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Monolayer MoS2 field effect transistor with low Schottky barrier height with ferromagnetic metal contacts.
Scientific Reports ( IF 3.8 ) Pub Date : 2019-11-19 , DOI: 10.1038/s41598-019-53367-z
Sachin Gupta 1 , F Rortais 1 , R Ohshima 1 , Y Ando 1 , T Endo 2 , Y Miyata 2 , M Shiraishi 1
Affiliation  

Two-dimensional MoS2 has emerged as promising material for nanoelectronics and spintronics due to its exotic properties. However, high contact resistance at metal semiconductor MoS2 interface still remains an open issue. Here, we report electronic properties of field effect transistor devices using monolayer MoS2 channels and permalloy (Py) as ferromagnetic (FM) metal contacts. Monolayer MoS2 channels were directly grown on SiO2/Si substrate via chemical vapor deposition technique. The increase in current with back gate voltage (Vg) shows the tunability of FET characteristics. The Schottky barrier height (SBH) estimated for Py/MoS2 contacts is found to be +28.8 meV (at Vg = 0V), which is the smallest value reported so-far for any direct metal (magnetic or non-magnetic)/monolayer MoS2 contact. With the application of positive gate voltage, SBH shows a reduction, which reveals ohmic behavior of Py/MoS2 contacts. Low SBH with controlled ohmic nature of FM contacts is a primary requirement for MoS2 based spintronics and therefore using directly grown MoS2 channels in the present study can pave a path towards high performance devices for large scale applications.

中文翻译:

具有铁磁金属触点的低肖特基势垒高度的单层MoS2场效应晶体管。

由于其独特的特性,二维MoS2已成为纳米电子学和自旋电子学的有前途的材料。但是,金属半导体MoS2界面处的高接触电阻仍然是一个悬而未决的问题。在这里,我们报告使用单层MoS2通道和坡莫合金(Py)作为铁磁(FM)金属触点的场效应晶体管器件的电子性能。单层MoS2通道通过化学气相沉积技术直接在SiO2 / Si衬底上生长。电流随背栅电压(Vg)的增加表明FET特性的可调性。发现Py / MoS2触点的肖特基势垒高度(SBH)估计为+28.8 meV(在Vg = 0V时),这是迄今为止所报告的任何直接金属(磁性或非磁性)/单层MoS2的最小值接触。随着栅极正电压的施加,SBH显示出还原,表明Py / MoS2触点的欧姆行为。具有FM接触的受控欧姆特性的低SBH是基于MoS2的自旋电子器件的主要要求,因此,在本研究中使用直接生长的MoS2通道可为大规模应用的高性能器件铺平道路。
更新日期:2019-11-19
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