Muller, David A. - Cornell University - Applied and Engineering Physics

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Cornell University Applied and Engineering Physics
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个人简介

David Muller is the Samuel B. Eckert Professor of Engineering in Applied and Engineering Physics at Cornell University, and the co-director of the Kavli Institute at Cornell for Nanoscale Science A major focus of David's research has been developing quantitative electron microscopy methods for measuring and predicting materials properties. His work has demonstrated how electronic-structure changes on the atomic scale can control the macroscopic behavior of systems as diverse as turbine blades, fuel cells or transistors. His current research interests include the physics of renewable energy materials, the atomic-scale control of materials to create electronic phases that cannot exist in the bulk, and developing the hardware and algorithms for "big data" acquisition and processing from high-bandwith pixelated electron microscope detectors. He joined the Applied and Engineering Physics faculty at Cornell University in 2003, is a graduate of the University of Sydney and completed his Ph.D. in physics at Cornell in 1996. David was a member of the technical staff at Bell Laboratories from 1997 to 2003, where he applied his research on imaging single atoms and atomic-scale spectroscopy to determine the physical limits on how small a transistor can be made. For this work, he was named one of the top 100 young innovators in 2003 by Tech Review Magazine, and recipient of the Burton Medal from the Microscopy Society of America in 2006. He is a fellow of the American Physical Society, received the Chau award for Excellence in Teaching in 2006 and the Provost's Award for Distinguished Scholarship in 2010 from Cornell University. He has 5 patents and has published over 250 papers, including more than 20 in Nature or Science. His work has received over 28,000 citations . Recent Honors and Awards: Peter Duncumb Award for outstanding achievement in the field of microanalysis, Microbeam Analysis Society, 2016. Elected Fellow of the Microscopy Society of America (2013) Elected Fellow of the American Physical Society (2011) Provost's Award for Distinguished Scholarship in 2010 from Cornell University Chau Award for Excellence in Teaching (2006) Burton Medal, Microscopy Society of America (2006) Editors Pick for the Top Ten Papers of 2005/2006 in Nature Materials (#2)of 'Top 5 Hot Talks' presented at the MRS 2005 Fall Meeting Best Materials Paper of 2004, Microscopy and Microanalysis, V10 p291 Best Materials Paper of 2003, Microscopy and Microanalysis, V9 p493 TR100 - named one of the top 100 young innovators in 2003 by Tech Review

研究领域

The primary thrust of our research is to explore how electronic and structural changes on small length scales affect the macroscopic properties of materials. In particular: how interfaces affect transport properties (eg. in 5-atom thick gate oxides we have used atomic-scale electron energy loss spectroscopy to place fundamental physical limits on device scaling - Nature paper and viewpoint); the role of electronic structure in controlling the cohesion of interfaces (Phys. Rev. Lett.); and the first detection and real-space characterization of individual dopant atoms and clusters buried inside crystals. In many cases, our tool of choice will be an atomic-resolution electron microscope. We are always looking to develop new methods that advance electron microscopy, including developing new detectors that allow us to explore new physics, and using novel sample holders and microscopes to image vacuum sensitive materials. Areas of interest: Physics of renewable energy including the nanostructure of Fuel Cells, Batteries, and Photocatalysts and their real-time evolution during operation. Structure and properties of two-dimensional materials. Atomic-scale perovskite heterostructures: atom-by-atom design of materials that do not exist in nature, explored for extreme dielectric and nonlinear properties. Physical limits placed by interfacial electronic structure and atomic-scale chemistry on the scaling of integrated circuits. Development of high-resolution, low-dose methods for electron imaging and tomography of beam sensitive nanostructures. Mapping photonic and plasmonic structures with nm-sized relativistic electron beams Development of new electron microscopy methods and instrumentation

近期论文

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Y. Han, K. Nguyen, M. Cao, P. Cueva, S. Xie, M. W. Tate, P. Purohit, S. M. Gruner, J. Park, and D. A. Muller, "Strain Mapping of Two-Dimensional Heterostructures with Subpicometer Precision". Nano Letters (2018). DOI:10.1021/acs.nanolett.8b00952 J. Xiao, H. Zhu, Y. Wang, W. Feng, Y. Hu, A. Dasgupta, Y. Han, Y. Wang, D. A. Muller, L. W. Martin, P. Hu, and X. Zhang, "Intrinsic Two-Dimensional Ferroelectricity with Dipole Locking". Physical Review Letters 120, 227601 (2018). DOI:10.1103/PhysRevLett.120.227601 X.-C. Liu, Y. Yang, J. Wu, M. Liu, S. P. Zhou, B. D. A. Levin, X.-D. Zhou, H. Cong, D. A. Muller, P. M. Ajayan, H. D. Abruña, and F.-S. Ke, "Dynamic Hosts for High-Performance Li–S Batteries Studied by Cryogenic Transmission Electron Microscopy and in Situ X-ray Diffraction". ACS Energy Letters, 1325-1330 (2018). S. Xie, L. Tu*, Y. Han*, L. Huang, K. Kang, K. U. Lao, P. Poddar, D. A. Muller, R. A. DiStasio Jr., J. Park "Coherent Atomically-thin Transition-metal Dichalcogenide Supperlattices with Engineered Strain" Science 395, 1131-1136 (2018) R. Yan, G. Khalsa, S. Vishwanath, Y. Han, J. Wright, S. Katzer, N. Nepal, B. P. Downey, D. A. Muller, H. G. Xing, D. J. Meyer, D. Jena "GaN/NbN Epitaxial Semiconductor/Superconductor Heterostructures" Nature 555, 183-189 (2018) C. Zhang, M. Li, Y. Han, Y. Su, L. Li, D. A. Muller, J. Tersoff, C. Shih, "Strain distributions and their influences on electronic structures of WSe2-MoS2 laterally strained heterojunctions" Nature Nanotechnology 13, 152-158 (2018) E. Padgett, N. Andrejevic, Z. Liu, A. Kongkanand, W. Gu, K. Moriyama, Y. Jiang, S. Kumaraguru, T.E. Moylan, R. Kukreja, D.A. Muller, “Connecting Fuel Cell Catalyst Nanostructure and Accessibility Using Quantitative Cryo-STEM Tomography”, Journal of the Electrochemical Society, doi: 10.1149/2.0541803jes (2018). R. Rizo, R. Arán-Ais, E. Padgett, D. Muller, M.J. Lázaro, J. Solla-Gullon, J.M. Feliu, E. Pastor, H.D. Abruña, "Pt-richcore/Sn-richsubsurface/Ptskin nanocubes as highly active and stable electrocatalysts for the ethanol oxidation reaction", Journal of the American Chemical Society, doi: 10.1021/jacs.8b00588 (2018). Y. Han, M.-Y. Li, G.-S. Jung, M. A. Marsalis, Z. Qin, M.J. Buehler, L.-J. Li, D.A. Muller, "Sub-nanometer channels embedded in two-dimensional materials" Nature Materials 17, 129-133 (2018). M. Z. Miskin, K. J. Dorsey, B. Bircan, Y. Han, D. A. Muller, P. L. McEuen, and I. Cohen, "Graphene-based bimorphs for micron-sized, autonomous origami machines". Proceedings of the National Academy of Sciences 115, 466-470 (2018). DOI:10.1073/pnas.1712889115 B.D.A. Levin, Y. Jiang, E.Padgett, S. Waldon, C. Quammen, C. Harris, U. Ayachit, M. Hanwell, P. Ercius, D.A. Muller, R. Hovden, "Tutorial on the Visualization of Volumetric Data Using tomviz", Microscopy Today, doi: 10.1017/S1551929517001213 (2018) A.M. Pasqualeti, E. Padgett, D.Y. Kuo, D.A. Muller, F.H.B. Lima, J. Suntivich, "Influence of Aliovalent Substitutions on Oxygen Reduction on Tantalum Oxynitrides", Journal of the Electrochemical Society doi: 10.1149/2.1361706jes (2017) V. Beermann, M. Gocyla, S. Kühl, E. Padgett, H. Schmies, M. Goerlin, N. Erini, M. Shviro, M. Heggen, R.E. Dunin-Borkowski, D.A. Muller, P. Strasser, "Tuning the Electrocatalytic Oxygen Reduction Reaction Activity and Stability of Shape-Controlled Pt–Ni Nanoparticles by Thermal Annealing − Elucidating the Surface Atomic Structural and Compositional Changes", Journal of the American Chemical Society, DOI: 10.1021/jacs.7b06846 (2017). Y. Jiang, E. Padgett, R. Hovden, D.A. Muller, "Sampling limits for electron tomography with sparsity-exploiting reconstructions" Ultramicroscopy, https://doi.org/10.1016/j.ultramic.2017.12.010 (2017) E. Padgett, R. Hovden, J.C. DaSilva, B.D.A. Levin, J.L. Grazul, T. Hanrath, D.A. Muller, “A Simple Preparation Method for Full-Range Electron Tomography of Nanoparticles and Fine Powders” Microscopy and Microanalysis, doi:10.1017/S1431927617012764 (2017) W. Jin, S. Vishwanath, J. Liu, L. Kong, R. Lou, Z. Dai, J. T. Sadowski, X. Liu, H. Lien, A. Chaney, Y. Han, M. Cao, J. Ma, T. Qian, J. I. Dadap, S. Wang, M. Dobrowolska, J. Furdyna, D. A. Muller, K. Pohl, H. Ding, H. G. Xing, R. M. Osgood, Phys. Rev. X, 7, 041020 (2017) Y. Ji, B. Calderon, Y. Han, P. Cueva, N. R. Jungwirth, H. A. Alsalman, J. Hwang, G.D. Fuchs, D.A. Muller, M.G. Spencer. ACS Nano 11, 12057-12066 (2017) Y. Tsai, Z. Chu, Y. Han, C.‐P. Chuu, D. Wu, A. Johnson, F. Cheng, M.‐Y. Chou, D. A. Muller, X. Li, K. Lai, C.‐K. Shih, "Tailoring semiconductor lateral multijunctions for giant photoconductivity enhancement" Advanced Materials 29, 1703680 (2017) K. Kang, K.-H. Lee, Y. Han, H. Gao, S. Xie, D. A. Muller, J. Park, "Layer-by-layer assembly of two-dimensional materials into wafer-scale heterostructures" Nature 550, 229-233 (2017) A. Lu, H. Zhu, J. Xiao, C. Chuu, Y. Han, M. Chiu, C. Cheng, C. Yang, K. Wei, Y. Yang, Y. Wang, D. Sokaras, D. Nordlund, P. Yang, D. A. Muller, M. Chou, X. Zhang, L. Li " Janus Monolayers of Transition Metal Dichalcogenides" Nature Nanotechnology 12, 744-749 (2017) J.A. Mundy, J. Schaab, Y. Kumagai, A. Cano, M. Stengel, I.P. Krug, D.M. Gottlob, H. Doğanay, M.E. Holtz, R. Held, Z. Yan, E. Bourret, C.M. Schneider, D.G. Schlom, D.A. Muller, R. Ramesh, N.A. Spaldin, D. Meier "Functional electronic inversion layers at ferroelectric domain walls" Nature Materials, doi:10.1038/nmat4878 (2017). T. Sun, B.D.A. Levin, J. J. L. Guzman, A. Enders, D.A. Muller, L.T. Angenent & J. Lehmann, "Rapid electron transfer by the carbon matrix in natural pyrogenic carbon", Nature Communications, 8, 14873 (2017). B.D.A. Levin, M.J. Zachman, J.G. Werner, R. Sahore, K.X. Nguyen, Y. Han, B. Xie, L. Ma, L.A. Archer, E.P. Giannelis, U. Wiesner, L.F. Kourkoutis & D.A. Muller, "Characterization of Sulfur and Nanostructured Sulfur Battery Cathodes in Electron Microscopy Without Sublimation Artifacts" Microscopy and Microanalysis, 23, 155-162 (2017).

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