个人简介
工作经历
2019.01-至今 上海交通大学 副研究员
2009.04-2018.12 上海交通大学 助理研究院
学习经历
2005.02-2009.03 上海交通大学 工学博士
2002.09-2005.02 江苏科技大学 工学硕士
1998.09-2002.07 江苏科技大学 学士
研究领域
研究方向一 微电子互连结构可靠性
研究方向二 焊接过程数值模拟
近期论文
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[1] Dezhi Yang, Chen Hua, Shengzhi Qu, Jijin Xu, Junmei Chen, Chun Yu*, Hao Lu*. Isothermal transformation of γ-Co to ε-Co in Stellite 6 coatings. Metallurgical and Materials Transactions A 50A (2019) 1153-1161.
[2] Qingzhao Wang, Maolong Zhang, Weihua Liu, Xiao Wei, Jijin Xu, Junmei Chen, Hao Lu*, Chun Yu*. Cr or C controlled formation of transition martensite in dissimilar metal weld. Materials Characterization 147 (2019) 434–442.
[3] Chen Hua, Hao Lu*, Chun Yu*, Junmei Chen, Maolong Zhang, Dayong Li. Reduction of Laves phase in nickel alloy welding process under ultrasonic ampere force. Journal of Materials Processing Tech 252(2018)389-397.
[4] Jijin Xu, Jingyao Chen, Chun Yu*, Yi Duan, Junmei Chen, Hao Lu*. Comparison of residual stress induced by TIG and LBW in girth weld of AISI 304 stainless steel pipes. Journal of Materials Processing Tech. 248(2017) 178-184.
[5] Qingzhao Wang, Maolong Zhang, Weihua Liu, Xiao Wei, Jijin Xu, Junmei Chen, Hao Lu*, Chun Yu*. Study of type-II boundary behavior during SA508-3EQ309L overlay weld interfacial failure process. Journal of Materials Processing Tech. 247(2017) 64-72.
[6] Chen Hua, Hao Lu, Chun Yu*, Jun-Mei Chen, Xiao Wei, Ji-jin Xu. Reduction of ductility-dip cracking susceptibility by ultrasonic-assisted GTAW. Journal of Materials Processing Technology 239 (2017) 240-250.
[7] Chun Yu,Jieshi Chen,Zhewen Cheng,Yuqian Huang,Junmei Chen,Jijin Xu*,Hao Lu*,Fine grained Cu film promoting kirkendall voiding at Cu3Sn/Cu interface,Journal of Alloys and Compounds 660 (2016) 80-84.
[8] Xiao Wei, Mengjia Xu, Qingzhao Wang, Maolong Zhang, Weihua Liu, Jijin Xu, Junmei Chen, Hao Lu*, Chun Yu*. Effect of local texture and precipitation on the ductility dip cracking of ERNiCrFe-7A Ni-based overlay. Materials and Design 110 (2016) 90-98.
[9] Jie Shi Chen, Cheng Hui Ye, Jun Mei Chen, Ji Jin Xu, Chun Yu*, Hao Lu*. Sn whiskers mitigation by refining grains of Cu substrate during the room temperature exposure. Materials Letters 161 (2015) 201-204.
[10] Jie-Shi Chen, Cheng-Hui Ye, Chun Yu*, Hao Lu*. The micro-mechanism for the effect of Sn grain orientation on substrate consumption in Sn solder joints. Computational Materials Science 108(2015) 1-7.
[11] Chun Yu, Yang Yang, Jieshi Chen, Jijin Xu, Junmei Chen, Hao Lu*. Effect of deposit thickness during electroplating on Kirkendall voiding at Sn/Cu joints. Materials Letters 128(2014) 9-11.
[12] Chun Yu, Dongye Wang, Jieshi Chen, Jijin Xu, Junmei Chen, Hao Lu*. Study of Cu6Sn5 and Cu3Sn growth behaviors by considering Trace Zn. Materials Letters 121(2014) 166-169.
[13] Chun Yu, Jieshi Chen, Kai-yun Wang, Jingqing Chen, Hao Lu*. Suppression effect of Cu and Ag on Cu3Sn layer in solder joints. Journal of Materials Science: Materials in Electronics 24(2013) 4630-4635