个人简介
何红宇,华中科技大学电子科学与技术专业本科毕业;华中科技大学微电子学与固体电子学专业硕士毕业;华南理工大学微电子学与固体电子学专业博士毕业;北京大学博士后。
近期论文
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[1]HongyuHe,etal,AnalyticaldraincurrentmodelforamorphousInGaZnOthin-filmtransistorsatdifferenttemperaturesconsideringbothdeepandtailtrapstates,IEEETransactionsonElectronDevices,2017,64(9):3654-3660
[2]HongyuHe,etal,Analyticaldraincurrentmodelfororganicthin-filmtransistorsatdifferenttemperaturesconsideringbothdeepandtailtrapstates,IEEETransactionsonElectronDevices,2016,63(11):4423-4431
[3]HongyuHe,etal,Above-threshold1/fnoiseexpressionforamorphousInGaZnOthin-filmtransistorsconsideringseriesresistancenoise,IEEEElectronDeviceLetters,2015,36(10):1056-1059
[4]HongyuHe,etal,1/fnoiseexpressionsforamorphousInGaZnOTFTsconsideringmobilitypower-lawparameterinabove-thresholdregime,IEEEElectronDeviceLetters,2015,36(2):156-158
[5]HongyuHe,etal,Trapped-charge-effect-basedabove-thresholdcurrentexpressionsforamorphoussiliconTFTsconsistentwithPao-Sahmodel.IEEETransactionsonElectronDevices,2014,61(11):3744-3750
[6]HongyuHe,etal,Polynomial-effective-channel-mobility-basedabove-thresholdcurrentmodelforundopedpolycrystalline-siliconthin-filmtransistorsconsistentwithPao-Sahmodel,IEEETransactionsonElectronDevices,2012,59(11):3130-3132
[7]HongyuHe,etal,Analyticalexpressionsfordopedpolycrystallinesiliconthin-filmtransistorsinabove-thresholdregimeconsistentwithPao-Sahmodelconsideringtrappedchargeeffect,IEEETransactionsonElectronDevices,2011,58(12):4324-4332
[8]HongyuHe,etal,Analyticalmodelofundopedpolycrystallinesiliconthin-filmtransistorsconsistentwithPao-Sahmodel,IEEETransactionsonElectronDevices,2011,58(4):1102-1107