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Surface Energy Characterization of Nanoscale Metal using Quantitative Nanomechanical Characterization of Atomic Force Microscopy
Applied Surface Science ( IF 6.3 ) Pub Date : 2020-03-01 , DOI: 10.1016/j.apsusc.2019.145041
Woosu Park , Sebastian Müller , Roelf-Peter Baumann , Stefan Becker , Byungil Hwang
Applied Surface Science ( IF 6.3 ) Pub Date : 2020-03-01 , DOI: 10.1016/j.apsusc.2019.145041
Woosu Park , Sebastian Müller , Roelf-Peter Baumann , Stefan Becker , Byungil Hwang
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Abstract Characterization of surface energy is an important step in the development of nano/micro electromechanical systems. However, the conventional surface energy characterization technique is not ideal for nanoscale samples due to the limited volume of liquid droplets. In this study, a novel technique to evaluate the surface energy of nanoscale materials is investigated by using atomic force microscopy (AFM). The contact angle/surface energy of a nanoscale Au wire is determined by measuring the adhesion force by AFM PeakForce-Quantitative Nanomechanical Mapping (PF-QNM) compared to the wetting behavior respectively adhesion force of various hydrophobic/hydrophilic thiol self-assembled monolayers (SAMs).
中文翻译:
使用原子力显微镜的定量纳米力学表征纳米级金属的表面能表征
摘要 表面能表征是纳米/微机电系统发展的重要一步。然而,由于液滴体积有限,传统的表面能表征技术对于纳米级样品并不理想。在这项研究中,通过使用原子力显微镜 (AFM) 研究了一种评估纳米材料表面能的新技术。纳米级 Au 线的接触角/表面能是通过测量 AFM 峰值力-定量纳米力学映射 (PF-QNM) 的粘附力与润湿行为和各种疏水/亲水硫醇自组装单分子层 (SAM) 的粘附力相比较来确定的)。
更新日期:2020-03-01
中文翻译:
![](https://scdn.x-mol.com/jcss/images/paperTranslation.png)
使用原子力显微镜的定量纳米力学表征纳米级金属的表面能表征
摘要 表面能表征是纳米/微机电系统发展的重要一步。然而,由于液滴体积有限,传统的表面能表征技术对于纳米级样品并不理想。在这项研究中,通过使用原子力显微镜 (AFM) 研究了一种评估纳米材料表面能的新技术。纳米级 Au 线的接触角/表面能是通过测量 AFM 峰值力-定量纳米力学映射 (PF-QNM) 的粘附力与润湿行为和各种疏水/亲水硫醇自组装单分子层 (SAM) 的粘附力相比较来确定的)。