使用开尔文探针力显微镜在表面电势测量中不包括接触带电,ACS Nano

当前位置： X-MOL 学术 › ACS Nano › 论文详情

Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)

使用开尔文探针力显微镜在表面电势测量中不包括接触带电
ACS Nano ( IF 15.8 ) Pub Date : 2016-02-03 00:00:00 , DOI: 10.1021/acsnano.5b07418
Shengming Li _{1,

2} , Yusheng Zhou ₁ , Yunlong Zi ₁ , Gong Zhang ₂ , Zhong Lin Wang _{1,

3}

Affiliation

开尔文探针力显微镜（KPFM）是一种可以在纳米级上成像材料表面电势的表征方法，在表征金属，半导体和绝缘体材料的电和电子特性方面具有广泛的应用。但是，它需要对测量过程的物理原理有深刻的理解，并能够排除可能导致伪影获得准确结果的因素。在最常用的双程KPFM中，探针在提升到一定高度以测量表面电势之前的第一遍中以攻丝模式工作，以获取表面形貌信息。在本文中，我们证明了在典型的双通道KPFM测量过程中，分接模式形貌扫描通道可能会触发探针和样品之间的接触带电，这会导致样品表面带电，因此会给表面电势测量带来明显的误差。当探针进入针尖-样品相互作用的排斥力状态时，就会发生接触带电，这可以通过探针振动的相移来检测。此外，还检查了扫描参数，样品特性和探针属性的影响，其中不太可能出现较低的自由悬臂振动幅度，较大的探针尖端与样品之间的粘附力以及较低的悬臂弹簧常数。触发触点电气化。最后，我们提出了将接触带电与表面电势测量合理地分离的指南。它们正在减小自由振幅，增加设定点振幅，

"点击查看英文标题和摘要"

Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy

Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials of materials at the nanoscale, has extensive applications in characterizing the electric and electronic properties of metal, semiconductor, and insulator materials. However, it requires deep understanding of the physics of the measuring process and being able to rule out factors that may cause artifacts to obtain accurate results. In the most commonly used dual-pass KPFM, the probe works in tapping mode to obtain surface topography information in a first pass before lifting to a certain height to measure the surface potential. In this paper, we have demonstrated that the tapping-mode topography scan pass during the typical dual-pass KPFM measurement may trigger contact electrification between the probe and the sample, which leads to a charged sample surface and thus can introduce a significant error to the surface potential measurement. Contact electrification will happen when the probe enters into the repulsive force regime of a tip–sample interaction, and this can be detected by the phase shift of the probe vibration. In addition, the influences of scanning parameters, sample properties, and the probe’s attributes have also been examined, in which lower free cantilever vibration amplitude, larger adhesion between the probe tip and the sample, and lower cantilever spring constant of the probe are less likely to trigger contact electrification. Finally, we have put forward a guideline to rationally decouple contact electrification from the surface potential measurement. They are decreasing the free amplitude, increasing the set-point amplitude, and using probes with a lower spring constant.

更新日期：2016-02-03

点击分享查看原文

点击收藏

阅读更多本刊新发论文本刊介绍/投稿指南