Differential interference contrast (DIC) microscopy is a powerful technique for imaging phase objects in transparent samples but does not work with scattering samples. This Letter, to the best of our knowledge, describes a new technique for obtaining DIC-like phase-gradient images in scattering media based on differential detection of forward-scattered light, using detectors arranged in a ring configuration around the microscope objective pupil or its conjugate pupil plane. This method, called pupil plane differential detection (P2D2) microscopy, does not need polarization optics or a confocal pinhole, yet produces images that are free of speckles and interference noises. We compared the P2D2 imaging technique with reflectance confocal microscopy and demonstrated P2D2 as a simple add-on to conventional laser scanning microscopes.

中文翻译：

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瞳孔微分检测显微镜

微分干涉对比（DIC）显微镜是一种用于对透明样品中的相对象进行成像的强大技术，但不适用于散射样品。据我们所知，这封信描述了一种新技术，该技术基于前向散射光的差分检测，使用在显微镜物镜瞳孔或其周围呈环形配置的检测器，在散射介质中获得类DIC的相梯度图像共轭瞳孔平面。这种方法称为光瞳平面微分检测（P2D2）显微镜，不需要偏振光学镜或共焦针孔，但可以产生没有斑点和干扰噪声的图像。我们将P2D2成像技术与反射共聚焦显微镜进行了比较，并证明了P2D2是常规激光扫描显微镜的简单附件。