van Benthem, Klaus - University of California, Davis - Department of Materials Science and Engineering

个人简介

M.Sc. 1998 Westfaelishche Wilhelms Universitaet Muenster Ph.D. 2002 Max-Planck Institute for Metals Research Postdoctoral Research, Oak Ridge National Laboratory R&D Staff Scientist, Oak Ridge National Laboratory

研究领域

Our research interests are in the atomic-resolution investigation of functional nano-materials and their defects. For this purpose we use aberration-corrected electron microscopy techniques to investigate atomic and electronic defect structures for a subsequent correlation with nano-scale and macro-scale physical properties of the materials. In addition to this rather traditional approach to the structure-property relationships, we use and develop in situelectron microscopy techniques to study the evolution of atomic-scale defect structures under applied stress, such as electrical and mechanical fields, (rapidly) varying temperatures, etc. Studying materials under conditions closer to their anticipated working environment allows the detailed systematic investigation of their functionalities. Our overreaching vision is the in operandi observation of functional nano-materials with atomic resolution and precision.

近期论文

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K. van Benthem, G. Tan, L. K. Denoyer, R. H. French, and M. RühleLocal optical properties, electron densities, and London dispersion energies of atomically structured grain boundaries Phys. Rev. Lett. 93 (2004) 227201 K. van Benthem, A.R. Lupini, M. Kim, H.S. Baik, S.J. Doh, J.-H. Lee, M.P. Oxley, S.D. Findlay, L.J. Allen, and S. J. Pennycook Three-Dimensional Imaging of Individual Hafnium Atoms Inside a Semiconductor Device Applied Physics Letters 87 (2005) 034104 S.H Oh, K. van Benthem, S.I. Molina, A.Y. Borisevich, W. Luo, P. Werner, N.D. Zakharov, D. Kumar, S.T. Pantelides, S.J. Pennycook Direct Imaging of Impurity Configurations in Silicon Nanowires Nano Letters 8 (2008) 1016-1019 K. van Benthem, G.S. Painter, F.W. Averill, S.J. Pennycook, P.F. Becher Atomic ordering and imaging of local bonding strengths at crystalline/amorphous interfaces Appl. Phys. Lett. 92 (2008) 163110 K. van Benthem and S.J. Pennycook Imaging and Spectroscopy of Defects in Semiconductors using Aberration-corrected STEM Appl. Phys. A 96 (2009) 161–169