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Shang-Dong Yang, Liao Yang, Yu-Xiang Zheng,* Wen-Jie Zhou, Meng-Yu Gao, Song-You Wang,Rong-Jun Zhang, and Liang-Yao Chen，Structure-Dependent Optical Properties of Self-Organized Bi2Se3 Nanostructures: From Nanocrystals to Nanoflakes，ACS Appl. Mater. Interfaces 2017, 9, 29295?29301。
Liao Yang, Yu-Xiang Zheng*, Shang-Dong Yang, Zhun-Hua Liu, Jin-Bo Zhang,Rong-Jun Zhang, Song-You Wang, Dong-Xu Zhang, Liang-Yao Chen，Ellipsometric study on temperature dependent optical properties of topological bismuth film，Applied Surface Science 421 (2017) 899–904。
Shang-Dong Yang, Yu-Xiang Zheng*, Liao Yang, Zhun-Hua Liu, Wen-Jie Zhou,Song-You Wang, Rong-Jun Zhang, Liang-Yao Chen,Structural and optical properties of highly (110)-oriented non-polar ZnO evaporated films on Si substrates, Applied Surface Science 421 (2017) 891–898。
Zhun-Hua Liu, Yu-Xiang Zheng*, Liao Yang, Shang-Dong Yang, Kai-Yan Zang,Hai-Bin Zhao, Rong-Jun Zhang, Song-You Wang, Liang-Yao Chen,**, Young-Pak Lee,David W. Lynch，Continuous sign change crossing zero of the light refraction observed at the Au/air interface，Optical Materials 73 (2017) 247-251。
Jinbo Zhang, Yuxiang Zheng *，Zhanyu W ang, Songyou Wang，Rongjun Zhang，Shangdong Yang，Dongdong Zhao，Liao Yang，Dongxu Zhang，Liangyao Chen， Structural Characterization, Optical Properties, and Phase Transitions of In1-xSnx Alloy Thin Films，Journal of Physical Chemistry C 120 (2016) 7822~7828。
Jinbo Zhang, Yuxiang Zheng *，Dongdong Zhao，Shangdong Yang，Liao Yang， Zhun-Hua Liu, Rongjun Zhang， Songyou Wang， Dongxu Zhang，Liangyao Chen， Ellipsometric Study on Size-Dependent Melting Point of Nanometer-Sized Indium Particles，Journal of Physical Chemistry C 120 (2016) 10686~10690。
Zhao, Dong-Dong; Cai, Qing-Yuan; Zheng, Yu-Xiang; Zhang, Jin-Bo; Yang, Shang-Dong; Yang, Liao; Liu, Zhun-Hua; Zhang, Rong-Jun; Wang, Song-You; Chen, Liang-Yao,Optical constants of e-beam evaporated and annealed Nb2O5 thin films with varying thickness, J. Phys. D. :Appl. Phys. 49, 265304(2016)。
Ullah, Ramzan，Zheng, Yuxiang (*)，Raman spectroscopy of 'Bisphenol A'，Journal of Molecular Structure 1108 (2016) 649~653。
Qing-Yuan Cai, Yu-Xiang Zheng, Hai-Han Luo, Dong-Dong Zhao, Xiao-Feng Ma, Ding-Quan Liu, An optical monitoring method for depositing dielectric layers of arbitrary thickness using reciprocal of transmittance，Optics Express 23 (2015) 4703~4714。
D. X. Zhang,Y. X. Zheng*,S. Y. Wang*,J. B. Zhang,S. D. Yang,R. J. Zhang,L. Y. Chen,C. Z. Wang,and K. M. HoEvolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation. Applied Physics Letters 104, 121907 (2014).http://dx.doi.org/10.1063/1.4869722。
Wei Lin, Yu-Xiang Zheng*, Rong-Jun Zhang, Qing-Yuan Cai, Dong-Xu Zhang, Xiang Yu, Kang-Ning Wu, Liang-Yao Chen, Temperature dependent optical properties of Si nanocrystals embedded in SiO2 matrix, Applied Physics A-Materials Science & Processing 114 (2014) 423~427。
Fan Zhang, Rong-Jun Zhang*, Yu-Xiang Zheng*, Zi-Jie Xu, Dong-Xu Zhang, Zi-Yi Wang, Ji-Ping Xu, Song-You Wang, Liang-Yao Chen, Study of the crystal structure, band gap and dispersion evolution in titanium oxide thin films, Physica Status Solidi A-Applications and Materials Science 210 (2013)2374~2378。
Fan Zhang, Rong-Jun Zhang*, Dong-Xu Zhang, Zi-Yi Wang, Ji-Ping Xu, Yu-Xiang Zheng*, Liang-Yao Chen, Ren-Zhong Huang, Yan Sun, Xin Chen, Xiang-Jian Meng, Ning Dai, Temperature-Dependent Optical Properties of Titanium Oxide Thin Films Studied by Spectroscopic Ellipsometry Applied Physics Express 6 (2013) 121101。
Qing-Yuan Cai, Hai-Han Luo, Yu-Xiang Zheng *, Ding-Quan Liu, Design of non-polarizing cut-off filters based on dielectric-metal-dielectric stacks，Optics Express 21 (2013) 19163~19172。
Zi-Jie Xu, Fan Zhang, Rong-Jun Zhang*, Xiang Yu, Dong-Xu Zhang, Zi-Yi Wang, Yu-Xiang Zheng*, Song-You Wang, Hai-Bin Zhao, Liang-Yao Chen, Thickness dependent optical properties of titanium oxide thin films, Applied Physics A-Materials Science & Processing 113 (2013) 557~562。
Fan Zhang, Rong-Jun Zhang*, Yu-Xiang Zheng * , Zi-Jie Xu, Dong-Xu Zhang, Zi-Yi Wang, Xiang Yu, Liang-Yao Chen, Contribution of thickness dependent void fraction and TiSixOy interlayer to the optical properties of amorphous TiO2 thin films, Thin Solid Films 548 (2013) 275~279。
Peng-Hui Mao, Yu-Xiang Zheng *, Qing-Yuan Cai, Dong-Xu Zhang, Rong-Jun Zhang, Hai-Bin Zhao, Liang-Yao Chen, Approach to Error Analysis and Reduction for Rotating-Polarizer-Analyzer Ellipsometer，Journal of the Physical Society of Japan 81(2012) 124003。
Dong-Xu Zhang, Yu-Xiang Zheng *, Qing-Yuan Cai, Wei Lin, Kang-Ning Wu, Peng-Hui Mao, Rong-Jun Zhang, Hai-bin Zhao, Liang-Yao Chen, Thickness-dependence of optical constants for Ta2O5 ultrathin films, Applied Physics A-Materials Science & Processing 108 (2012) 975~979。
Qing-Yuan Cai, Yu-Xiang Zheng *,Dong-Xu Zhang, Wei-Jie Lu, Rong-Jun Zhang, Wei Lin, Hai-Bin Zhao, Liang-Yao Chen, Application of image spectrometer to in situ infrared broadband optical monitoring for thin film deposition, Optics Express 19（2011）12969~12977。
Qing-Yuan Cai, Yu-Xiang Zheng *, Peng-Hui Mao, Rong-Jun Zhang, Dong-Xu Zhang, Ming-Hui Liu, Liang-Yao Chen, Evolution of optical constants of silicon dioxide on silicon from ultrathin films to thick films, Journal of Physics D: Applied Physics 43（2010）445302-1~445302-6。
Peng-Hui Mao, Yu-Xiang Zheng *, Yue-Rui Chen, Qing-Yuan Cai, Rong-Jun Zhang, Liang-Yao Chen, Study of the new ellipsometric measurement method using integrated analyzer in parallel mode, Optics Express 17 (2009) 8641~8650。
编著
郑玉祥，陈良尧编著，《近代光学》。北京：电子工业出版社，2011年。
Yu-Xiang Zheng, Rong-Jun Zhang and Liang-Yao Chen, “Ellipsometry and Its Applications in Stoichiometry”, Chapter 3 in: Stoichiometry and Materials Science - When Numbers Matter, Edited by Alessio Innocenti and Norlida Kamarulzaman, ISBN 978-953-51-0512-1, InTech — Open Access Company, April 11, 2012.
陈良尧，郑玉祥，王松有，《凝聚态光学研究前沿》（陈良尧等编著）第三章“光在金属基界面的传播特性研究”，上海交通大学出版社，2014。
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