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Elucidation of the Two-Step Damage Formation Process of Latent Tracks in Poly(allyl diglycol carbonate), PADC: Role of Secondary Low-Energy Electrons
The Journal of Physical Chemistry C ( IF 3.3 ) Pub Date : 2018-08-30 , DOI: 10.1021/acs.jpcc.8b05341 Tamon Kusumoto 1 , Michel Fromm 2 , Pierre Cloutier 3 , Andrew D. Bass 3 , Léon Sanche 3 , Rémi Barillon 4 , Tomoya Yamauchi 5
The Journal of Physical Chemistry C ( IF 3.3 ) Pub Date : 2018-08-30 , DOI: 10.1021/acs.jpcc.8b05341 Tamon Kusumoto 1 , Michel Fromm 2 , Pierre Cloutier 3 , Andrew D. Bass 3 , Léon Sanche 3 , Rémi Barillon 4 , Tomoya Yamauchi 5
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The aim of the present study is to evaluate the mechanisms by which secondary electrons of low energy degrade poly(allyl diglycol carbonate) (PADC) when it is used as a Solid State Nuclear Track Detector. We measured, by time-of-flight mass spectrometry, the positive and negative ions desorbed by the impact of 5–30 eV electrons on three monolayer thick films of various PADC surrogate molecules, which contained ether and/or carbonyl (C═O) moieties. As cleavages within the molecules progress, most anion yields are seen to decrease with an increasing cumulative number of incident electrons (i.e., fluence). In contrast, the yield of O– at incident energies >15 eV, which is associated with damage at a carbonyl group, increases monotonically with fluence. This finding implies that cleavage of carbonyl groups occurs after damage to other oxygen containing groups within the surrogates. The present result corroborates the previously postulated two-step degradation process in PADC irradiated with high-energy electrons and 222 nm UV photons. More generally, these results underline the importance of considering the role of low energy secondary electrons in the deterioration of high-sensitivity energetic particle detectors.
中文翻译：
聚（碳酸二烯丙二醇酯），PADC中潜迹的两步破坏形成过程的阐明：次级低能电子的作用
本研究的目的是评估低能量的二次电子在用作固态核径迹检测器时通过其降解聚（碳酸烯丙二醇酯）（PADC）的机理。我们通过飞行时间质谱仪测量了5-30 eV电子撞击各种PADC替代分子的三个单层厚膜上所含的正负离子和负离子，其中PADC替代分子包含醚和/或羰基（C═O）部分。随着分子内裂解的进行，大多数阴离子产率随入射电子累积数量（即能量密度）的增加而降低。相反，O的产量–在入射能量> 15 eV时，与羰基基团的破坏有关，随着能量密度单调增加。该发现暗示羰基的裂解发生在替代物中的其他含氧基团被破坏后。本结果证实了先前假定的在高能电子和222 nm紫外线光子照射下的PADC中的两步降解过程。更一般而言，这些结果强调了考虑低能二次电子在高灵敏度高能粒子检测器劣化中的作用的重要性。
更新日期：2018-08-30
中文翻译：
聚（碳酸二烯丙二醇酯），PADC中潜迹的两步破坏形成过程的阐明：次级低能电子的作用
本研究的目的是评估低能量的二次电子在用作固态核径迹检测器时通过其降解聚（碳酸烯丙二醇酯）（PADC）的机理。我们通过飞行时间质谱仪测量了5-30 eV电子撞击各种PADC替代分子的三个单层厚膜上所含的正负离子和负离子，其中PADC替代分子包含醚和/或羰基（C═O）部分。随着分子内裂解的进行，大多数阴离子产率随入射电子累积数量（即能量密度）的增加而降低。相反，O的产量–在入射能量> 15 eV时，与羰基基团的破坏有关，随着能量密度单调增加。该发现暗示羰基的裂解发生在替代物中的其他含氧基团被破坏后。本结果证实了先前假定的在高能电子和222 nm紫外线光子照射下的PADC中的两步降解过程。更一般而言，这些结果强调了考虑低能二次电子在高灵敏度高能粒子检测器劣化中的作用的重要性。
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