个人简介
教育背景
2019 Ph.D., Materials Science and Engineering The Pennsylvania State University,
University Park, PA, USA
2014 B.S., Materials Science and Engineering The Pennsylvania State University,
University Park, PA, USA
工作经历
Postdoctoral Fellow, Materials Sciences Division, Lawrence Berkeley National Laboratory
Supervisor: Zakaria Al. Balushi Jan 2021 – Jun 2021
Postdoctoral Fellow, Advanced Light Source, Lawrence Berkeley National Laboratory
Supervisor: Eli Rotenberg July 2019 – Jan 2021
Ph.D. Candidate, Materials Science and Engineering, The Pennsylvania State University
Supervisor: Joan M. Redwing August 2014 – May 2019
荣誉奖励
IUCr Young Scientist Award, 19th International Conference on Crystal Growth and Epitaxy (ICCGE-19), 2019
Young Scientist Award, 46th Conference on the Physics & Chemistry of Surface & Interfaces (PCSI-46), 2019
Robert E. Newnham award for research excellence, The Pennsylvania State University, 2018
Shively-Weyl Graduate Travel Awards, 2018
Best Poster Nominee, 2018 MRS Fall Meeting & 2017 MRS Spring Meeting
Jean Shollenberger Beaver Graduate Travel Awards, 2016
William and Estelle Turney Scholarship, 2013
State of the art, Inc. Annual scholarship, 2013
Matthew J. Wilson Honors Scholarship, 2012 – 2013
Donald W. Hamer Scholarship, 2012
George H. and Madeleine Hager Todd Scholarship, 2012
John and Elizabeth Holmes Scholarship, 2011
研究领域
查看导师新发文章
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1.先进制造工艺与装备
2.化学气相沉积(CVD)
3.二维薄膜材料(2D materials)
学术兼职
“Epitaxial Growth of 2D Layered Transition Metal Dichalcogenides” Annu. Rev. Mater. Res 2020 50,155-177
“Epitaxial growth of few-layer β-In2Se3 thin films via metalorganic chemical vapor deposition” Journal of Crystal Growth 2020 533, 125471
“Defect-Controlled Nucleation and Orientation of WSe2 on hBN – A Route to Single Crystal Epitaxial Monolayers” ACS Nano 2019 13 (3), 3341-3352
“Diffusion-Controlled Epitaxy of Large Area Coalesced WSe2 Monolayers on Sapphire” Nano letters 2018 18 (2), 1049-1056
“Influence of Carbon in Metalorganic Chemical Vapor Deposition of Few-Layer WSe2 Thin Films” Journal of Electronic Materials 2016 45 (12), 6273-6279
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