个人简介
2004年获得浙江大学电路与系统博士学位;
2004.9至今在浙江大学任教,从事高性能嵌入式CPU/DSP、纳米工艺成品率提升、LED智能照明SoC芯片研发等方面工作;
2006年在瑞典林雪平大学(Linköping University)开展项目联合研发及交流。
主持了国家863项目“高性能CPU-DSP异构多核SOC平台技术”(2005AA1Z1271)的研发;
主持了国家科技重大专项“可制造性和成品率技术研究”(项目编号:2009ZX02302-003)的研发;
作为项目第三承担人,完成了国家科技重大专项“先进EDA工具平台开发”(项目编号:2008ZX01035-001)的核心任务攻坚。
目前正在主持国家863计划“CMC系列芯片的设计、开发与制造”(课题编号:2012AA041701)课题相关任务的研发。
作为专利第一发明人获得2项国内授权发明专利,形成了检测硅栅断路和短路随机缺陷、在通孔可扩展子区域中按照芯片设计规则均匀增加通孔的成品率分析及提升方法。
发表SCI/EI论文9篇,获得多项软件著作权证书。
近期论文
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① An improved shape shifting method of critical area extraction,Journal of Semiconductor,2014.2,2/5(通讯作者,EI 收录);
② 一种快速计算和优化关键面积提高成品率的方法,电路与系统学报,2013.4,2/4(通讯作者);
③ Novel serpentine structure design method considering confidence level and estimation precision,Journal of Zhejiang University SCIENCE,2013.3,2/5(通讯作者,SCI 收录);
④ Defect Density Extraction of Gate Oxide shorts Incorporating Defect Clustering with Pseudo Transistor Arrays,Chinese Journal of Electronics,2013.1,1/5(SCI 收录);
⑤ A new via chain design method considering confidence level and estimation precision,Journal of Zhejiang University SCIENCE,2012.9,1/4(通讯作者,SCI 收录);
⑥ Scratch-concerned yield modeling for IC manufacturing involved with a chemical mechanical polishing process , Journal of Zhejiang University SCIENCE,2012.5,2/3(通讯作者,SCI 收录);
⑦ Pseudo Transistor Matrix for Defect Density Extraction of Gate Oxide Shorts,APPLIED MATERIALS AND ELECTRONICS ENGINEERING,2012.1,2/3(SCI 收录);
⑧ Current oscillations and low-frequency noises in GaAs MESFET channels with sidegating bias,Journal of Zhejiang University SCIENCE,2011.7,2/3(通讯作者,SCI 收录);
⑨ A Novel Transient Improvement with Overshoot Suppression,2011 International Conference on High Performance Structures and Materials Engineering,2011,2/3(SCI、EI 收录)。