高阻尼镍钛丝增强铝基复合材料及其制备方法. CN106319400A (发明专利) 4. 江鸿杰;罗鲲;刘崇宇;秦红波;朱炳桥.一种造孔剂法制备5系泡沫铝合金材料的方法. CN106381413A (发明专利) 5. 江鸿杰;唐鑫;王春霞;秦红波;杨振兴.一种造孔剂法烧结制备7系泡沫铝合金材料的方法. CN106399741A(发明专利) 6. 秦红波,刘天寒,郭磊,文泉璋,李祎康,梁正超.锡基二元共晶合金微观组织的模拟及有限元求解分析方法,201811506649. 5(发明专利) 7. 秦红波;邝田锋;王瑛等.有限元二维图形建模分析软件,登记号2018SR928320 (软件著作权). 8. 秦红波; 文章璋;郭磊等.一种锡基二元共晶相分离的有限元模拟方法. CN201910811200.8 (发明专利)

研究领域

研究领域:电子元器件与微纳结构可靠性;电子封装材料、机械工程材料;工程有限元分析。招生专业:机械、材料相关专业。

近期论文

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[1] Zhou Minbo. Qin Hongbo, Ma Xiao,et al,Interfacial reaction and melting/solidification characteristics between Sn and different metallizations of Cu, Ag, Ni and Co,2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010,202-207. (EI收录) [2] Yue Wu, Zhou Minbo,Qin Hongbo,et al,A comparative investigation of the electromigration behavior between wedge-type and line-type Cu/Sn3.0Ag0.5Cu/Cu interconnects,2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011,971-975. (EI收录) [3] Li Xunping,Xia Jianmin,Qin Hongbo,et al. Study of critical factors influencing the solidification undercooling behavior of Sn-3.0Ag-0.5Cu (SAC) lead-free solder and SAC/Cu joints,2012 13th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2012,356-360. (EI收录) [4] Li Wei,Zhou Minbo. Qin Hongbo, Zhang Xinping, et al. Experimental and numerical study of the size effection microstructure and mechanical behavior of Cu/Sn0.7Cu0.05Ni/Cu joints with very small solder volume,2012 13th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2012,749-754. (EI收录) [5] Li Xunping,Qin Hongbo,X.P. Zhang et al,Loading rate and size effect on the fracture behavior of BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu interconnects,2012 13th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2012,1298-1302. (EI收录) [6] Wu. Yue,Qin Hongbo,Zhou Minbo,et al. Influences of the initial thickness of the interfacial IMC layer on electromigration behavior of Cu/Sn/Cu microscale joints,2012 13th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP, 2012,1320-1325. (EI收录) [7] Yue Wu,Qin Hongbo,Zhou Minbo, et al. Influence of pre-existing void in the solder joint on electromigration behavior of Cu/Sn58Bi/Cu joints,2013 14th International Conference on Electronic Packaging Technology, ICEPT 2013,1005-1009. (EI收录) [8] Li Wangyun,Qin Hongbo,Zhou Minbo,et al. The influence of imposed electric current on the tensile fracture behavior of micro-scale Cu/Sn-3.0Ag-0.5Cu/Cu solder joints,2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014,1030-1034. (EI收录) [9] 岳武,秦红波,周敏波,张新平.结构变化对Cu/Sn-58Bi/Cu微焊点电迁移行为和组织演变的影响,金属学报,2012,48(6):678-686. (SCI收录) [10] Yue Wu,Qin Hongbo,Zhou Minbo, et al. Electromigration induced microstructure evolution and damage in asymmetric Cu/Sn-58Bi/Cu solder interconnect under current stressing,Transactions of Nonferrous Metals Society of China,2014,24(5):1619-1628. [11] Yuwen Huihui, Qin Hongbo, Zhang Xinping, et al. The interfacial thermo-mechanical reliability of 3D memory-chip stacking with through silicon via array, ICEPT, 2015: 568-573. [12] Qin Hongbo, Yue Wu, Zhang Xinping, ea al. Size and geometry effects on the electromigration behavior of flip-chip Sn3.5Ag solder joints, ICEPT, 2015: 651-655. (EI收录) [13] Qin Hongbo, Li Bin, et al. Interaction effect between electromigration and microstructure evolution in Cu/Sn-58Bi/Cu solder interconnect. IEEE-ECTC, Florida, 2014: 2249-2254. (EI收录) [14] Qin Hongbo, Yue Wu, et al. Interaction effect between electromigration and microstructure evolution in BGA structure solder interconnects, ICEPT, Chengdu, 2014: 10-16. (EI收录) [15] Qin Hongbo, Zhang Xinping. Influence of geometry of microbumps on thermal stress and fatigue life of interconnects in copper filled through silicon via structure. ICEPT, Dalian, 2013: 1019-1024. (EI收录) [16] Qin Hongbo, Li Xunping, Zhang Xinping. Solder volume effects on the fatigue life of BGA structure Cu/Sn-3.0Ag-0.5Cu/Cu interconnects. IEEE-EMAP, Hongkong, 2012: 601-607. (EI收录) [17] Qin Hongbo, Li Xunping, Zhang XinPing. Influence of thickness of interfacial IMC layer and solder mask layer on mechanical reliability of BGA interconnects.ICEPT-HDP, Guilin, 2012: 714-719. (EI收录) [18] Qin Hongbo, Li Bin, Zhang Xinping. Finite element simulation of fracture behavior of BGA structure solder interconnects. ICEPT-HDP, Shanghai, 2011: 991-996. (EI收录) [19] Qin Hongbo, Li Bin, Zhang Xinping. Finite element simulation of interfacial fracture and impact behavior at microscale Sn-Ag-Cu solder interconnects. ICEPT-HDP, Xi’an, 2010: 594-600. (EI收录) [20] 秦红波, 李望云, 李勋平, 张新平. BGA结构无铅微焊点的低周疲劳行为研究. 机械工程学报, 2014, 50(20): 54-62. (EI收录) [21] Qin Hongbo, Li Wangyun, Zhou Minbo, et al. Low cycle fatigue performance of ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints. Microelectronics Reliability, 2014, 54: 1871-1881. (SCI) [22] Qin Hongbo, Zhang Xinping, Zhou Minbo, et al. Size and constraint effects on mechanical and fracture behavior of micro-scale Ni/Sn3.0Ag0.5Cu/Ni solder joints. Materials Science and Engineering-A, 2014, 617: 14-23. (SCI二区) [23] Qin Hongbo, Zhang Xinping, Zhou MinBo, et al. Geometry effect on mechanical performance and fracture behavior of micro-scale ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints. Microelectronics Reliability, 2015, 55: 1214-1225. (SCI) [24] 李望云;秦红波;周敏波;张新平.电-力耦合作用下Cu/Sn-3.0Ag-0.5Cu/Cu微焊点的拉伸力学性能和断裂行为,机械工程学报,2016, 52(10),46-53.(EI收录) [25] Wang Sansan, Zhang Ping, Yang Daoguo, Qin Hongbo(通信作者), et al. Influence of microstructure inhomogeneity on the electromigration behavior of flip chip solder joints. ICEPT, 2016: 1-6. (EI收录) [26] Wang Sansan, Wang Ying, Zhang Ping, Guo Lei, Qin Hongbo (通信作者), Jiang Hongjie, Yan Hong. Influence of microstructure inhomogeneity on the electromigration behavior of flip chip solder joints 17 th International Conference on Electronic Packaging Technology, ISBN 9781509013968, 283-288, 2016, IEEE Inc. EI(检索号20164502990832) [27] Chuang Feng, Xing-He Luan, Ping Zhang, Jing Xiao, Dao-Guo Yang, Hong-Bo Qin(通信作者). A first-principle study of the adsorption behavior of NO gas molecules on pristine and Al-doped penta-graphene. 18 th International Conference on Electronic Packaging Technology, ISBN 9781538629727, 1138-1142, 2017, IEEE Inc. EI(检索号20174504376320) [28] Fan-Fan Niu, Xing-He Luan, Chuang Feng, Ying-Hong Zhang, Dao-Guo Yang, Hong-Bo Qin(通信作者), Hong-Jie Jiang, Feng-Mei Liu. The study on elastic properties of Cu3Sn under pressure via first-principle calculations . 18 th International Conference on Electronic Packaging Technology, ISBN 9781538629727, 1207-1211, 2017, IEEE Inc. EI(检索号20174504376434) [29] Xing-He Luan, Chuang Feng, Hong-Bo Qin(通信作者), Fan-Fan Niu, Dao-Guo Yang. The electronic properties of zinc-blende GaN, wurtzite GaN and pnma-GaN crystals under pressure. 18 th International Conference on Electronic Packaging Technology, ISBN 9781538629727, ?1483-1487, 2017, IEEE Inc. EI(检索号20174504376244). [30] Hongbo Qin, Xinghe Luan, Chuang Feng, Daoguo Yang and Guoqi Zhang. Mechanical, Thermodynamic and Electronic Properties of Wurtzite and Zinc-Blende GaN Crystals. Materials 2017, 10(12), 1419. (SCI) [31] Qin Hongbo, Feng Chuang, Luan Xinghe, Yang Daoguo*. First-principles investigation of adsorption behaviors of small molecules on penta-graphene. Nanoscale research letters, 2018, 13(1), 264. (SCI) [32] Feng Chuang, Qin Hongbo*(通信作者), Luan, Xinghe, Kuang Tianfeng, Yang Daoguo. Gas sensing properties of two-dimensional penta-BP5: A first-principle study. 2018, Chemical Physics Letters, 706, 355-359. (SCI) [33] Qin Hongbo, Kuang Tianfeng, Luan Xinghe, Li Wangyun, Xiao Jing, Zhang Ping, Yang Daoguo, Zhang Guoqi, Influence of pressure on the mechanical and electronic properties of wurtzite and zinc-blende GaN crystals. 2018, Crystals, 8(11): 428. (SCI) [34] Hongbo Qin, Tianfeng Kuang, Qi Li, et al. Stress Concentration Induced by the Crystal Orientation in the Transient-Liquid-Phase Bonding Joint of Single-Crystalline Ni3Al. 2019, Materials, 12(17), 2765. (SCI) [35] Feng Chuang, Qin Hongbo*(通信作者), Yang Daoguo, Zhang Guoqi. (2019). First-principles investigation of the adsorption behaviors of CH2O on BN, AlN, GaN, InN, BP, and P monolayers. 2019, Materials, 12(4), 676. (SCI) [36] Qin Hongbo*, Luan Xinghe, Yue Wu. Influence of Phase Inhomogeneity on Electromigration Behavior in Cu/Sn-58Bi/Cu Solder Joint. Journal of Electronic Materials, 2019, 48(6), 3410-3414. (SCI) [37] Liu Tianhan, Qin Hongbo*(通信作者),Yang Daoguo, Zhang Guoqi. First Principles Study of Gas Molecules Adsorption on Monolayered β-SnSe. Coatings, 2019, 9(6), 390. (SCI)

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