当前位置: X-MOL首页全球导师 国内导师 › 王源

个人简介

教育背景 2006年,北京大学,微电子学与固体电子学,理学博士 工作经历 2006/2008/2017,北京大学信息科学技术学院讲师/副教授/教授 2019,微电子器件与电路教育部重点实验室主任 2022,北京大学集成电路学院教授

研究领域

集成电路设计与新计算架构

近期论文

查看导师新发文章 (温馨提示:请注意重名现象,建议点开原文通过作者单位确认)

1) Qiao Xin, Song Jiahao, Tang Xiyuan*, Luo Haoyang, Pan Nanbing, Cui Xiaoxin, Wang Runsheng*, Wang Yuan*; A 65nm 73Kb SRAM-Based Computing-In-Memory Macro with Dynamic-Sparsity Controlling; IEEE Transactions on Circuits and Systems II: Brief Paper, June 2022, 69(6): 2977-2981. 2) Shen Zilong, Wang Yize, Li Yunhao, Zhang Xing*, Wang Yuan*; A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation; IEEE Transactions on Circuits and Systems II: Brief Paper, March 2022, 69(3): 1547-1551. 3) Wang Yize, Wang Yuan*; Modeling Study of Power-on and Power-off System-level Electrostatic Discharge Protection; IEEE Transactions on Electromagnetic Compatibility, Aug 2021, 63(4): 979-987. 4) Song Jiahao, Wang Yuan*, Guo Minguang, Ji Xiang, Cheng Kaili, Hu Yixuan, Tang Xiyuan, Wang Runsheng*, Huang Ru; TD-SRAM: Time-Domain based In-Memory Computing Macro for Binary Neural Networks; IEEE Transactions on Circuits and Systems I: Regular Paper, Aug. 2021, 68(8): 3377-3387. 5) Kuang Yisong, Cui Xiaoxin*, Zhong Yi, Liu Kefei, Zou Chenglong, Wang Yuan*, Yu Dunshan, Huang Ru; A 64K-neuron 64M-synapse 2.64pJ/SOP Neuromorphic Chip with All Memory on Chip for Artificial General Intelligence in 65nm CMOS; IEEE Transactions on Circuits and Systems II: Brief Paper, July 2021, 68(7): 2655-2659. 6) Zhang Yawen, Wang Runsheng*, Zhang Xinyue, Wang Yuan*, Huang Ru; Parallel Hybrid Stochastic-Binary-Based Neural Network Accelerators; IEEE Transactions on Circuits and Systems II: Brief Paper, Dec. 2020, 67(12): 3387-3391. 7) Wang Yize, Wang Yuan*; A New Method to Correlate Human Body Model and Transmission Line Pulse Based on RC Thermal Equivalent Model; IEEE Transactions on Electron Devices, Sept. 2020, 67(9): 3775-3780. 8) Lu Guangyi, Wang Yuan*, Wang Yize, Zhang Xing*; Low-leakage ESD Power Clamp Design with Adjustable Triggering Voltage for Nano-scale Applications; IEEE Transactions on Electron Devices, Sept. 2017, 64(9): 3569-3575. 9) Lu Guangyi, Wang Yuan*, Wang Yize, Zhang Xing*; Insights into the Power-off and Power-on Transient Performance of Power-rail ESD Clamp Circuits; IEEE Transactions on Device and Materials Reliability, Sept. 2017, 17(3): 577-584. 10) Lu Guangyi, Wang Yuan*, Zhang Xing; Transient and Static Hybrid-triggered Active Clamp Design for Power-rail ESD Protection; IEEE Transactions on Electron Devices, Dec. 2016, 63(12): 4654-4660.

推荐链接
down
wechat
bug