个人简介

1999 南京大学学士 2004 南京大学硕士 2009 德国柏林洪堡大学物理系博士 2010 - 2017 澳大利亚莫纳什大学电子显微中心 (MCEM) Tenured Research Fellow 2017 - 至今复旦大学物理系研究员

研究领域

发展基于像差校正的新型透射电子显微学技术(TEM)并应用于凝聚态物理和材料科学研究 实验手段包括原子尺度球差校正STEM和TEM, 双球差校正三维共聚焦电子显微镜(SCEM), 相干电子衍射 (Coherent CBED), 电子全息及Lorentz显微镜, 电子能量损失谱(EELS)和EDX, Phase Imaging, 微分相衬电子显微镜 (DPC), ptychography, 电子束相位及空间调制(Bessel beam, Airy beam等新型电子束)。理论工作集中于研究电子的散射及物理光学过程。

电子显微学(Electron Microscopy)

近期论文

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C. L. Zheng, T. Petersen, H. Kirmse, W. Neumann, M. Morgan, J Etheridge, Axicon lens for electrons using a magnetic vortex: The efficient generation of a Bessel beam, Phys. Rev. Lett. 119 (17), 174801 (2017). (Editors’ suggestion) C.L. Zheng, H. Kirmse, J. Long, D. Laughlin, M. McHenry, W. Neumann, Investigation of (Fe, Co) NbB-Based nanocrystalline soft magnetic alloys by Lorentz microscopy and off-axis electron holography, Microscopy and Microanalysis 21 (02), 498-509 (2015). (Cover image) C.L. Zheng, Y. Zhu, S. Lazar, J. Etheridge, Fast imaging with Inelastically scattered electrons by off-axis chromatic confocal electron microscopy, Phys. Rev. Lett. 112 (16), 166101 (2014). (Editors’ suggestion and featured in Physics Today). C.L. Zheng, J. Wong-Leung, Q. Gao, H.H Tan, C. Jagadish, J. Etheridge, Polarity-driven 3-fold symmetry of GaAs/AlGaAs core multishell nanowires, Nano Lett. 13 (8), 3742-3748 (2013). C.L. Zheng, J. Etheridge, Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction, Ultramicroscopy 125, 49-58 (2013). CL Zheng, K. Scheerschmidt, H. Kirmse, I. H?usler, W. Neumann, Imaging of three-dimensional (Si, Ge) nanostructures by off-axis electron holography, Ultramicroscopy 124, 108-116 (2013).