个人简介

Employment HistoryResearch Fellow, University of Birmingham.Lecturer and Senior Lecturer, Department of Metallurgy & Materials Technology, University of Surrey.Reader in Microstructural Science, University of Surrey.Professor in Microstructural Science, University of Surrey until 31/12/89.Henry Bell Wortley Professor of Materials Engineering, University of Liverpool 1990-2010Some Past PostsHead of the Department of Engineering, 2002-2004.Pro-Vice Chancellor of the University of Liverpool with responsibility for Information Services, 1998-2001.Dean of the Faculty of Engineering, 1995-1998.Head of the Department of Materials Science & Engineering, 1990-1994.Director of the MATTER educational software project. 1990-2010 President of the Sterling Group of Universities.until 2008 Director of the UK Centre for Materials Education 2000-2010 (part of the Higher Education Academy).Council and Board member of the Higher Education Academy 2004 - 2009 .UFC/HEFCE Research Assessment Panel for Metallurgy and Materials 1992, 1996, 2008. Director of the SuperSTEM project at Daresbury laboratory. 2000-2009 Current Posts Council member of the Royal Academy of Engineering 2011-2013 Médaille Bastien-Guillet (Société Française de Métallurgie et de Matériaux 2003) Platinum Medal (Institute of Materials 2000) Sidney Gilchrist Thomas Medal and Prize (Institute of Materials 1991)

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The Scholarship of Teaching and Learning as collaborative working: a case study in shared practice and collective purpose Introduction to Transmission Electron Microscopy Teaching Engineering 'Active Learning of Materials Science' Active Learning in Materials Science and Engineering An approach to the systematic distortion correction in aberration-corrected HAADF images Asking culturally neutral questions in engineering Direct measurement of composition of buried quantum dots using aberration-corrected STEM Geometric aspects of lattice contrast visibility in nanocrystalline materials using HAADF STEM Nanometer-scale strain measurements in semiconductors: An innovative approach using the plasmon peak in electron energy loss spectra Quantitative Strain Mapping Applied to Aberration-Corrected HAADF Images Threshold concepts in engineering education-exploring potential blocks in student understanding Change sin plasmon peak position in a GaAs/In0.2Ga0.8As structure Growth and overgrowth of Ge/Si quantum dots: An observation by atomic resolution HAADF-STEM imaging Mapping quantum dot-in-well structures on the nanoscale using the plasmon peak in electron energy loss spectra. Nanoanalysis of InAs/GaAs quantum dots using low-loss EELS spectra V-defects and dislocations in InGaN/GaN heterostructures Defect analysis in InGaN/GaN heterostructures by combined EDX and CTEM Determination of size and composition of buried InAs/GaAs quantum dots: STEM vs in-plane X-ray scattering EELS analysis of InGaN/GaN heterostructures using the Ga 3d transitions in epsilon 2 Indium fluctuations inside InGaN quantum wells by scanning transmission electron microscopy Nanoscale EELS analysis of heterostructures Problems associated with high spatial resolution X-ray mapping of multi-layer coatings on float glass STEM-TEM analysis of nitrogen ion implanted 302 stainless steel The effect of encapsulation on the morphology and chemical composition of InAs/GaAs quantum dots grown by molecular beam epitaxy