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1.陈田,易鑫,王伟,刘军,梁华国,任福继.一种低功耗双重测试数据压缩方法.电子学报,2017,45(6):1382-1388.(EI)
2.TChen,DShen,XYi,HLiang,XWen,WWang.Reseeding-orientedTestPowerReductionforLinear-Decompression-BasedTestCompressionArchitectures.IEICETransactionsonInformationandSystems,2016,99(11):2672-2681.(SCI)
3.陈田,易鑫,郑浏旸,王伟,梁华国,任福继,刘军.基于Viterbi的低功耗确定性测试方案.计算机辅助设计与图形学学报,2016,28(05):821-829.(EI)
4.TianChen,KaiLiu,XinYi,DandanShen,WeiWang,FujiRen,JunLiu.Aconnectedcomponent-baseddistributedmethodforoverlappingcommunitydetection.Computing,CommunicationsandNetworkingTechnologies,2014FifthInternationalConferenceon.IEEE,2014.(EI)
5.TianChen,B.D.Yang,W.Wei,B.R.Hao,F.J.Ren,J.Liu,Y.X.Wang,Atestdatacompressionschemebasedonpositioninformationcoding.Computing,CommunicationsandNetworkingTechnologies,2014FifthInternationalConferenceon.IEEE,2014.(EI)
6.TianChen,L.YZheng,W.Wang,F.J.Ren,X.SZhang,H.Chang,AlowpowerBISTschemebasedonblockencoding.Computing,CommunicationsandNetworkingTechnologies,2014FifthInternationalConferenceon.IEEE,2014.(EI)
7.陈田,梁华国,王伟,易茂祥,黄正峰.基于优化编码的LFSR重播种测试压缩方案.计算机研究与发展,2012,49(2):443-452.(EI)
8.陈田,梁华国,易茂祥,王伟,黄正峰,张敏生.基于随机访问扫描的低功耗确定性测试方案.中国科学技术大学学报,2011,41(8):722-730.
9.陈田,梁华国,张敏生,王伟,易茂祥.应用段固定折叠计数器的低功耗测试方案.应用科学学报,2010,28(4):399-405.(EI)
10.TianChen,XinYi,DanDanShen,FuJiRen,WeiWang,BingDongYang.Imagerestorationmethodself-adaptivetothedielectriclayercolor.CloudComputingandIntelligentSystems(CCIS).2014IEEE3rdInternationalConferenceon.IEEE,2014:124-129.(EI)
11.王伟,周梦玲,方芳,郭二辉,陈田,刘军,任福继.片上网络路由器的测试及其外壳旁路故障的诊断.电子学报,2017,45(3):639-643.(EI)
12.LiangHuaguo,ChangHao,LiYang,WangWei,ChenTian,XuHui,OptimizedMid-bondOrderfor3D-StackedICsConsideringFailedBonding.ChineseJournalofElectronics,2015,24(2),223-228.(SCI,EI)
13.刘军,吴玺,裴颂伟,王伟,陈田.基于跨度和虚拟层的三维芯核测试外壳扫描链优化方法.电子学报,2015,44(3):454-459.(EI)
14.JLiu,QQian,XWu,WWang,TChen,FRen.Optimizingpre-bondandpost-bondtesttimeforthreedimensionIPCores.ComputerEngineeringandApplications,2015-06-16.
15.WeiWang,RunfengLi,FangFang,TianChen,FujiRen,Junliu,XiWu.Designandrealizationof3DNOCmulticastrouterbaseonmulticastrotationalroutingarithmetic.2014InternationalConferenceonComputing,CommunicationandNetworkingTechnologies,2014:1-6.(EI)
16.Liu,Jun;Qian,Qingqing;Wu,Xi;Ren,Fuji;Wang,Wei;Chen,Tian.TestwrapperoptimizationtechniqueusingBDFandGAfor3DIPcores.Computing,CommunicationandNetworkingTechnologies,2014,2014/07/11-2014/07/13,2014/07/12.(EI)
17.王伟,杨国兵,方芳,陈田,刘军,张欢.通过面积扩张和散热硅通孔的3DIC热量的优化.电子测量与仪器学报,2014,28(7):748-754.
18.韩博宇,王伟,刘坤,陈田,李润丰,郑浏旸.基于TSV的3D堆叠集成电路测试.合肥工业大学学报(自然科学版),2014,37(4):444-447.
19.王伟,张欢,方芳,陈田,刘军,汪秀敏.基于链式的信号转移冗余TSV方案.计算机工程与应用,2014-03-12.
20.WenPan,FengLiu,TaoXie,YanyanGao,YimingOuyang,TianChen,SPD-RAID4:SplittingParityDiskforRAID4StructuredParallelSSDArrays.The15thIEEEInternationalConferenceonHighPerformanceComputingandCommunications(HPCC2013),2013.(EI)
21.FYue,RLi,TChen,JLiu,PChen,WWang.Designandsimulationofhighperformancerouteronchipbasedonrandomrouting.JournalofElectronicMeasurementandInstrumentation.2013,27(7):669-675.
22.王伟、刘坤、方芳、陈田、韩博宇、李润丰,半物理仿真系统中网络通信模块的S-funtion设计与实现,计算机科学,2013,40(7):29-32.
23.王伟、刘坤、方芳、陈田、韩博宇、李润丰,半物理仿真系统中网络通信模块的S-funtion设计与实现,计算机科学,2013,40(7):29-32.
24.董寅冬、王伟、张欢、杨国兵、陈田、李润丰,FPGA测试的研究发展,计算机科学,2013,40(7):51-56
25.李鑫,梁华国,陈田,王伟,易茂祥.并行折叠计数器的BIST方案[J].电子学报,2012,40(5):1030-1033.(EI)
26.王伟,张欢,方芳,陈田,刘军,李欣,邹毅文.2TF:一种协同考虑过硅通孔和热量的三维芯片布图规划算法[J].电子学报,2012,40(5):971-976.(EI)
27.王伟,唐勇,方芳,陈田,刘军,常郝.信号反弹作用下的3D-SIC过硅通孔的测试结构,电子测量与仪器学报,2012,26:776-781.(178)
28.王伟,高晶晶,方芳,陈田,兰方勇,李杨.一种针对3D芯片的BIST设计方法,电子测量与仪器仪表学报,2012,26:215-222.(178)
29.王伟,林卓伟,陈田,刘军,方芳,吴玺.功耗约束下的3D多核芯片核级测试调度算法,电子测量与仪器学报,2012,26:591-596.(178)
30.王伟,李欣,陈田,刘军,方芳,吴玺.基于扫描平衡3DSoC测试优化方法,电子测量与仪器学报,2012,26,:586-590.(178)
31.王伟,董福弟,方芳,兰方勇,陈田,刘军.3D-SIC中多链式可配置容错结构.电子测量与仪器学报,2012,26:126-131.(178)
32.王伟,董福弟,陈田,方芳等.一种多链式结构的3D-SIC过硅通孔(TSV)容错方案.计算机工程与应用,计算机工程与应用,2012,48:75-81.(178)
33.王伟,李欣,陈田,刘军,方芳,吴玺.一种3DSoC测试优化算法.第七届中国测试学术会议,2012,6:276-280.
34.李鑫,梁华国,陈田,王伟,易茂祥.基于折叠计数器的低功耗BIST方案.仪器仪表学报,2011,32(12):1-5.
35.王丽娟,梁华国,陈田,王伟,李扬.基于位差码的测试数据压缩方案仪器仪表学报,2011,32(6):61-65.
36.邹毅文,梁华国,王伟,陈田,张欢.硅通孔数目敏感的三维电路划分,仪器仪表学报,2011,32(6):15-19.(EI)
37.陈田,梁华国,王伟,易茂祥,黄正峰.基于LFSR重播种的低功耗测试压缩方案.第6届中国测试学术会议,2010:18-25.
38.欧阳一鸣,刘娟,梁华国,陈田.一种基于选择触发的低功耗扫描链结构.计算机工程与应用,2010,46(1):57-60.
39.杨年宏,王伟,岳学民,陈田.一种热量敏感的3DSoC并行测试方法研究.计算机研究与发展(增刊),2010:307-309.
40.顾婉玉,梁华国,徐三子,陈田,王伟.一种基于响应中无关位填充的测试压缩方法.计算机研究与发展(增刊),2010:83-86.
41.TianChen,Hua-guoLiang,Min-shengZhang,WeiWang,Mao-xiangYi.ALowPowerTestSchemeBasedonSegmentFixingFoldingCounter.Proc.10thIEEEWorkshoponRTLandHighLevelTesting(WRTLT’09),HongKong,China,November2009:168-173.
42.易茂祥,梁华国,陈田.基于最佳交换递减的芯核测试链平衡划分.电子测量与仪器学报,2009,23(4):97-102.
43.张敏生,梁华国,陈田.NoC的低功耗快速测试.哈尔滨工业大学学报.2009,7,41(1):379-382.
44.黄正峰,梁华国,陈田,詹文法,孙科.一种容软错误的BIST结构.计算机辅助设计与图形学学报,2009,21(1):33-37.(EI)
45.梁华国,祝沈财,陈田,张念.基于RAS结构优化测试时间和数据量的测试方案.电子学报,2008,36(12):2418-2422.(EI)
46.TianChen,HuaguoLiang,MinshengZhang,WeiWang.ASchemeofTestPatternGenerationBasedonReseedingofSegment-FixingCounter.Proc.ofIEEEInternationalConferenceforYoungComputerScientists,2008:2272-2277.(EI,ISTP)
47.方芳,王伟,王杰,陈田,杨年宏.低功耗测试研究进展.合肥工业大学学报(自然科学版),2009,32(6):699-773.
48.黄正峰,梁华国,陈田,詹文法,孙科.一种容软错误的高可靠BIST结构.第五届中国测试学术会议论文集,2008:358-361.
专利:
1.一种基于颜色立方先验的单一图像能见度复原方法,201110089210.9
2.基于并行折叠计数器的重播种测试方案,201010570795.1
3.一种幂次数切分的LFSR重播种VLSI测试数据压缩方法,200910116316.6
4.异步可容错片上网络路由器设计方法,201410284202.3
5.片上网络中基于故障通道隔离检测的路由器容错方法,201410284219.9
6.设有信号反弹模块的3D-SIC过硅通孔的测试装置,CN201210330159.0
7.基于自振荡回路的电路老化测试方法,CN201310022154.6