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个人简介

Stephen J. Pennycook is a Professor in the Materials Science and Engineering Dept., National University of Singapore, an Adjunct Professor in the University of Tennessee and Adjoint Professor in Vanderbilt University, USA. Previously, he was Corporate Fellow in the Materials Science and Technology Division of Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. Prof. Pennycook is a Fellow of the American Physical Society, the American Association for the Advancement of Science, the Microscopy Society of America, the Institute of Physics and the Materials Research Society. He has received the Microbeam Analysis Society Heinrich Award, the Materials Research Society Medal, the Institute of Physics Thomas J. Young Medal and Award, the Hsun Lee Award of the Chinese Academy of Sciences and the Materials Research Society Innovation in Characterization Award.

研究领域

Materials and Nanostructures investigated with atomic-resolution Z contrast scanning transmission electron microscopy and electron energy loss spectroscopy.

近期论文

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Scanning Transmission Electron Microscopy; Pennycook, S. J.; Nellist, P. D., Eds.; Springer New York: New York, NY, 2011; pp. 1–90. ISBN:978-1-4419-7199-9 Lin, J.; Cretu, O.; Zhou, W.; Suenaga, K.; Prasai, D.; Bolotin, K. I.; Cuong, N. T.; Otani, M.; Okada, S.; Lupini, A. R.; Idrobo, J.-C.; Caudel, D.; Burger, A.; Ghimire, N. J.; Yan, J.; Mandrus, D. G.; Pennycook, S. J.; Pantelides, S. T. Flexible Metallic Nanowires with Self-Adaptive Contacts to Semiconducting Transition-Metal Dichalcogenide Monolayers. Nature nanotechnology 2014, 9, 436–442. http://10.1038/nnano.2014.81 Li, C.; Wu, Y.; Poplawsky, J.; Pennycook, T. J.; Paudel, N.; Yin, W.; Haigh, S. J.; Oxley, M. P.; Lupini, A. R.; Al-Jassim, M.; Pennycook, S. J.; Yan, Y. Grain-Boundary-Enhanced Carrier Collection in CdTe Solar Cells. Phys Rev Lett 2014, 112, 156103. http://10.1103/PhysRevLett.112.156103 Ishikawa, R.; Lupini, A. R.; Findlay, S. D.; Taniguchi, T.; Pennycook, S. J. Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy. Nano Lett 2014, 1903−1908. http://10.1021/nl500564b Lin, J.; Fang, W.; Zhou, W.; Lupini, A. R.; Idrobo, J.-C.; Kong, J.; Pennycook, S. J.; Pantelides, S. T. AC/AB Stacking Boundaries in Bilayer Graphene. Nano Lett 2013, 13, 3262–3268. http://dx.doi.org/10.1021/nl4013979 Lee, J.; Zhou, W.; Pennycook, S. J.; Idrobo, J.-C.; Pantelides, S. T. Direct Visualization of Reversible Dynamics in a Si6 Cluster Embedded in a Graphene Pore. Nature Communications 2013, 4, 1650–7. http://dx.doi.org/10.1038/ncomms2671 Kim, Y.-M.; He, J.; Biegalski, M. D.; Ambaye, H.; Lauter, V.; Christen, H. M.; Pantelides, S. T.; Pennycook, S. J.; Kalinin, S. V.; Borisevich, A. Y. Probing Oxygen Vacancy Concentration and Homogeneity in Solid-Oxide Fuel-Cell Cathode Materials on the Subunit-Cell Level. Nature Materials 2012, 11, 1–7. http://dx.doi.org/10.1038/nmat3393 Zhou, W.; Kapetanakis, M.; Prange, M.; Pantelides, S. T.; Pennycook, S. J.; Idrobo, J.-C. Direct Determination of the Chemical Bonding of Individual Impurities in Graphene. Phys Rev Lett 2012, 109, 206803. http://dx.doi.org/10.1103/PhysRevLett.109.206803 Borisevich, A. Y.; Chang, H. J.; Huijben, M.; Oxley, M. P.; Okamoto, S.; Niranjan, M. K.; Burton, J. D.; Tsymbal, E. Y.; Chu, Y. H.; Yu, P.; Ramesh, R.; Kalinin, S. V.; Pennycook, S. J. Suppression of Octahedral Tilts and Associated Changes in Electronic Properties at Epitaxial Oxide Heterostructure Interfaces. Phys Rev Lett 2010, 105, 087204. http://dx.doi.org/10.1103/PhysRevLett.105.087204 Krivanek, O. L.; Chisholm, M. F.; Nicolosi, V.; Pennycook, T. J.; Corbin, G. J.; Dellby, N.; Murfitt, M. F.; Own, C. S.; Szilagyi, Z. S.; Oxley, M. P.; Pantelides, S. T.; Pennycook, S. J. Atom-by-Atom Structural and Chemical Analysis by Annular Dark-Field Electron Microscopy. Nature 2010, 464, 571–574. http://dx.doi.org/10.1038/nature08879

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