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Direct Imaging for Single Molecular Chain of Surfactant on CeO2 Nanocrystals
Small ( IF 13.0 ) Pub Date : 2018-07-01 , DOI: 10.1002/smll.201801093
Xiaodong Hao 1, 2 , Chunlin Chen 1 , Mitsuhiro Saito 3 , Deqiang Yin 1 , Kazutoshi Inoue 1 , Seiichi Takami 4 , Tadafumi Adschiri 1, 2, 5 , Yuichi Ikuhara 1, 3, 6
Affiliation  

Organic surfactant controls the synthesis of nanocrystals (NCs) with uniform size and morphology by attaching on the surface of NCs and further facilitates their assembly into ordered superstructure, which produces versatile functional nanomaterials for practical applications. It is essential to directly resolve the surfactant molecules on the surface of NCs to improve the understanding of surface chemistry of NCs. However, the imaging resolution and contrast are insufficient for a single molecule of organic surfactant on NCs. In this work, direct characterization of organic surfactant on CeO2 NCs is conducted by using the state‐of‐the‐art aberration corrected scanning transmission electron microscopy (STEM) imaging and electron energy loss spectra (EELS) techniques. The explicit evidence for the existence and distribution of organic surfactant on CeO2 NCs are obtained on the atomic scale by EELS elemental mapping. Besides, STEM imaging parameters are systematically adjusted and optimized for the direct imaging of a single molecular chain of organic surfactant on CeO2 NCs. Such direct visualization of organic surfactant molecule on the surface of NCs can be a significant step forward in the fields of nanomaterials surface chemistry and materials characterization.

中文翻译:


CeO2 纳米晶体上表面活性剂单分子链的直接成像



有机表面活性剂通过附着在NC​​s表面来控制尺寸和形态均一的纳米晶(NCs)的合成,并进一步促进其组装成有序的超结构,从而产生用于实际应用的多功能功能纳米材料。直接解析NC表面的表面活性剂分子对于提高对NC表面化学的理解至关重要。然而,NCs 上的单分子有机表面活性剂的成像分辨率和对比度不足。在这项工作中,通过使用最先进的像差校正扫描透射电子显微镜 (STEM) 成像和电子能量损失谱 (EELS) 技术,对 CeO 2 NC 上的有机表面活性剂进行直接表征。通过EELS元素图在原子尺度上获得了CeO 2 NCs上有机表面活性剂的存在和分布的明确证据。此外,系统地调整和优化了STEM成像参数,以实现有机表面活性剂单分子链在CeO 2 NCs上的直接成像。 NC 表面有机表面活性剂分子的这种直接可视化可能是纳米材料表面化学和材料表征领域向前迈出的重要一步。
更新日期:2018-07-01
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