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Xu H.,Zhou J.,Ma R.,Liang H.,Huang Z.; Liu C.; LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy, Integration, 2023, 91: 126-135.
Xu H.,Liu C.,Ma R.,Liang H.,Huang Z.,Zhou J.; Zhu S.; A triple-node-upset self-recoverable design based on Schmitt-triggers and C-elements, Microelectronics Reliability, 2023, 144: 114977.
Xu H.,Zhu R.,Sun X.,Fang X.,Qi P.,Liang H.; Huang Z.; Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction, Journal of Circuits, Systems and Computers, 2022, 0(0): 2350175.
Ma R.,HOLST S.,Wen X.,Yan A.; Xu H.; Evaluation and Test of Production Defects in Hardened Latches, IEICE Transactions on Information and Systems, 2022, E105-D: 5.
Xu H.,Zhou L.,Liang H.,Huang Z.,Sun C.; Ning Y.; High-Performance Double-Node-Upset-Tolerant and Triple-Node-Upset-Tolerant Latch Designs, Electronics, 2021, 10(20): 2515.
Huang Z.,Su Z.,Ni T.,Xu Q.,Qi H.,Lu Y.,Eric M.; Xu H.; Cross-Layer Dual Modular Redundancy Hardened Scheme of Flip-Flop Design Based on Sense-Amplifier, Journal of Circuits, Systems and Computers, 2020.
Ma R.,Holst S.,Wen X.,Yan* A.; Xu H. STAHL: A Novel Scan-Test-Aware Hardened Latch Design, 2019 IEEE European Test Symposium (ETS), Germany.
Xu H.,Zhu J.,Lu X.; Li J.; An advanced SEU tolerant latch based on error detection, Journal of Semiconductors, 2018, 39(05): 81-84.
Zhang L.,Yi M.,Yuan Y.,Gan Y.,Xu H.; Liang H. NBTI aging analysis and aging-tolerant design of p-type domino and gatesp, 12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015, Institute of Electrical and Electronics Engineers Inc.
Yin Z.,Sun X.,Xu F.,Fang X.; Xu H.; A DNA Computing Model on Triple-Stranded for Minimum Spanning Tree Problem, Journal of Computational and Theoretical Nanoscience, 2015, 12(7): 1132-1137.
Liang H.,Chang H.,Li Y.,Wang W.,Chen T.; Xu H.; Optimized mid-bond order for 3d-stacked ics considering failed bonding, Chinese Journal of Electronics, 2015, 24(2): 223-228.
Liang H.,Xu H.,Huang Z.; Yi M.; A low-leakage and NBTI-mitigated N-type domino logic, Journal of Semiconductors, 2014, 35(1).
Xu H.,Liang H.,Huang Z.; Chang H.; An improved aging-predict scheme based on symmerical NOR gate Journal of Electronics(China), 2013, 30(05): 509-516.
Chang H.,Xu H.; Li Y.; Quality analysis for online signature based on entropy and consistency over F-Tablet, Journal of Information and Computational Science, 2013, 10(10): 3079-3086.
Xu H.,Li J.-Z.,Yin Z.-X.; Sun X. Design of vehicle black box based on dual-core system and uCOS-II, 2012 International Conference on Industrial Control and Electronics Engineering, ICICEE 2012, August 23, 2012 - August 25, 2012, IEEE Computer Society.
Chang H.,Dai D.,Xu H.,Li Y.; Li Z.; Online signature verification using geometrical features over portable devices, Journal of Information and Computational Science, 2012, 9(14): 4123-4129.
Xu H.,Li J.-Z.,Yin Z.-X.,Sun X.; Wang H. Research on interference suppression of embedded measurement and control system, 2011 International Conference on Computer Science and Network Technology, ICCSNT 2011, December 24, IEEE Computer Society.
Hui X.,Jing-Zhao L.,Zhi-Xiang Y.; Xia S. Study and design of vehicle black box hardware system based on ARM and DSP, 2011 3rd International Asia Conference on Informatics in Control, Automation and Robotics, CAR 2011, Springer Verlag.
宋钛,黄正峰; 徐辉; 用于检测硬件木马延时的线性判别分析算法, 电子与信息学报, 2023, 45(01): 59-67.
徐辉,何洋*,李丹青; 李扬; 考虑路径相关性的TG-based缓解电路老化, 电子测量与仪器学报, 2018, 32(04): 187-192.
常郝,梁华国,蒋翠云,欧阳一鸣; 徐辉; 一种3D堆叠集成电路中间绑定测试时间优化方案, 电子学报, 2015, 43(02): 393-398.
梁华国,徐辉,梁丽波,黄正峰; 常郝; 低开销的信号违规检测结构LSVD, 电子测量与仪器学报, 2014, 28(01): 10-16.
徐辉,梁华国,黄正峰,汪静,李志杰,李扬; 严鲁明; 一种容忍老化的多米诺门, 电路与系统学报, 2012, 17(05): 91-97.