个人简介
教育经历
2014.09--2019.12 哈尔滨工业大学电气工程专业 工学博士
2017.09--2018.10 美国马里兰大学CALCE中心 CSC联培博士生
2012.01--2012.06 新加坡国立大学 全奖交换生
2010.09--2014.07 哈尔滨工业大学英才学院 工学学士
工作经历
2022.12--至今 哈尔滨工业大学电气工程及自动化学院 副教授
2020.04--2022.12 哈尔滨工业大学电气工程及自动化学院 讲师
2020.01--至今 哈尔滨工业大学材料科学与工程博士后流动站 博士后
主要任职
国家部委预研专项项目管理办公室常务副主任
中国系统工程学会系统可靠性分委会委员
电工产品可靠性与电接触国际会议国际委员会副主席
系统可靠性与安全工程国际会议出版副主席、分会场主席
IEEE Transactions on Industrial Electronics、Reliability Engineering & System Safety、Journal of Power Electronics等SCI期刊审稿人
近期论文
查看导师新发文章
（温馨提示：请注意重名现象，建议点开原文通过作者单位确认）
Model-Based Quality Consistency Analysis of Permanent Magnet Synchronous Motor Cogging Torque in Wide Temperature Range C Chen*, C Sun, L Wu, X Ye, G Zhai 2022 Quality and Reliability Engineering International
Reliability Estimation of Complex Systems based on a Wiener Process with Random Effects and D-vine Copulas B Zheng, C Chen*, W. Zhang, R Fu, Y Hu, Y Lin, C Wang, G Zhai 2022 Microelectronics Reliability
A New Class of Multi-stress Acceleration Models with Interaction Effects and Its Extension to Accelerated Degradation Modelling X Ye, Y Hu, B Zheng, C Chen, G Zhai 2022 Reliability Engineering & System Safety 108815
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate B Zheng, C Chen*, Y Lin, X Ye, G Zhai 2022 IEEE Transactions on Reliability
Optimal Design of Step-stress Accelerated Degradation Test Oriented by Nonlinear and Distributed Degradation Process B Zheng, C Chen*, Y Lin, Y Hu, X Ye, G Zhai, E Zio 2022 Reliability Engineering & System Safety
Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary C Chen, Y Yang, X Ye, G Zhai 2021 IEEE Access
Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator X Ye, H Chen, C Chen*, G Zhai 2021 IEEE Transactions on Industrial Electronics
Reliability Assessment of Film Capacitors Oriented by Dependent and Nonlinear Degradation Considering Three-source Uncertainties X Ye, Y Hu, B Zheng, C Chen*, R, S Liu, G Zhai 2021 Microelectronics Reliability
Life-cycle Reliability Design Optimization of High-power DC Electromagnetic Devices based on Time-dependent Non-probabilistic Convex Model Process X Ye, H Chen, Q Sun, C Chen*, H Niu, G Zhai, W Li, R Yuan 2020 Microelectronics Reliability
The Threshold Voltage Degradation Model of N Channel VDMOSFETs under PBT Stress X Ye, K Zhang, C Chen, Z Li, Y Wang, G Zhai 2018 Microelectronics Reliability
A Joint Distribution-based Testability Metric Estimation Model for Unreliable Tests X Ye, C Chen*, M Kang, G Zhai, M Pecht 2018 IEEE Access
Fault Localization of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method X Ye, C Chen*, G Zhai 2018 Microelectronics Reliability
VDMOSFET HEF Degradation Modelling considering Turn-around Phenomenon X Ye, C Chen*, Y Wang, L Wang, G Zhai 2018 Microelectronics Reliability
Online Condition Monitoring of Power MOSFET Gate Oxide Degradation based on Miller Platform Voltage X Ye, C Chen*, Y Wang, G Zhai, GJ Vachtsevanos 2016 IEEE Transactions on Power Electronics
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