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个人简介

Education: 2010/02 - 2010/12,Tianjin University, Ph. D. 2008/01 - 2010/01,Virginia Tech, Exchange student 2006/09 - 2007/12,Tianjin University, Master 2002/09 - 2006/07,Tianjin University, Bachelor Work experience: 2011/05 until now, School of Materials Science and Engineering of Tianjin University, associated professor 2012/01 - 2012/02, Virginia Tech, visiting scholar 2015/02 - 2015/06, Hong Kong University of Science and Technology, visiting professor Honors and awards: IEEE CPMT Japan Chapter Young Award; Peiyang Young Scholar" of Tianjin University. Research projects: Two 863 projects and 2 NSFC projects.

研究领域

Power electronics and materials; Reliability evaluation; Low temperature sinter-joining Micro-joining Fracture and plastic mechanics; Electrochemical migration; Finite element analysis.

近期论文

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Insulation and Reliability Enhancement by a Nonlinear Conductive Polymer-Nanoparticle Coating for Packaging of High-Voltage Power Devices IEEE Transactions on Dielectrics and Electrical Insulation 2023 | Journal article DOI: 10.1109/TDEI.2023.3316631 CONTRIBUTORS: Kai-Bing Sun; Yun-Hui Mei; Zhi-Bin Shuai; Longnv Li On-Site Estimation of Thermal Resistance Degradation of Double-Sided Cooling (DSC) Power Modules Under Power Cycling Conditions IEEE Journal of Emerging and Selected Topics in Power Electronics 2023-08 | Journal article DOI: 10.1109/JESTPE.2023.3278453 CONTRIBUTORS: Yue Chen; Yun-Hui Mei; Puqi Ning; Guo-Quan Lu Reliability Improvement of Low-Temperature Sintered Nano-Silver as Die Attachment by Porosity Optimization IEEE Transactions on Components, Packaging and Manufacturing Technology 2023-08 | Journal article DOI: 10.1109/TCPMT.2023.3299291 CONTRIBUTORS: Bowen Zhang; Shaoqiong Zhang; Xinyan Lu; Lili Han; Yun-Hui Mei Copper-Wire Stress Buffers for Extending Lifetime of Double-Sided Bidirectional SiC Modules IEEE Transactions on Power Electronics 2023-06 | Journal article DOI: 10.1109/TPEL.2023.3252266 CONTRIBUTORS: Siqi Liu; Yun-Hui Mei; Jing Li; Xin Li; Guo-Quan Lu Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles IEEE Transactions on Device and Materials Reliability 2023-06 | Journal article DOI: 10.1109/TDMR.2023.3272928 CONTRIBUTORS: Panpan Lu; Longnv Li; Guo-Quan Lu; Zhibin Shuai; Xinhua Guo; Yun-Hui Mei Reliable Aluminum Wire-Bonded SiC/Si Diodes With Laminated Al/Cu Stress Buffers IEEE Transactions on Power Electronics 2022-09 | Journal article DOI: 10.1109/TPEL.2022.3170067 CONTRIBUTORS: Xiao-Di Li; Guo-Quan Lu; Yun-Hui Mei Reliable epoxy/SiC composite insulation coating for high-voltage power packaging Journal of Materials Science: Materials in Electronics 2022-09 | Journal article DOI: 10.1007/s10854-022-08865-8 CONTRIBUTORS: Yu Liang; Gaojia Zhu; Guo-Quan Lu; Yun-Hui Mei A Reliable Way to Improve Electrochemical Migration (ECM) Resistance of Nanosilver Paste as a Bonding Material Ding Zikun,Wang Zhichao,Zhang Bowen,Lu Guo-Quan,Mei Yun-Hui Page:4748 ISSN:2076-3417 2022 Container-title:Applied Sciences Design and Analysis of a Self-Circulated Oil Cooling System Enclosed in Hollow Shafts for Axial-Flux PMSMs IEEE Transactions on Vehicular Technology 2022-05 | Journal article DOI: 10.1109/TVT.2022.3154150 CONTRIBUTORS: Gaojia Zhu; Longnv Li; Yunhui Mei; Tao Liu; Ming Xue Large-Area Bonding by Sintering of a Resin-Free Nanosilver Paste at Ultralow Temperature of 180 °C IEEE Transactions on Components, Packaging and Manufacturing Technology 2022-04 | Journal article DOI: 10.1109/TCPMT.2022.3159033 CONTRIBUTORS: Shi Chen; Yun-Hui Mei; Meiyu Wang; Xin Li; Guo-Quan Lu Pressureless Sintered-Silver as Die Attachment for bonding Si and SiC Chips on Silver, Gold, Copper, and Nickel Metallization for Power Electronics Packaging: The Practice and Science IEEE Journal of Emerging and Selected Topics in Power Electronics 2022-04 | Journal article DOI: 10.1109/JESTPE.2022.3150223 CONTRIBUTORS: Meiyu Wang; Yunhui Mei; Weibo Hu; Xin Li; Guo-Quan Lu Packaging Design of 15 kV SiC Power Devices With High-Voltage Encapsulation IEEE Transactions on Dielectrics and Electrical Insulation 2022-02 | Journal article DOI: 10.1109/TDEI.2022.3146569 CONTRIBUTORS: Junjie Li; Yu Liang; Yunhui Mei; Xinling Tang; Guo-Quan Lu High-Temperature Characterizations of a Half-Bridge Wire-Bondless SiC MOSFET Module IEEE Journal of the Electron Devices Society 2021 | Journal article DOI: 10.1109/JEDS.2021.3119428 CONTRIBUTORS: Yue Chen; Guangyin Lei; Guo-Quan Lu; Yun-Hui Mei Pressureless Sintered-Silver Die-Attach at 180 °C for Power Electronics Packaging IEEE Transactions on Power Electronics 2021-11 | Journal article DOI: 10.1109/TPEL.2021.3074853 CONTRIBUTORS: Meiyu Wang; Yun-Hui Mei; Jingyou Jin; Shi Chen; Xin Li; Guo-Quan Lu A 200 °C curable soft magnetic composite with high permeability and low core loss for power applications at >1 MHz Journal of Magnetism and Magnetic Materials 2021-10 | Journal article DOI: 10.1016/j.jmmm.2021.168061 CONTRIBUTORS: Xiaoyan Yao; Panpan Lu; Yanhong Tian; Guo-Quan Lu; Yunhui Mei A Double-Sided Bidirectional Power Module With Low Heat Concentration and Low Thermomechanical Stress IEEE Transactions on Power Electronics 2021-09 | Journal article DOI: 10.1109/TPEL.2021.3066582 CONTRIBUTORS: Junlin Cao; Jing Li; Yun-Hui Mei A Way to Reduce Leakage Current and Improve Reliability of Wire-Bonds for 300-A Multichip SiC Hybrid Modules IEEE Journal of Emerging and Selected Topics in Power Electronics 2021-08 | Journal article DOI: 10.1109/JESTPE.2020.3028132 CONTRIBUTORS: Wenbin Deng; Yunhui Mei; Meiyu Wang; Xin Li; Changsheng Ma; Guo-Quan Lu Ratcheting Behavior of Sintered Copper Joints for Electronic Packaging IEEE Transactions on Components, Packaging and Manufacturing Technology 2021-06 | Journal article DOI: 10.1109/TCPMT.2021.3070020 CONTRIBUTORS: Yanliang Shan; Yunhui Mei; Meiyu Wang; Xin Li; Yanhong Tian; Gang Chen; Kim Shyong Siow

学术兼职

IEEE member; Committee member of Device Sub-committee of China Power Supply Society.

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