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个人简介

男,江苏无锡人。教授,博士生导师,中国科学院院士。1956年毕业于复旦大学物理系,1960年复旦大学研究生毕业。历任复旦大学半导体物理教研室副主任,微电子教研室副主任,表面物理研究室副主任、主任,应用表面物理国家重点实验室主任、学术委员会主任,复旦大学学术委员会副主任,复旦大学研究生教育指导委员会主任等职。 在国际学术界曾担任国际纯粹与应用物理联合会(IUPAP)半导体委员会委员(1993-1999年),国际学术刊物顾问编委。国内学术兼职有:曾任中国物理学会理事(1996-1999年),上海市物理学会理事长(1996-2000年),中国物理学会半导体专业委员会副主任,中国科学院超晶格与微结构国家重点实验室、中国科学院表面物理国家重点实验室、中国科学院信息功能材料国家重点实验室、北京正负电子对撞机国家实验室和合肥国家同步辐射实验室的学术委员会委员,<半导体学报>副主编,<物理> <真空科学与技术学报> <发光学报>等刊物编委。 长期从事半导体物理学和表面物理学的教学、科研与学科建设工作。在半导体表面与界面的结构和电子态研究,多孔硅发光特性和机理研究,硅基低维量子体系的材料制备、物理特性和新型器件研究方面,作出了许多创新成果。历年来,在国内外学术刊物上发表论文300余篇,其中在国际SCI刊物上发表的有170余篇。论文被国际刊物他引1200余次。在国际学术会议上作邀请报告21次,曾十余次担任过国际半导体物理会议、国际硅分子束外延会议、国际表面结构会议、国际固体薄膜与表面会议等等国际学术会议的程序委员会、顾问委员会、组组织委员会委员或分组会主席。 曾获国家自然科学二等奖1项,上海市科技进步一等奖2项与三等奖1项,国家教委科技进步二等奖4项与三等奖3项,1996年光华科技基金二等奖,1997年中国物理学会第五届叶企孙物理奖,1998年何梁何利科学技术进步奖。

研究领域

表面物理、半导体物理、半导体表面与界面的结构和电子态研究,硅基低维量子体系和光电子物理等

近期论文

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I. 表面与界面 (1) InP和GaAs表面 The variation of In islands on InP surface mversus ion sputtering angle observed by the electron energy loss spectroscopy. Hou Xiaoyuan, Yu Mingren, and Wang Xun Chinese Phys. Lett. 2, 31 (1985). The elimination of In islands on InP surfaces and its mechanism. Jin Xiaofeng, Yu Mingren, and Wang Xun Chinese Phys. Lett. 2, 345 (1985). A LEED, ELS study of InP(100) surfaces prepared by phosphorus deposition and post annealing. Xiaofeng Jin, Mingren Yu, Furong Zhu, and Xun Wang Semicond. Sci. Technol. 1,293 (1986). An angle resolved photoemission study of InP(111) clean surface. Hou Xiaoyuan, Dong Guosheng, Ding Xunmin, and Wang Xun Chinese Phys. Lett. 3, 545 (1986). Comparative high-resolution electron-energy-loss spectroscopy study of hydrogen adsorption on GaAs and InP(111) and (111) surfaces. Xiaoyuan Hou, Shu Yang, Guoaheng Dong, Xunming Ding, and Xun Wang Phys. Rev. B33, 8015 (1987) Chemical and electronic properties of Ga on InP(100) surface. Xun Wang, Xiaofeng Jin, Mingren Yu, and Furong Zhu Phys. Rev. B36, 7660 (1987). Dangling bond electronic state on InP(111) surface Xiaoyuan Hou, Guosheng Dong, Xunmin Ding, and Xun Wang Surface Sci. 183, 123 (1987). The adsorption of oxygen on alkali metal covered GaAs(111) surfaces. Xunmin Ding, Guosheng Dong, Xiaoyuan Hou, abd Xun Wang Solid State Commun. 61, 39 (1987). A missing row-dimer model of InP(100)(4X2) reconstruction as proposed by LEED, UPS and HREELS studies. Xiaoyuan Hou, Guosheng Dong, Xunmin Ding, and Xun Wang J. Phys. C: Solid State Phys. 20, L121 (1987). Surface reaction of sodium on InP(111) and its role on enhancement of water vapor adsorption. Guosheng Dong, Xunmin Ding, Xiaoyuan Hou, and Xun Wang Surface Sci. 201, 531 (1988). Investigation of atomic and electronic structures of InP polar surfaces. Xun Wang Appl. Surface Sci. 33/34, 88 (1988). A simple method for the evaluation of the surface In atom dimerisation and electronic states of the InP(100) surface. Chunhui Huang, Ling Ye, and Xun Wang Semicond. Sci. Technol. 3, 169 (1988). Application of HREELS to Al/GaAs and Al/GaP interfaces X.M.Ding, G.S.Dong, X.K.Lu, X.Y.Hou, P.Chen, and X.Wang Appl. Surface Sci. 41/42, 123 (1989). Formation of In/GaP(111) interface studied by energy loss spectroscopy, x-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. M.R.Yu, P.Q.Wang, X.F.Jin, and X.Wang J.Vac.Sci.Technol. B4,1014 (1990). Surfac adsorption properties of GaP(111) studied by XPS, UPS and HREELS. H.Y.Xiao, X.K.Lu, G.S.Dong, X.M.Ding, P.Chen, and Xun Wang Physica Scripta, 41, 1037 (1990). Surface properties of Al0.7Ga0.3As(100) studied by XPS and ARUPS G.S.Dong, C.H.Huang, X.K.Lu, P.Chen, and Xun Wang Vacuum, 41, 1058 (1990). (2) Si表面 Thermal desorption study of deuterium on Si(100) surface. Hu Jihuang, Chen Keming, Hu Xingen, Zhuang Chenqun, and Wang Xun Chinese Phys. Lett. 2, 149 (1985). Structural model of Si(100)-c(4X4). Hongchuan Wang, Rongfu Lin, and Xun Wang Phys. Rev. B36, 7712 (1987). High temperature nitridation structures of the Si(111)-(7X7) surface. Hongchuan Wang, Rongfu Lin, and Xun Wang Surface Sci. 188, 199 (1987). STM studies of ultrathin gate oxide films grown on highly B-doped Si(100) substrates Q. Cai, Y. F. Hu, S. T. Hu, and X. Wang J. Vac. Sci. Technol. 18, 2384 (2000). Characterization of silicon nitride thin films on Si and overlayer growth of Si and Ge Xue-sen Wang, Z. Li, L. Wang, Y. Hu, G. Zhai, J. Yang, Y. Wang, K. Fung, J. Tang, Xun Wang, and Nelson Cue Jpn. J. Appl. Phys. I, 40, 4292 (2001) Nitridation of Si(111) X. S. Wang, G. Zhai, J. Yang, L. Wang, Y. Hu, Z. Li, J. C. Tang, X. Wang, K. K. Feng, and N. Cue Surface Sci. 494, 83 (2001) Ge islanding growth on nitridized Si and the effect of Sb surfactant Yanfang Hu, Xue-sen Wang, Nelson Cue and Xun Wang J. Phys: Condens. Matter 14, 8939 (2002) Resonant photoemission from Si(001) Gang Chen, Xunmin Ding, Xun Wang, and Zheshen Li Surf. Sci. 524, 137 (2003) First-principles study of the atomic and electronic structure of Pb on Si(001) Y. Zhu, L. Ye, and X. Wang J. Appl. Phys. 100, 083703 (2006). GaN表面 Molecular-beam-epitaxy growth of GaN on GaAs(100) by using reactive nitrogen source. Z.Q.He, X.M.Ding, X.Y.Hou, and Xun Wang Appl. Phys. Lett. 64, 315 (1994). Nitridation of GaAs surfaces stimulated by nitrogen glow discharge. Q.J.Xu, X.M.Ding, X.Y.Hou, and Xun Wang Appl. Surface Sci. 104/105, 468 (1996). (4) GaAs表面的S钝化 The electronic structure of (NH4)2Sx treated GaAs(100) surface studied by UPS and XPS X.F.Jin, M.Y.Mao, Y.S.Luo, G.S.Dong, P.Chen, and Xun Wang Vacuum, 41, 1061 (1990). Electrochemical sulfur pasivation of GaAs. X.Y.Hou, W.Z.Cai, Z.Q.He, P.H.Hao, Z.S.Li, X.M.Ding, and Xun Wang Appl. Phys. Lett. 60, 2252 (1992). S2Cl2 treatment: a new sulfur passivation method of GaAs surface. Z.S.Li, W.Z.Cai, R.Z.Su, G.S.Dong, D.M.Huang, X.M.Ding, X.Y.Hou, and Xun Wang Appl. Phys. Lett. 64, 3425 (1994). Hot wall epitaxial growth of ZnSe on S-passivated GaAs(100) substrates. W.Z.Cai, Z.S.Li, X.M.Ding, X.Y.Hou, J.Wang, C.S.Zhu, R.Z.Su, and Xun Wang J. Cryst. Growth, 142, 397 (1994). Raman scattering characterization of the crystalline qualities of ZnSe films grown on S-passivated GaAs(100) substrates J.Wang, X.H.Liu, Z.S.Li, R.Z.Su, Z.Ling, W.Z.Cai, X.Y.Hou, and Xun Wang Appl. Phys. Lett. 67, 2043 (1995). A mild electrochemical sulfur passivation method for GaAs(100) surfaces. Z.S.Li, X.Y.Hou, W.Z.Cai, W.Wang, X.M.Ding, and Xun Wang J. Appl. Phys. 78, 2764 (1995). Passivation of GaAs surface by sulfur glow discharge. Xiaoyuan Hou, Xiying Chen, Zheshen Li, Xunming Ding, and Xun Wang Appl. Phys. Lett. 69, 1429 (1996). X-ray photoelectron spectroscopic studies of sulphur-passivated GaAs surfaces. X.Wang, X.Y.Hou, Z.S.Li and X.Y.Chen Surf. Interface Anal. 24, 564 (1996). Passivation of GaAs/AlGaAs heterojunction bipolar transistors by S2Cl2 solution X.A.Cao, X.Y.Hou, X.Y.Chen, Z.S.Li, R.Z.Su, X.M.Ding, X.Wang Appl. Phys. Lett. 70, 747 (1997). . Gallium sulfide thin film grown on GaAs(100) by microwave glow discharge. X.Y.Chen, X.Y.Hou, X.A.Cao, X.M.Ding, and Xun Wang J. Cryst. Growth, 173, 51 (1997) . Synchrotron radiation photoemission study of S-passivated GaAs surfaces X.M.Ding, Z.L.Yuan, H.T.Hu, Z.S.Li, Y.F.Chen, X.Y.Chen, X.A.Cao, X.Y.Hou, Xun Wang, E.D.Lu, S.H.Xu, P.S.Xu, X.Y.Zhang Nuclear Instru. & Methods, B133, 90 (1997). (5) SiC表面 Atomic structural model of (2?3 × 2?3)-R30o reconstruction for 3C -Si(111) crystallized islands on Si(111) by C60 precursor Jian-shu Yang, Xue-sen Wang, G.B.Zhui, Nelson Cue, and Xun Wang Surface Sci. 476, 1 (2001) Self-assembled growth of cubic silicon carbide nano-islands on silicon Jianshu Yang, Xuesen Wang, Guangjie Zhai, Nelson Cue, and Xun Wang J. Cryst. Growth 224, 84 (2001) Atomic and electronic structures of 3C -SiC(111)-(2?3′2?3)–R30° surface reconstruction Xiang-yang Peng, Xun Wang, and Ling Ye Surf. Sci. 501, 125 (2002). Theoretical study of hydrogenated 3C -SiC(001)-(2×1) surface Xiangyang Peng, Ling Ye, and Xun Wang Surf. Sci. 571, 21 (2004) Carbon induced (?3 ′ ?3)R30°reconstruction on Si(111) surface: a theoretical study Xiangyang Peng, Ling Ye, and Xun Wang Surf. Sci. 548, 51 (2004) A new atomic structural model for SiC(0001)(3×3) reconstruction based on the first principles study Yun Li, Ling Ye, and Xun Wang Surf. Sci. 600, 298 (2006). The structure models for the (2?3×2?3)-R30o reconstructions of SiC(111) and 6H-SiC(0001) surfaces Yun Li, Xun Wang, and Ling Ye J. Phys.-Conden. Matt. 18, 6953 (2006). II. 硅锗量子阱和超晶格 Growth and characterization of Si molecular beam epilayer on GaP(111) substrates. Weidong Jiang, Guoliang Zhou, Keming Chen, Chi Sheng, Xiangjiu Zhang, and Xun Wang Appl. Phys. Lett. 51, 1910 (1987). Heteroepitaxial growth of Ge film on Si substrates by molecular beam epitaxy. G.L.Zhou, K.M.Chen, W.D.Jiang, C.Sheng, X.J.Zhang, and Xun Wang Appl. Phys. Lett. 53, 2179 (1988). The interface electronic states and valence band offsets of the Si/GaP heterojunction. Chunhui Huang, Ling Ye, and Xun Wang J. Phys.: Condens. Matt. 1, 907 (1989). RHEED intensity oscillation of MBE grown Si/Ge ultrathin multilayered structures. Xun Wang, K.M.Chen, G.L.Gin, C.Sheng, G.L.Zhou, W.D.Jiang, X.J.Zhang, and M.R.Yu Surface Sci. 228, 334 (1990). Highly flat GexSi1-x/Si heterointerfaces grown by molecular beam epitaxyin two-dimensional growth mode. X.Wei, G.L.Zhou, T.C.Zhou, C.Sheng, M.R.Yu, and Xun Wang Vacuum, 43, 1035 (1992). Suppression of interfacial boron accumulation and defect density in molecular beam epitaxial silicon. D.W.Gong, X.Wei, F.Lu, Q.H.Wang, H.H.Sun, and Xun Wang Solid State Commun. 88, 731 (1993). An investigation on the thermal stability of the GexSi1-x superlattice grown by MBE. G.L.Zhou, X.J.Zhang, C.Sheng, and Xun Wang J. Cryst. Growth, 127, 456 (1993). Interfacial defects in Si1-xGex/Si quantum well detected by deep level transient spectroscopy. Qinhua Wang, Fang Lu, Dawei Gong, Jianbao Wang, Henghui Sun, and Xun Wang Phys. Rev. B50, 18226 (1994). Single-frequency admittance spectroscopy measurement of band offset in a Si/Si1-xGex quantum well. Fang Lu, Jiayu Jiang, Henghui Sun, Dawei Gong, and Xun Wang J. Appl. Phys. 75, 2957 (1994). Effects of rapid thermal annealing on electrical properties of heavily doped silicon molecular beam epitaxial layer with B2O3 doping source. Qiang Xu, Jian Yuan, Jianbao Wang, Daming Huang, Fang Lu, Henghui Sun, Xun Wang, and Rong Liu J. Appl. Phys. 76, 1697 (1994). Interfacial defects related to the substrate treat in the molecular beam epitaxial silicon. Chi Sheng, Dawei Gong, Xing Wei, Fang Lu, Qinhua Wang, Henghui Sun, and Xun Wang Jpn. J. Appl. Phys. 33, 2276 (1994). Rutherford backscattering research on the strained SiGe/Si structure. J.H.Hu, Y.L.Fan, D.W.Gong, X.Wang, and Z.T.Zhou Solid State Commun. 92, 963 (1994). Electroreflectance study of strained layer GexSi1-x/Si multiple quantum wells. Shihong Pan, Shuo Huang, Wei Chen, Cunzhou Zhang, Chi Sheng, and Xun Wang Chin. Phys. Lett. 11, 119 (1994). Si1-xGex/Si single-mode rib waveguides with 0.5dB/cm loss by molecular beam epitaxy. Yong Gao, Enke Liu, Guozheng Li, Xiding Liu, Xiangjiu Zhang, Xuekun Lu, and Xun Wang Chin. Phys. Lett. 11, 734 (1994). Quantum confinement of holes in Si1-xGex/Si quantum wells studied by admittance spectroscopy. F.Lu, J.Y.Jiang, H.H.Sun, D.W.Gong, X.J.Zhang, and Xun Wang Phys. Rev. B51, 4213 (1995). Admittance spectroscopy studies of boron delta-doped Si quantum wells. Jianhong Zhu, Dawei Gong, Bo Zhang, Fang Lu, Chi Sheng, Henghui Sun, and Xun Wang Phys. Rev. B52, 8959 (1995). Photovoltaic investigation of interband transitions in SiGe/Si multiple quantum well J.B.Wang, D.W.Gong, F.LU, H.H.Sun, and Xun Wang Appl. Phys. Lett. 66, 1782 (1995). Si1-xGex/Si asymmetric 2X2 electro-optical switch of total internal reflection type. Yong Gao, Xiding Liu, Guozheng Li, Enke Liu, Xiangjiu Zhang, Xuekun Lu, Jihuang Hu, and Xun Wang Appl. Phys. Lett. 67, 3379 (1995). Detection of defects at homoepitaxial interface by deep-level transient spectroscopy F.Lu, D.W.Gong, H.H.Sun, and Xun Wang J. Appl. Phys. 77, 213 (1995). Effect of rapid thermal annealing on the strain relaxation in heavily boron doped silicon epitaxial layer. J.B.Wang, Q.Xu, J.Yuan, F.Lu, H.H.Sun, and Xun Wang J. Appl. Phys. 77, 2974 (1995). Molecular beam epitaxial growth of Ge on Si(111) substrates covered by a SiO2 mask. Xiangjiu Zhang, Hongqiang Lu, Dawei Gong, Xuekun Lu, Xiangjun Chen, Jihuang Hu, Weining Huang, Yongliang Fan, and Xun Wang J. Cryst. Growth, 150, 964 (1995). Hole confinement in boron delta-doped Si quantum wells studied by admittance spectroscopy. Jianhong Zhu, Dawei Gong, Bo Zhang, Fang Lu, Chi Sheng, Henghui Sun, and Xun Wang J. Cryst. Growth, 157, 378 (1995). SiGe/Si bifurcation optical active switch based on plasma dispersion effect. Y.Gao, G.Z.Li, X.D.Liu, E.K.Liu, X.J.Zhang, X.K.Lu, J.H.Hu, and Xun Wang Electron. Lett. 31, 1740 (1995). Capacitance-voltage chacteristics of a Schottky junction containing SiGe/Si quantum wells. Fang Lu, Dawei Gong, Jianbao Wang, Qinhua Wang, Henghui Sun, and Xun Wang Phys. Rev. B53, 4623 (1996). Interface broadening and Raman scattering in SiGe/Si superlattices. Xiaohan Liu, Daming Huang, Zuimin Jiang, and Xun Wang Phys. Rev. B53, 4699 (1996). Suppression of Si-Ge interfacial vibration mode in Raman spectrum of Si6Ge4 superlattice. Chi Sheng, Tichen Zhou, Qun Cai,Dawei Gongm Mingren Yu, Xiangjiu Zhang, and Xun Wang Phys. Rev. B53, 10771 (1996). Crystalline quality of Si epilayers influenced by Sb doping Xuekun Lu, Zuiming Jiang, Daming Huang, Haijun Zhu, Xiangjiu Zhang, and Xun Wang J. Cryst. Growth,158,169 (1996). Photoluminescence from trapped exitons in Si1-xGex/Si quantum well structures. Xiaohan Liu, Daming Huang, Zuimin Jiang, Xuekun Lu, Xiangjiu Zhang, and Xun Wang J. Phys.: Conden. Mat. 8, 3947 (1996). Observation of boron doping induced surface roughening in silicon molecular beam epitaxy. Xuekun Lu, Zuimin Jiang, Haijun Zhu, Xiangjiu Zhang, and Xun Wang Appl. Phys. Lett. 68, 3278 (1996). Hole confinement in boron delta-doped silicon quantum wells studied by deep level transient spectroscopy. J.H.Zhu, D.W.Gong, B.Zhang, F.Lu, C.Sheng, H.H.Sun and Xun Wang Phys. Rev. B54, 2662 (1996). Photoabsorption and photoresponse behaviors of Si1-xGex/Si quantum wells. Yu Yang, Dawei Gong, Xingliang Huang, Xiaohong Shi, Chi Sheng, and Xun Wang Solid State Commun. 97, 627 (1996). Analysis of capacitance-voltage characteristics of Si1-xGex/Si quantum well structures. J.B.Wang, F.Lu, S.K.Zhang, B.Zhang, D.W.Gong, H.H.Sun, and Xun Wang Phys. Rev. B54, 7979 (1996). Coevaporative Sb doping and crystalline quality in Si molecular beam epitaxy. Xuekun Lu, Zuimin Jiang, Kaifeng Liu, Haijun Zhu, Xiangjiu Zhang, and Xun Wang J. Cryst. Growth, 158, 169 (1996). A deep level transient spectroscopic study of boron-ion-implanted SiGe/Si single quantum wells. Fang Lu, Jianbao Wang, Jiayu Jiang, Dawei Gong, Henghui Sun, and Xun Wang J. Phys. Condens. Matter, 9, 3427 (1997). Extremely narrow Sb Delta-doped epitaxial layer characterixed by X-ray reflectivity Jiang Zuimin, Xiu Lisong, Jiang Xiaoming, Zheng Wenli, Lu Xuekun, Zhu Haijun, Zhang Xiangjiu, Wang Xun Chin. Phys. Lett. 14, 686 (1997). Ge dots with highly uniform size distribution grown on Si substrate by molecular beam epitaxy Xun Wang, Z.M.Jiang, H.J.Zhu, F.Lu, D.M.Huang, X.H.Liu, C.W.Hu, Y.F.Chen, Z.Q.Zhu, and T.Yao Appl. Phys. Lett.71, 3543 (1997). A silicon-based low dimensional quantum structure--self-assembly grown germanium quantum dots. Z.M.Jiang, H.J.Zhu, F.Lu, D.M.Huang, Xun Wang, Y.F.Chen, Z.Q.Zhu, and T.Yao Nonlinear Optics 18, 73 (1997). Surfactant influence on the Ge heteroepilayer on Si(001) studied by x-ray diffraction and atomic force microscopy. Haijun Zhu, Zuimin Jiang, Amei Xu, Chunming Mao, Dongzhi Hu, Xiaohan Liu, Daming Huang, Xiangjiu Zhang, Xun Wang, Jielin Sun, and Minqian Li J. Cryst. Growth, 179,115(1997). Monolithic integration of SiGe/Si modulator and multiple quantum well photodetector for 1.55m m operation Baojun Li, Guozheng Li, Enke Liu, Zuimin Jiang, J.Qin, Xun Wang Appl. Phys. Lett. 73, 3504 (1998). Well depth fluctuation of Si1-x Gex/Si quantum-well structures studied by conductance-voltage technique Sheng-kun Zhang, Zui-min Jiang, Jie Qin, Dong-zhi Hu, Fang Lu, and Xun Wang J. Appl. Phys. 84, 5587 (1998) Effect of layer thickness variation on light scattering by longitudinal accoustic phonons in SiGe/Si superlattices. X.H.Liu, D.M.Huang, X.J.Wang, H.J.Zhu, and Xun Wang Thin Solid Films, 321, 163 (1998) Effect of Sb as surfactant on the diffusion of epilayer Ge atoms into Si subsrtrate. Xu, Z.Jiang, H.Zhu, X.Liu, D.Hu, X.Wang, M.Mao, X.Zhang, J.Hu, D.Huang, and Xun Wang Thin Solid Films, 321, 116 (1998) Self-organized germanium quantum dots grown by molecular beam epitaxy on Si(100). Xun Wang, Z.M.Jiang, H.J.Zhu, F.Lu, J.Qin, D.M.Huang, Y.F.Chen, Z.Q.Zhu, and T.Yao Thin Solid Films, 321, 60 (1998) Near band-edge photoluminescence in strined and relaxed Si1-xGex/Si quantum wells. Y.Yang, S.Jiang, Z.Tian, X.Wu, C.Sheng, and Xun wang Jpn. J. Appl. Phys. 37, 4A , 1884 (1998). Oxygen d-doped Si multi-layer grown by molecular beam epitaxy C.Sheng, F.Lin, D.Gong, J.Wan, Y. Fan, and X.Wang Jpn. J. Appl. Phys. 37, 3B, 1206 (1998). Coulomb charging effect in Ge quantum dots studied by admittance spectroscopy S.K.Zhang, H.J.Zhu, F.Lu, Z.M.Jiang, and Xun Wang Phys. Rev. Lett. 80, 3340 (1998). Strong surface segregation of Sb atoms at low temperatures durning Si molecular beam epitaxy. Z.M.Jiang, C.W.Pei, L.S.Liao, X.F.Zhou, X.J.Zhang, Xun Wang, Q.J.Jia, X.M.Jinag, Z.H.Ma, Terry Smith, I.K.Sou Thin Solid Films, 336, 236 (1998). Strain relaxation by alloying effects in Ge islands grown on Si (001) X. Z. Liao, J. Zou, D. J. H. Cockayne, J. Qin, Z. M. Jiang, X. Wang, and R. Leon Phys. Rev. B 60, 15605 (1999). Conductance-voltage chacteristics of SiGe/Si quantum-well structures. F.Lu, S.K.Zhang, Z.M.Jiang, J.Qin, D.Z.Hu, and X.Wang J. Korean Phys. Soc. 34, S73, (1999). Low-loss 1′2 multimode interference wavelength demultiplexer in silicon-germanium alloy Baojun Li , Guozheng Li , Enke Liu , Zuimin Jiang , Jie Qin , and Xun Wang IEEE Photonics Technol. Lett. 11, 575 (1999) Study of strain in partially relaxed Ge epilayers on Si(100) substrate Z.M.Jiang, C.W.Pei, X.F.Zhou, W.R.Jiang, B.Shi, X.H.Liu, Xun Wang, Q.J.Jia, W.L.Zheng, and X.M.Jiang Appl. Phys. Lett. 75, 370 (1999). 1.55 μm reflection-type optical waveguide switch based on SiGe/Si plasma dispersion effect. Baojun Li, Guozheng Li, Enke Liu, Zuimin Jiang, Chengwen Pei, and Xun Wang Appl. Phys. Lett. 75, 1 (1999) SiGe/Si Mach-Zehnder interferometer modulator based on the plasma dispersion effect Baojun Li , Zuimin Jiang , Xiangjiu Zhang , Xun Wang, Jianjun Wan , Guozheng Li , and Enke Liu Appl. Phys. Lett. 74, 2108 (1999). Integration of Wavelength Signal Divider and Infrared Photodetectors Based on Plasma Dispersion Effect in SiGe/Si Bao-jun Li, Zui-min Jiang, Cheng-wen Pei, Jie Qin, Xun Wang, Guo-zheng Li, Jian-jun Wan, and En-ke Liu Appl. Phys. Lett. 74, 1663 (1999) Thermal stability of Si/Si1-xGex quantum well studied by admittance spectroscopy. Feng Lin, Lian Ke, Chi Sheng, Da-wei Gong, Fang Lu, and Xun Wang J. Appl. Phys. 87, 1947 (2000). Coulomb Charging Effect of Holes in Ge Quantum Dots Studied by Deep Level Transient Spectroscopy. Sheng-kun Zhang, Fang Lu, Zui-min Jiang, and Xun Wang Thin Solid Films, 369, 65 (2000). Boron-mediated growth of Ge quantum dots on Si(100) substrate. Xingfei Zhou, Bin Shi, Zuimin Jiang, Weirong Jiang, Dongzhi Hu, Dawei Gong, Yongliang Fan, Xiangjiu Zhang, Xun Wang, Yuesheng Li Thin Solid Films, 369, 92 (2000). Y-branch 1.3/ 1.55 m wavelength demultiplexer based on the plasma dispersion effect Baojun Li, Jianjun Wan, Guozheng Li, Zuimin Jiang, Enke Liu, Xun Wang Thin Solid Films, 369, 419 (2000). Composition and its impact on shape evolution in Ge(Si)/Si islands X. Z. Liao, J. Zou, D. J. H. Cockayne, J. Qin, Z. M. Jiang, X. Wang, and R. Leon Appl. Phys. Lett. 77, 1304 (2000). Extracting composition and alloying information of coherent Ge(Si)/Si(001) islands from [001] on-zone bright-field diffraction contrast images X. Z. Liao, J. Zou, D. J. H. Cockayne, Z. M. Jiang, and X. Wang Appl. Phys. Lett. 77, 1304 (2000). Optical absorption in SiGe/Si quantum well structures created by subband transitions Y. Yang, X. Mao, H.W. Yang, W. Zhou, Z.L. Zhou, H. L. Liu, and Xun Wang Chin. Phys. Lett. 18, 1655 (2001) Growth of Ge quantum dots on vicinal Si(001) substrate by solid phase epitaxy D. Z. Hu, D. T. Zhao, W. R. Jiang, Z. M. Jiang, Y. L. Fan, and X. Wang J. Cryst. 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