Rutten, Frank - Keele University

个人简介

I was appointed as lecturer in Physical Chemistry in the School of Pharmacy in September 2006. Prior to that I was the Senior Research Fellow responsible for the ToF-SIMS instrumentation at the University of Nottingham and worked as Postdoctoral Research Associate in the groups of Prof. Mike Chesters at the University of Nottingham and Prof. Richard Lambert at the University of Cambridge. I gained my Masters degree in 1991 from Leiden University, The Netherlands, where I also obtained a PhD in surface chemistry in 1999 with Profs. Vladimir Ponec and Ben Nieuwenhuys (Leiden University) and Mike Chesters (University of Nottingham).

近期论文

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Rutten FJM, Briggs D, Henderson J, Roe MJ. 2009. THE APPLICATION OF TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF-SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES*. ARCHAEOMETRY, vol. 51, 966-986. link> doi> Gadegaard N, Chen X, Rutten FJM, Alexander MR. 2008. High-energy electron beam lithography of octadecylphosphonic acid monolayers on aluminum. LANGMUIR, vol. 24(5), 2057-2063. link> doi> Ratcliffe LV, Rutten FJM, Barrett DA, Whitmore T, Seymour D, Greenwood C, Aranda-Gonzalvo Y, Robinson S, McCoustra M. 2007. Surface analysis under ambient conditions using plasma-assisted desorption/ionization mass spectrometry. Anal Chem, vol. 79(16), 6094-6101. link> doi> Rutten FJM, Tadesse H, Licence P. 2007. Rewritable imaging on the surface of frozen ionic liquids. Angew Chem Int Ed Engl, vol. 46(22), 4163-4165. link> doi> RUTTEN FJM, Chalmers JM, Chesters MA, Tobin MJ. 2004. Infrared microscopy of epithelial cancer cells in whole tissues and in tissue culture, using synchrotron radiation. Faraday Discussions, vol. 126, 27-39. doi>