操光辉 - 上海大学 - 材料科学与工程学院

研究领域

主要从事金属间化合物塑性机理、金属和合金剧烈塑性变形、微纳合金设计、合成和结构调控、先进钢铁材料及高温热障防护涂层研究；采用透射电镜(TEM)和高分辨透射电镜(HRTEM)从纳米和原子尺度研究材料微观结构，诠释材料结构和性能之间的关系；精通透射电子显微术，具有多年从事透射电镜和高分辨透射电镜表征材料晶体结构和缺陷经验。　与美国能源部Ames Laboratory、Iowa State University以及德国Karlsruhe Institute of Technology和TU Dresden等大学建立了良好合作关系。

近期论文

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G.H. Cao, A.T. Becker, D. Wu, L.S. Chumbley, T.A. Lograsso, A.M. Russell, K.A. Gschneidner Jr., Mechanical properties and determination of slip systems of the B2 YZn intermetallic compound, Acta Mater. 2010, 58(12), 4298-4304. G.H. Cao, H.N. Tian, N. Liu, X. Li, Z.M. Ren, Mechanical properties of the B2 NdAg intermetallic compound, Scripta Mater. 2011, 65(2), 147-150. G.H. Cao, A.M. Russell, K.A. Gschneidner Jr., Transmission electron microscopy study of the microstructure of YCu ductile intermetallic compound, the influence of the start metal purity, Scripta Mater. 2011, 64(9), 821-823. G.H. Cao, T.P. Ou, H. Jiang, A.M. Russell, Microstructure investigations of Pt-modified -Ni3Al+-Ni coatings on Ni-based superalloys, J. Mater. Res. 2010, 25(6), 1191-1195. G.H. Cao, D. Shechtman (2011年诺贝尔化学奖获得者), D.M. Wu, A.T. Becker, L.S. Chumbley, T.A. Lograsso, A.M. Russell, K.A. Gschneidner Jr., Determination of slip systems and their relation to the high ductility and fracture toughness of the B2 DyCu intermetallic compound, Acta Mater. 2007, 55(11), 3765-3770. G.H. Cao, W. Skrotzki, P. Simon, S.C. Wimbush, B. Holzapfel, Transmission electron microscopy and high-resolution electron microscopy investigation of the microstructure of an YNi2B2C thin film, Chem. Mater. 2005, 17(13), 3558-3562. G.H. Cao, G.J. Shen, Z.G. Liu, W. Skrotzki, Transmission electron microscopic investigation of the a ® g phase transformation in a Ti-45Al-5Nb alloy, Scripta Mater. 2004, 51(5), 417-421. G.H. Cao, P. Simon, U. Kraemer, S.C. Wimbush, B. Holzapfel, Transmission electron microscopy and high-resolution electron microscopy study of YNi2B2C thin film on Y2O3 buffered MgO, Chem. Mater. 2004, 16(5), 842-845. G.H. Cao, G.J. Shen, J.-M. Liu, Z.G. Liu, W. Skrotzki, TEM characterization of domain boundaries in a Ti-46Al-1Cr-0.2Si alloy, Scripta Mater. 2003, 49(8), 797-802. G.H. Cao, G.J. Shen, Z.G. Liu, J.-M. Liu, Microstructural characterization of V-doped single-phase titanium aluminide, Scripta Mater. 2001, 44(6), 985-989.