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无铅电子焊料;材料失效分析

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A.P. Xian *,M. Liu, Effect of humidity on tin whisker growth from Sn3Nd intermetallic compound, J. Mater. Res., 27[12], 1652-1662,(2012) H.C. Shi; A.P. Xian*, Tin Whisker Growth on NdSn(3) Powder,JOURNAL OF ELECTRONIC MATERIALS, 40[9],1962-1966,(2011) M. Liu; A.P. Xian*,TEM observation of tin whisker,SCIENCE CHINA-TECHNOLOGICAL SCIENCES,54[6], 1546-1550, (2011) H.C. Shi; Xian Ai-Ping* ,Tin Whisker Growth on NdSn3 Powder,JOURNAL OF ELECTRONIC MATERIALS 40[ 9],1962-1966 (2010) M.Liu, A.P.Xian*, Tin Whisker growth on the surtace of Sn-0.7cu Lead-free solder With a Rare earth(Nd) addition,J.Electro, Mater. 38[11], 2353-2361 (2009) M.Liu, A.P.Xian* ,Tin whisker growth on bulk Sn-Pb tutectic doping Nd,Microelectronics Reliability, 49, 667-672 (2009) A.P.Xian*,M.Liu, Observation of continuos tin whisker growth in NdSn3 intermetallic compound,J.Mater.Res.,24[9], 2775-2783, (2009) M. Liu, A.P. Xian*, Spontaneous growth of whiskers on RE-bearing intermetallic compounds of Sn-RE, In-RE, and Pb-RE,J. ALLOYS AND COMPOUNDS,486[1-2], 590-596 (2009) Xian AP, Gong GL, Surface oxidation of molten Sn-0.07 wt% P in air at 280 degrees C, JOURNAL OF MATERIALS RESEARCH, 23[ 6 ], (2008), 1532-1536 B.Jiang and A.P.Xian, Whisker growth on tin finishes of different electrolyes, Microelectronics Reliability, 48[1], 105-110(2008) Jiang B, Xian AP, Spontaneous growth of tin whiskers on tin-rare earth alloys, Phil. Mag. Lett., Vol.87, No7, 657-662, 2007 Jiang B, Xian AP,Observation of ribbon-like whiskers on tin finish surface, J. Mater Sci-Mater Electro 18 (5): (2007), 513 -518 Xian AP, Gong GL, Oxidation behavior of molten tin doped with phosphorus, JOURNAL OF ELECTRONIC MATERIALS, 36[12], (2007),1669-1678 Jiang B, Xian AP,Discontinuous growth of tin whiskers, Phil. Mag. Lett., Vol.86, No.8 : 521-527, 2006

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