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•S.W.Luh, M.-T.Tang and S.L.Chang, (1987),”Derivation of the Non-Negative Karle-Hauptman Determinat from the Dynamical Theory of X-ray Diffraction.”, Chinese J. Physics, 25, 251-259.
•S.L.Chang, H.H.Horng, S.W.Luh, M.-T.Tang, (1987), “Phase Determination of Structure-Factor Triplets and Quartets Using High-Order Multiple Diffraction of X-rays.”, Acta Cryst., A43, C283.
•S.L.Chang, H.H.Hung, S.W.Luh, H.H.Pan, M.-T.Tang and M.Sasaki, (1987), “Phase Determination Using High-Order Multiple Diffraction of X-rays.”, Acta Cryst., A44, 63-70.
•S.L.Chang and M.-T.Tang, (1988), “Quantitative Determination of Phases of X-ray Reflection from Three-Beam Diffraction. I. Theoretical Considerations.”, Acta Cryst., A44, 1065-1072.
•M.-T.Tang and S.L.Chang, (1988), “Quantitative Determination of Phases of X-ray Reflection from Three-Beam Diffraction. II. Experiments for Perfect Crystals.”, Acta Cryst., A44, 1073-1078.
•S.L.Chang, M.T.Huang, M.-T.Tang and C.H.Lee, (1989), “Quantitative Determination of Phases of X-ray Reflection from Three-Beam Diffraction. III. Experiments on Mosaic Crystals.”, Acta Cryst., A45, 870-878.
•S.S.Chien, M.T.Tang and S.L.Chang, (1989), “Determination of the Enantiomorph from Intensity Measurements of Three-Beam Bragg-Surface Difraction of X-rays.”, Acta Cryst., A45, 703-708.
•M.-T.Tang and S.L.Chang, (1990), “Kramers-Kronig Relations in Three-Beam X-ray Diffraction: Application to Phase Determination.”, Physics Letters, A143, 405-408.
•S.L.Chang, M.T.Huang and M.-T.Tang, (1990), “Quantitative Phase Determination and Kramers-Kronig Relations in Three-Beam X-ray Diffraction.”, Acta Cryst., A46, C416.
•F.J.Lamelas, M.-T.Tang and K.W.Evans-Lutterodt, (1992), “Epitaxial Orientation of Aluminum on Silicon(001).”, Phys. Rev., B46, 15570-15573.
•M.-T.Tang and K.W.Evans-Lutterodt, G.S.Higashi and T.Boone, (1993), “Roughness of the Silicon(001)/SiO2 Interface.”, Appl. Phys. Lett., 62, 3144-3146.
•M.-T.Tang, K.W.Evans-Lutterodt, M.L.Green, D.Brasen, K.Krisch, L.Manchanda, G.S.Higashi and T.Boone, (1994), “Growth Temperature Dependence of the Si(001)/SiO2 Interface Width.”, Appl. Phys. Lett., 64, 748-750.
•M.L.Green, D.Brasen, K.W.Evans-Lutterodt, L.C.Feldman, K.Krisch, W.Lennard, H.T.Tang, L.Manchanda and M.-T.Tang, (1994), “Rapid Thermal Oxidation of Silicon in N2O Between 800 and 1200C: Incorporated Nitrogen and Interfacial Roughness.”, Appl. Phys. Lett., 65, 848-850.
•K.W.Evans-Lutterodt and M.-T.Tang, (1995), “Angle Calculation for a ‘2+2’ Surface X-ray Diffractometer.”, J. of Appl. Cryst., 28 318-323.
•J.L.Dawson, K.Krisch, K.W.Evans-Lutterodt, M.-T.Tang, L.Manchanda, M.L.Green, D.Brasen, H.S.Higashi and T.Boone, (1995), “Kinetic Smoothening: Growth Thickness Dependence of the Interface Width of the Si(001)/SiO2 Interface.”, J. Appl. Phys., 77,4746.
•S.T.Cundiff, W.H.Knox, F.H.Baumann, K.W.Evans-Lutterodt, M.-T.Tang, M.L.Green and H.M. van Driel, (1997), “Si/SiO2 interface roughness: comparison between surface second harmonic generation and X-ray scattering.”, Appl. Phys. Lett., 70, 1414-1416.
•C.H.Hsu and M.-T.Tang, (1998), “The Surface X-ray Scattering System at SRRC”, J. of Synchrotron Radiation, 5, 896-898.
•S.L.Chang, Y.S.Huang, C.H.Chao, M.-T.Tang and Y.P.Stetsko, (1998), “ Three-wave Resonance Grazing Incidence X-ray Diffractioin: A Novel Method for Direct Phase Determination of Surface in-plane Reflections.”, Phys. Rev. Lett., 80, 301-304.
•M.-T. Tang, T.E. Dann, C.C. Chen, K.L.Tsang, C.T.Chen, K.S.Liang, (2001), “Design of the Taiwan Contract Bending Magnet Beamline at SPring-8”, Nucl. Instrum. Meth. A467-468, 719-722.
•J.-F. Lee, M.-T. Tang, W.-C. Shih, and R.-S. Liu, (2002), “Ce K-edge EXAFS Study of Nanocrystalline CeO2”, Materials Research Bulletin", 31 , 555-562.
•H. H. Lee, M. S. Yi, H. W. Jang, Y.-T. Moon, S.-J. Park and D. Y. Noh, M.-T. Tang and K. S. Liang, (2002), “Determination of absolute indium content in InGaN/GaN multiple quantum wells using anomalous x-ray scattering”, Appl. Phys. Lett., 81, 5120-5122.
•H. H. Lee, H. W. Jang, T. C. Kim, D. Y. Noh, M. S. Yi, M.-T. Tang, K. S. Liang,(2003), ”Structural characterization of InGaN thin films and multiple quantum wells : an approah of combining various x-ray scatterng methods", Physica B, 336 109-117.
•C.-H. Hsu, H.-Y. Lee, Y.-W. Hsieh, Y. P. Stetsko, N.T. Yeh, J.-I. Chyi, D. Y. Noh, M.-T. Tang, and K.S. Liang, (2003), X-ray scattering studies on InGaAs quantum dots”,. Physica B336 98-102.
•Y. P.Stetsko, Y-R Lee, M.-T. Tang and S-L Chang, (2004),”Phase-dependent polarization aspects of three-wave diffraction: an iterative Born Approximation”, Acta Cryst., A60, 64-74.
•C.-H. Du, M.-T. Tang, Y. P. Stetsko, Y.-R. Lee, C.-W. Wang, C.-W. Cheng and S.-L. Chang, (2004), “X-ray multiple-wave coherent interaction in a quasi-two-dimensional material NbSe2-2H”, Acta Cryst. A60, 209-213.
•T. C. Chang, S. T. Yan, C. H. Hsu, M.-T. Tang, J. F. Lee, Y. H. Tai, P. T. Liu, and S. M. Sze, (2004), “A distributed charge storage with GeO2 nanodots “, Appl. Phys. Lett., 84, 2581-2583.
•D. H. Kim, S. S. Kim, H. H. Lee, H. W. Jang, J. W. Kim, M.-T. Tang, K. S. Liang, S. K. Sinha, D. Y. Noh, (2004), “Oxidation Kinetics in Iron and Stainless Steel: An in situ X-ray Reflectivity Study”, J. Phys. Chem., B108, 20213-20218 .
•C.-H.Hsu, M.-T.Tang, H-Y. Lee, C.-M. Huang, K. S. Liang, S. D. Lin, Z.C.Lin and C.P. Lee, (2005), “Composition determination of seminconductor quantum wires by X-ray scattering”, Physica, B357, 6-10.
•C.H. Huang, J.C. Jan, J.W. Chiou, H.M. Tsai, C.W. Pao, C.H. Du, W.F. Pong, M.-H. Tsai, M.-T. Tang, J.J. Lee, J.F. Lee, (2005),”Electronic and atomic structures of quasi-one-dimensional K0.3MoO3”, Appl. Phys. Lett., 86, 141905.
•W.-B Su, M.-T. Tang and J.-R. Chang, (2005), “Rejuvenation of Moisture-Exposed Pd/δ-Al2O3 Catalysts for Isoprene-Selective Hydrogenation: Correlation between Pd dispersion and catalytic properties.”, Ind. Eng. Chem. Res., 44(6), 1677-1687.
•S.-L. Chang, Yu. P. Stetsko, M.-T. Tang, Y.-R. Lee, W.-H. Sun, M. Yabashi and T. Ishikawa, (2005), “ X-ray Resonance in Crystal Cavities: Realization of Fabry-Perot Resonator for Hard X-rays.”, Phys. Rev. Lett., 94, 174801.
•Bing-Joe Hwang, Loka Subramanyam Sarma, Jiun-Ming Chen, Ching-Hsiang Chen, Shou-Chu Shih, Guo-Rung Wang, Din-Goa Liu, Jyh-Fu Lee, and Mau-Tsu Tang, (2005), “Structural models and atomic distribution of bimetallic nanoparticles as investigated by X-ray Absorption Spectroscopy”, J. AM. CHEM. SOC., 127, 11140-11145.
•Din-Goa Liu, Jeh-Fu Lee and Mau-Tsu Tang, (2005), “Characterization of Pt-Ru/C catalysts by X-ray absorption spectroscopy and temperature-programmed surface reaction”, J. of Mol. Catalysis A: Chemical 240, 197-206.
•S. Mylswamy, C.Y.Wang, R.S.Liu, J.F-.Lee, M.-T.Tang, J.-J.Lee and B.-J.Weng, (2005),” Anode catalysts for enhanced methanol oxidation: An in situ XANES study of PtRu/C and PtMo/C catalysts”, Chem. Phys. Lett., 412, 444-448.
•Ching-Hsiang Chen, Bing-Joe Hwang, Guo-Rung Wang, Loka Subramanyam Sarma, Mau-Tsu Tang, Din-Goa Liu, and Jyh-Fu Lee (2005), “Nucleation and Growth Mechanism of Pd/Pt Bimetallic Clusters in Sodium Bis(2-ethylhexyl)sulfosuccinate (AOT) Reverse Micelles as Studied by in Situ X-ray Absorption Spectroscopy”, J. Phys. Chem., B 109, 21566-21575.
•B-J Hwang, C-H Chen, L S Sarma, J-M Chen, G-R Wang, M.-T. Tang, D-G Liu and J-F Lee, (2006), ”Probing the Formation Mechanism and Chemical States of Carbon-Supported Pt-Ru Nanoparticles by in Situ X-ray Absorption Spectroscopy”, J. Phys. Chem., B110, 6475-6482.
•C.H.Du, M.T.Tang, Y.P.Stesko, H.H.Lin and S.L.Chang, (2006), “Direct Measurement of Spatial Distortions of Charge Density Waves in K0.3MoO3", Appl. Phys. Lett., 88, 241916.
•G.-C. Yin, M.-T. Tang, Y.-F. Song, F. Deuer, W. Yun and K-S Liang, (2006), “An energy-tunable transmission x-ray microscope for differential contrast imaging with near 60-nm resolution tomography", Appl. Phys. Lett., 88, 241115.
•G-C Yin, Yen-Fang. Song, Mau-Tsu Tang, Fu-Rong Chen, Keng S. Liang, Frederick W. Duewer, Wenbing Yun and Han-Ping D. Shieh, (2006), “Sub-30 nm Resolution X-ray Imaging at 8 keV using Third Order Diffraction of a Zone Plate Lens Objective in a Transmission Microscope”, Appl. Phys. Lett, 89, 221122.
•W. C. Sun, H. C. Chang, B. K. Wu, Y. R. Chen, C. H. Chu, S. L. Chang, M. Hong, M. T. Tang and Yu. P. Stetsko, (2006), “Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction”, Appl. Phys. Lett. 89, 091915.
•Jiun-Ming Chen, Loka Subramanyam Sarma, Ching-Hsiang Chen, Ming-Yao Cheng, Shou-Chu Shih, Guo-Rung Wang, Din-Goa Liu, Jyh-Fu Lee, Mau-Tsu Tang, Bing-Joe Hwang, (2006),“ Multi-scale dispersion in fuel cell anode catalysts: Role of TiO2 towards achieving nanostructured materials”, J. Power Sources, 159, 29-33.
•S.-L. Chang, Yu. P. Stetsko, M.-T. Tang, Y.-R. Lee, W.-H. Sun, M. Yabashi, T. Ishikawa, H.-H. Wu, B.-Y. Shew, Y.-H. Lin, T.-T. Kuo, K. Tamasaku, D. Miwa, S.-Y. Chen, Y.-Y. Chang, and J.-T. Shy, (2006), “Crystal cavity resonance for hard x rays: A diffraction experiment”, Phys. Rev. B 74, 134111.
•Chih-Ming Lin, Tsu-Lien Hung, Yen-Heng Huang, Kung-Te Wu, Mau-Tsu Tang, Chih-Hao Lee, C. T. Chen, and Y. Y. Chen, (2007),“ Size-dependent lattice structure of palladium studied by x-ray absorption spectroscopy”, Phys. Rev. B 75, 125426
• Z. K. Yang, W. C. Lee, Y. J. Lee, P. Chang, M. L. Huang, M. Hong, K. L. Yu, M.-T. Tang, B.-H. Lin, C.-H. Hsu and J. Kwo, (2007), “Structural and compositional investigation of yttrium-doped HfO2 films epitaxially grown on Si (111)”, Appl. Phys. Lett., 91, 202909.
•Y.-Y. Chang, Y.-W. Tsai, Y.-H. Wu, M.-T. Tang, and S.-L. Chang, Dynamical Diffraction Effect in a Curved Multi-plate Crystal Cavity, Acta Crystallogr. A 68 , 729 (2012)
•S.-H. Chang, C.-H. Chang, J.-M. Juang, L.-J. Huang, T.-F. Lin, C.-Y. Liu, C.-F. Chang, D.-G. Liu, K.-L. Tsang, W.-F. Pong, C.-H. Du, S.-L. Chang, Y.-L. Soo, and M.-T. Tang*, Design and Commission of a Superconducting Wiggler X-ray Beamline for Advanced Materials Investigation at the National Synchrotron Radiation Research Center, Chinese J. Phys. 50 , 220 (2012).
•S H Chang, G C Yin , D J Wang, C H Chang, J M Juang, L J Huang, C Y Liu, C F Chang, C H Chu, and M T Tang*, Design of the X-ray Nanprobe Beamline at the Taiwan Photon Source, Journal of Physics: Conference Series 425 (2013) 182005.
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