个人简介
学习工作经历
2011年12月至今 复旦大学光科学与工程系 副研究员
2009年 6月 至2011年9月 英国Huddersfield大学精密技术中心 研究学者(Fellow)
2005年 9月 至2009年6月 英国Huddersfield大学精密技术中心 博士
2001年 9月 至2005年7月 中国科学技术大学精密机械与精密仪器系 本科
获奖情况
2023年 第十届全国大学生光电设计竞赛三等奖,东部赛区一等奖,指导教师
2023年 复旦大学睿郡奖教金
2023年 复旦大学第三届教学创新大赛特等奖
2023年 复旦大学信息科学与工程学院院长奖
2022年 复旦大学睿郡奖教金
2022年 日内瓦国际发明展金奖
2021年 10th International Symposium on Precision Mechanical Measurement最佳论文奖
2021年 复旦大学信息科学与工程学院联防联控“优秀团队奖”
2020年 IFOSA国际会议Most Impact Award
2019年 SPIE高级会员
2018年 全国大学生光电设计竞赛三等奖指导教师
2018年 Measurement优秀评审人
2016年 教育部科技进步二等奖,第三完成人
2016年 国家自然科学基金项目结题优秀,在结题会议上受邀做宣讲报告
2015年 复旦大学腾飞书院优秀班导师
2014年 复旦大学腾飞书院优秀班导师
2013年 复旦大学二等奖教金
研究领域
精密光学测量技术 (Precision optical measurement) 包括光学干涉测量技术、数字全息显微术、偏折术等
计算成像 (Computational imaging) 包括超分辨显微技术、压缩感知与去噪、深度学习等
复杂表面评定表征 (Metrology of complex surfaces) 包括自由曲面与结构表面的形貌表征、多尺度分析以及标准化等
近期论文
查看导师新发文章
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W Lang, X Zhang*, Y Chen, T Chen, Z Hu and X Jiang. A general reconstruction framework for deflectometric measurement based on non-uniform B-splines. IEEE Transactions on Instrumentation and Measurement 2023;72: 5015511
Z Hu, X Zhang*, W Lang, Y Chen, T Chen and M Xu. Fast measurement of surface topographies using a phase-measuring deflectometric microscopy. IEEE Photonics Journal 2023;15(2):6800807
J Wang, L Peng, F Zhai, D Tang*, F Gao, X Zhang*, R Chen, L Zhou* and X Jiang. Polarized angle-resolved spectral reflectometry for real-time ultra-thin film. Optics Express 2023;31(4):6552-6565
X Zhang*, H Yuan, R Xiong, J Wang*, X Ma, Z Hu and M Xu. Fast measurement of surface defects on large components with dynamic phase-shifting digital holographic microscopy. Measurement 2023;208:112443
R Xiong, X Zhang*, X Ma, L Li, J Wang* and X Jiang. Full-dimensional surface characterization based on polarized coherent coded aperture correlation holography. IEEE Photonics Journal 2022;14(6):3160407
K Wang,YQ Zhu,QC An, XC Zhang, C Peng, HR Meng and XY Liu. An even sampling photonic-integrated interferometric array for synthetic aperture imaging. Optics Express 2022;30(18):32119-32128
F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Depth multiplexing of orbital angular momentum holography. Optics Express 2022;30(18):31863-31871
R Zhu, X Zhang*, S Li, Y Chen, W Lang, L Ye. Areal measurement of vibration modes of hemispherical shell resonator by deflectometry. Applied Optics 2022;61(16):4919-4926
Z Niu, Z Wu, S Wan, X Zhang*, C Wei*, J Shao. Iterative space-variant sphere-model deflectometry enabling designation-model-free measurement of the freeform surface. Optics Express 2022;30(9):14019-14032
F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Angular multiplexation of partial helical phase modes in orbital angular momentum holography. Optics Express 2022;30(7):11110-11119
T Chen, Y Chen, X Zhang, W Wang*, M Xu. Workpiece positioning and error decoupling in the single-point diamond turning of freeform mirrors based on the monoscopic deflectometry. Precision Engineering 2022;77:16–23
Y Chen, X Zhang*, T Chen, R Zhu, L Ye, W Lang. Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces. Measurement 2022;199:111589
X Zhao, Y Chen, Z Guo, Y Zhou, J GuoZ Liu, X Zhang, L Xiao, Y Fei, X Wu. Tunable optofluidic microbubble lens. Optics Express 2022;30(5):8317-8329
F Wang, X Zhang*, H Yuan, R Xiong and X Jiang. Enhancing the information capacity with modulated orbital angular momentum holography. IEEE Photonics Journal 2022; 14(1):5212905
H Yuan, X Zhang*, F Wang, R Xiong, W Wang, S Li and M Xu. Accurate reconstruction for the measurement of tilt surfaces with digital holography. Optics Communications 2021;496:127135
X Zhang*, Z Niu, J Ye and M Xu. Correction of aberration-induced phase errors in phase measuring deflectometry. Optics Letters 2021; 46(9):2047-2050
Z Niu, X Zhang*, J Ye, L Ye, R Zhu and X Jiang. Adaptive phase correction for phase measuring deflectometry based on light field modulation. IEEE Transactions on Instrumentation and Measurement 2021; 70:7003610
J Ye, Z Niu, X Zhang*, W Wang and M Xu. Simultaneous measurement of double surfaces of transparent lenses with phase measuring deflectometry. Optics and Lasers in Engineering 2021; 137:106356
H Yuan, X Zhang*, F Wang, and M Xu. Resolution enhancement for flexible microscopic imaging based on dictionary learning. Optics Express 2020; 28(23):35047-35060
L Ye, W Wang*, X Zhang, M Xu, J Zhang and L Zheng. Testing of large-aperture aspheric mirrors using a single coated lens. Applied Optics 2020;59(15):4577-4582
J Ye, Z Niu, X Zhang, W Wang* and M Xu. In-situ deflectometic measurement of transparent optics in precision robotic polishing. Precision Engineering 2020;64:63-69
Z Niu, X Zhang*, J Ye, Y Zhu, M Xu and X Jiang. Flexible one-shot geometric calibration for the off-axis deflectometry. Applied Optics 2020;59(13):3819-3824
Y Cheng, X Zhang*, H Yuan, W Wang and M Xu. Precision enhancement of three-dimensional displacement tracing for nano-fabrication based on low coherence interferometry. Optics Express 2019;27(20):28324-28336
X Xu, X Zhang*, Z Niu, W Wang, Y Zhu and M Xu. Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces. Optics Letters 2019; 44(17):4271-4274
Z Niu, X Xu, X Zhang*, W Wang, Y Zhu, J Ye, M Xu and X Jiang. Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry. Optics Express 2019;27(6):8195-8207
X Xu, X Zhang*, Z Niu, W Wang, Y Zhu and M Xu. Self-calibration of in-situ monoscopic deflectometric measurement in precision optical manufacturing. Optics Express 2019; 27(4):7523-7536
S Wan, X Zhang*, W Wang and M Xu. Effect of pad wear on tool influence function in robotic polishing of large optics. The International Journal of Advanced Manufacturing Technology.2019; 102(5-8):2521-2530
S Wan, X Zhang*, H Zhang, M Xu, W Wang and X Jiang. Edge control in precision robotic polishing based on space-variant deconvolution. Precision Engineering 2019;55:110-118
S Wan, X Zhang*, M Xu, W Wang and X Jiang. Region-adaptive path planning for precision optical polishing with industrial robots. Optics Express 2018;26(18):23782-23795
X Zhang, J Wang, X Zhang*, M Xu and X Jiang. Correction of phase-shifting error in wavelength scanning digital holographic microscopy. Measurement Science and Technology 2018;29:055002
S Wan, X Zhang*, M Xu and X Jiang. Modelling and analysis of sub-aperture tool influence functions for polishing complex curved surfaces. Precision Engineering 2018;51:415-425
X Zhang, X Zhang*, M Xu, H Zhang and X Jiang. Accurate reconstruction in digital holography microscopic measurement of micro-structures using anti-aliasing shift invariant contourlet transform. Optical Engineering 2018;57(3):034108
X Zhang, X Zhang*, M Xu, H Zhang and X Jiang. Phase unwrapping in digital holography based on non-subsampled contourlet transform. Optics Communications 2018;407:367-374
学术兼职
SPIE、中国光学学会高级会员,Optica、IEEE会员,上海激光学会青年委员会副主任,中国仪器仪表学会精密机械分会理事,中国图象图形学学会视觉检测专委会委员,国家自然科学基金委员会、英国EPSRC项目评审专家、Surface Topography: Metrology and Properties编委, Sensors客座编委,Advances in Manufacturing青年编委