Smith, Kevin - Boston University - Department of Materials Science & Engineering

研究领域

Synchrotron-radiation based x-ray spectroscopic studies of the electronic structure of materials. Systems of fundamental scientific and technological interest are investigated, with definitive measurements made of their surface, bulk, interface, and nano-scale electronic properties. Among the spectroscopies used are angle resolved photoemission, soft x-ray emission, resonant inelastic x-ray scattering, and x-ray absorption. See the “Novel Materials Laboratory site”:http://nml.bu.edu for more information.

近期论文

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12/01/10 Soft x-ray spectroscopic study of the ferromagnetic insulator V{_0.82}Cr{_0.18}O{_2} 06/22/10 Direct evidence of metallicity at ZnO (0001bar)-(1×1) surfaces from angle-resolved photoemission spectroscopy 02/10/10 Electronic structure of N,N’-ethylene-bis(1,1,1-trifluoropentane-2,4-dioneiminato)-copper(II) (Cu-TFAC), from soft X-ray spectroscopies and density functional theory calculations 01/19/10 Electronic band structure information of GdN extracted from x-ray absorption and emission spectroscopy 01/11/10 Electronic structure of C60/Phthalocyanine/ITO interfaces studied using soft x-ray spectroscopies 01/06/10 Soft x-ray spectroscopy study of the element and orbital contributions to the electronic structure of copper hexadecafluoro-phthalocyanine 12/30/09 Comparative study of bandwidths in copper delafossites from x-ray emission spectroscopy 02/05/09 X-ray spectroscopic study of the electronic structure of CuCrO2 01/12/09 Electronic Structure of In2O3 from Resonant X-ray Emission Spectroscopy 10/14/08 Band structure of ZnO from resonant x-ray emission spectroscopy 09/24/08 Observation of quantized subband states and evidence for surface electron accumulation in CdO from angle-resolved photoemission spectroscopy 04/25/08 Nature of the Band Gap of In2O3 Revealed by First-Principles Calculations and X-Ray Spectroscopy