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Shujiao Ye, Zheng Wang, Pengbo Xiong, Xinhao Xu, Lintong Du，Jiubin Tan, Weibo Wang*. Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network. Journal of Intelligent Manufacturing. 2023. (SCI, IF= 8.3, JCR Q1, 中科院1区)
Xuefeng Sun, Baoyuan Zhang, Yushan Wang, Jialuo Mai, Jiubin Tan and Weibo Wang*. A multiscale attention mechanism super-resolution confocal microscopy for wafer defect detection. IEEE Transactions on Automation Science and Engineering. 2023(SCI, IF= 5.6,中科院1区)
Zhao Zhang, Weibo Wang*, Xiaoyan Tian. Semantic Segmentation of Metal Surface Defects and Corresponding Strategies. IEEE Transactions on Instrumentation and Measurement. 2023.(SCI, IF= 5.6, JCR Q1, 中科院2区)
Pengbo Xiong, Weibo Wang*, Shujiao Ye, Xuyang Zhou, Yubo Fang and Xinhao Xu. Depth-of-Field Expansion Method Based on Multidimensional Structure and Edge-Guided Correction. Optics Letters. 2023, 48, 14: 3757-3760.(SCI, IF=3.6, JCR Q2, 中科院2区)
Feng He, Jiubin Tan, Weibo Wang*, Shutian Liu, Yuemin Zhu？, Zhengjun Liu？. EFFNet: Element-wise feature fusion network for defect detection of display panels. Signal Processing: Image Communication. 2023, 119, 117043. (SCI, IF=3.5, JCR Q2, 中科院2区)
Baoyuan Zhang, Xuefeng Sun, Jialuo Mai, and Weibo Wang*. Deep learning-enhanced fluorescence microscopy via confocal physical imaging model. Optics Express, 2023, 31(12): 19048-19064 (SCI, IF=3.8, JCR Q2, 中科院2区)
Pengfei Liu, YuhanGuo, JiubinTan, WeiboWang*. Loss reweight in scale dimension: A simple while effective feature selection strategy for anchor-free detectors. Image and Vision Computing. 2022, 104593(SCI, IF= 4.7, JCR Q1, 中科院2区)
Cheng Guo, Xianming Liu, Feilong Zhang, Yongbin Du, Shenghao Zheng, Zehua Wang, Xiaoqing Zhang, Xinchi Kan, Zhengjun Liu, Weibo Wang*. Lensfree on-chip microscopy based on single-plane phase retrieval. Optics Express, 2022, 30(11), 19855-19870(SCI, IF=3.8, JCR Q2, 中科院2区)
Cheng Guo, Feilong Zhang, Xianming Liu, Qiang Li, Shenghao Zheng, Jiubin Tan, Zhengjun Liu, Weibo Wang*. Lensfree auto-focusing imaging using nuclear norm of gradient. Optics and Lasers in Engineering, 2022, 156, 107076: 1-12 (SCI, IF=4.6, JCR Q1, 中科院2区)
Baoyuan Zhang, Xuefeng Sun, Hongxia Yang, Cheng Guo, Biwei Wu, Jiubin Tan, and Weibo Wang*. Simulation-driven learning: a deep learning approach for image scanning microscopy via physical imaging models. Optics Express, 2022, 30(7): 11848-11860(SCI, IF=3.8, JCR Q2, 中科院2区)
Biwei Wu, Keyi Wu, Xuefeng Sun, Weibo Wang*, Jiubin Tan. Circular dichroism second-harmonic generation imaging of KTiOPO4 nanocrystal through stratified media. Frontiers in Chemistry, 2022, 10, 845311: 1-8 (SCI, IF=5.5, JCR Q2, 中科院3区)
Weibo Wang*, Biwei Wu, Baoyuan Zhang, Jie Ma, Jiubin Tan. Deep learning enables confocal laser-scanning microscopy with enhanced resolution. Optics Letters, 2021, 46(19): 4932-4935(SCI, IF=3.6, JCR Q2, 中科院2区)
Weibo Wang*, Baoyuan Zhang, Biwei Wu, Xiaojun Li, Jie Ma, Pengyu Sun, Shenghao Zheng, and Jiubin Tan. Image scanning microscopy with a long depth of focus generated by an annular radially polarized beam. Optics Express, 2020, 28(26): 39288-39298 (SCI, IF=3.8, JCR Q2, 中科院2区)
Weibo Wang*, Biwei Wu, Baoyuan Zhang, Xiaojun Li, Jiubin Tan. Correction of refractive index mismatch-induced aberrations under radially polarized illumination by deep learning. Optics Express, 2020, 28 (18): 26028-26040 (SCI, IF=3.8, JCR Q2, 中科院2区)
Weibo Wang, Biwei Wu, Shiyi Lin, Xiaojun Li, Jian Liu, Jiubin Tan*. Rigorous modelling of second harmonic generation imaging through stratified media focused by radially polarized beams. Optics Express, 2019, 27 (14): 19737-19747(SCI, IF=3.8, JCR Q2, 中科院2区)
学术兼职
学术组织兼职：
中国光学学会，理事
中国仪器仪表学会，理事
全国微机电技术标准化技术委员会TC336，委员
全国光电测量标准化技术委员会 TC487，委员
全国纳米技术标准化技术委员会 TC279/SC2，委员
中国仪器仪表学会显微仪器分会，秘书长/常务委员
中国工程院“显微仪器技术国际高层论坛”，秘书长
英国牛津大学访问学者，合作教授：Tony Wilson院士、Martin Booth教授
学术期刊兼职：
Topic Editor，Frontiers in Physics(IF=3.560), Frontiers in Remote Sensing, Frontiers in Bioinformatics
中国激光杂志社，青年编委
《光学学报》，青年编委
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