Light, Mark E - University of Southampton

个人简介

Mark received a BSc in 1994 from the University of Greenwich (geochemistry) and a PhD in 1997 from Cardiff University (crystallography). In 1998 he moved to Southampton to take up a postdoc position working with the EPSRC National Crystallography Service before being appointed to his current post of X-ray diffraction manager in 2005. He is the author or co-author of over 400 peer reviewed publications and has contributed over 1200 crystal structures to the CCDC, ranking him within the top 100 worldwide. Mark is a member of the Transition Metal Chemistry editorial board and a member of the Royal Society of Chemistry, the Mineralogical Society and the British Crystallographic Association. In addition to running the departmental X-ray diffraction activities Mark is a member of Southampton Chemistry Analytical Solutions providing diffraction services to the commercial sector.

研究领域

As X-ray diffraction manager Mark’s main responsibility is operating a state-of-the-art facility - enabling cutting edge analysis of a broad range of compounds and composite materials. His work encompasses technique development, user training, data analysis, grant writing, instrument maintenance and general facility management. Recent funding from the EPSRC has enabled the acquisition of an extremely comprehensive equipment base augmented by interactions with National Facilities including the neutron source at ISIS and the synchrotron source at Diamond. The X-ray diffraction facilities currently include the following equipment: Rigaku FR-E+ Ultra High Flux (Mo), Rigaku FR-E+ Very High Flux (Mo), Rigaku R-AXIS Spider (Cu), Rigaku 007- High Flux (Cu), Bruker D2-Phaser bench-top (Cu), Rigaku SmartLab: thin film and micro diffraction (Cu). These provide the following capabilities: full structural characterisation of single crystal structures including absolute structure determination of light atom molecules, qualitative and quantitative powder diffraction of single and multi-phase samples, micro-diffraction and mapping, crystallite size determination, residual stress analysis, thin film characterisation, parameterisation of multi-layer systems using X-ray reflectivity, in-plane structure analysis, texture determination via pole figure measurements, high resolution measurements of epitaxial systems (providing lattice mismatch, crystal quality and composition information) and nano-materials characterisation (size, shape & distribution).

近期论文

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On the plausibility of pseudosugar formation in cometary ices and oxygen-rich tholins - Lavado, Nieves, Ávalos, Martín, Babiano, Reyes, Cintas, Pedro, Light, Mark E., Jiménez, José Luis and Palacios, Juan C. Published:2015Publication:Origins of Life and Evolution of BiospheresVolume:46, (1)Page Range:31-49doi:10.1007/s11084-015-9456-z Role and optimization of the active oxide layer in TiO2-based RRAM - Regoutz, A., Gupta, I., Serb, A., Khiat, A., Borgatti, F, Lee, T.L., Schlueter, C., Torelli, P., Gobaut, B., Light, M., Carta, D., Pearce, S., Panaccione, G. and Prodromakis, T. Published:2015Publication:Advanced Functional MaterialsVolume:26, (4)Page Range:507-513doi:10.1002/adfm.201503522 An amorphous titanium dioxide metal insulator metal selector for resistive random access memory crossbar arrays with tunable voltage margin - Cortese, Simone, Khiat, Ali, Carta, Daniela, Light, Mark and Prodromakis, Themis Published:2016Publication:Applied Physics LettersVolume:108, (033505)Page Range:1-4doi:10.1063/1.4940361