个人简介

以负责人身份主持国家自然科学基金一项，河北省自然科学基金一项，中央高校基本科研业务费专项资金资助重点项目一项、面上项目一项。已公开出版学术专著一部，发表三十余篇学术论文，获得两项国家发明专利授权。

研究领域

大规模集成电路设计；电路级和体系结构级可靠性设计与容错计算；大数据分析与分布式计算

主要项目： 1.参数偏差影响下三维多核芯片的系统性能优化。国家自然科学基金项目，项目号：61204027； 2.参数偏差影响下三维嵌入式多核芯片能耗管理与优化研究。河北省自然科学基金项目，项目号：，F2013502274； 3.偏差感知的多处理器片上系统性能良品率统计分析与优化方法研究。中央高校基本科研业务费专项资金资助重点项目，项目号：2014ZD32.

近期论文

查看导师新发文章 （温馨提示：请注意重名现象，建议点开原文通过作者单位确认）

1.Song Jin, Songwei Pei, Yinhe Han, Huawei Li. A cost effective energy optimization framework of multi-core SoCs based on dynamically reconfigurable voltage-frequency islands. ACM Transactions on Design Automation of Electronic Systems (TODAES), 2016, 21(2):1-14. 2.Song Jin, Yinhe Han, Songwei Pei. Statistical energy optimization on voltage–frequency island based MPSoCs in the presence of process variations. Microelectronics Journal, 2016, 54:23-31. 3.Song Jin, Yu Wang and Tongna Liu. On optimizing system energy of voltage-frequency island based 3-D multi-core SoCs under thermal constraints. Integration, the VLSI Journal, 2015, 48(1):36-45. 4.Song Jin, Yinhe Han, Huawei Li, Xiaowei Li. Unified capture scheme for small delay defect detection and aging prediction. IEEE Transactions on Very Large Scale Integration Systems (VLSI), 2013, 21(5):821-833. 5.Song Jin, Yinhe Han. M-IVC: Applying multiple input vectors to co-optimize aging and leakage. Microelectronics Journal，2012, 43(11):838-847. 6.Song Jin，Yinhe Han，Huawei Li，Xiaowei Li. Statistical lifetime reliability optimization considering joint effect of process variation and aging. Integration, the VLSI journal，2011, 44(3):185-191. 7.靳松, 韩银和, 王瑜. 面向三维多核片上系统的热感知硅后能耗优化方法. 计算机学报, 2016, 39(9):1763-1774. 8.靳松，韩银和，李华伟，李晓维. 一种考虑工作负载的电路老化预测方法. 计算机辅助设计与图形学学报. 2010, 22(12):2242-2249. 9.Song Jin, Yinhe Han, Songwei Pei. Variation-aware statistical energy optimization on voltage-frequency island based MPSoCs under performance yield constraints. IEEE Asia and South Pacific Design Automation Conference (ASP-DAC), 2014:720-725. 10.Yinhe Han, Song Jin, Jibing Qiu, Qiang Xu. On predicting NBTI-induced circuit aging by isolating leakage change. IEEE International Symposium on Quality Electronic Design (ISQED), 2013:46-52. 学术专著： 靳松，韩银和. 纳米数字集成电路老化效应-分析、预测及优化. 《清华大学出版社》, 2012年6月.