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M. M. Yang, X. Q. Zhao, J. Wang, Q. X. Zhu, J. X. Zhang, X. M. Li, H. S. Luo, X. G. Li, and R. K. Zheng, Intrinsic and quantitative effects of in-plane strain on ferroelectric properties of Mn-doped BiFeO3 epitaxial films by in situ inducing strain in substrates, Appl. Phys. Lett. 104, 052902 (2014).
M. Zheng, X. Y. Li, M. M. Yang, Q. X. Zhu, Y. Wang, X. M. Li, X. Shi, H. L. W. Chan, X. G. Li, H. S. Luo, and R. K. Zheng, Coupling of magnetic field and lattice strain and its impact on electronic phase separation in La0.335Pr0.335Ca0.33MnO3/ferroelectric crystal heterostructures, Appl. Phys. Lett. 103, 263507 (2013).
Q. X. Zhu, M. Zheng, M. M. Yang, X. M. Li, Y. Wang, X. Shi, H. L. W. Chan, H. S. Luo,1 X. G. Li, and R. K. Zheng, Effects of ferroelectric-poling-induced strain on magnetic and transport properties of La0.67Ba0.33MnO3 thin films grown on (111)-oriented ferroelectric substrates, Appl. Phys. Lett. 103, 132910 (2013).
Q. X. Zhu, W. Wang, S. W. Yang, X. M. Li, Y. Wang, H.-U. Habermeier, H. S. Luo,H. L. W. Chan, X. G. Li, and R. K. Zheng, Coaction and competition between the ferroelectric field effect and the strain effect in Pr0.5Ca0.5MnO3 film /0.67Pb(Mg1/3Nb2/3)O3-0.33PbTiO3 crystal heterostructures, Appl. Phys. Lett. 101, 172906 (2012).
R. K. Zheng, H.-U. Habermeier, H. L. W. Chan, C. L. Choy, and H. S. Luo, Effects of substrate-induced strain on transport properties of LaMnO3+d and CaMnO3 thin films using ferroelectric poling and converse piezoelectric effect Phys. Rev. B 81, 104427 (2010).
R. K. Zheng, H.-U. Habermeier, H. L. W. Chan, C. L. Choy, and H. S. Luo, Effect of ferroelectric-poling-induced strain on the phase separation and magnetotransport properties of La0.7Ca0.15Sr0.15MnO3 thin films grown on ferroelectric single-crystal substrates, Phys. Rev. B 80, 104433 (2009).
R. K. Zheng, Y. Jiang, Y. Wang, H. L. W. Chan, C. L. Choy, and H. S. Luo, Ferroelectric poling and converse-piezoelectric-effect-induced strain effects in La0.7Ba0.3MnO3 thin films grown on ferroelectric single-crystal substrates, Phys. Rev. B 79, 174420 (2009).
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