Angle-resolved photoemission spectroscopy (ARPES) — an experimental technique based on the photoelectric effect — is arguably the most powerful method for probing the electronic structure of solids. The past decade has witnessed notable progress in ARPES, including the rapid development of soft-X-ray ARPES, time-resolved ARPES, spin-resolved ARPES and spatially resolved ARPES, as well as considerable improvements in energy and momentum resolution. Consequently, ARPES has emerged as an indispensable experimental probe in the study of topological materials, which have characteristic non-trivial bulk and surface electronic structures that can be directly detected by ARPES. Over the past few years, ARPES has had a crucial role in several landmark discoveries in topological materials, including the identification of topological insulators and topological Dirac and Weyl semimetals. In this Technical Review, we assess the latest developments in different ARPES techniques and illustrate the capabilities of these techniques with applications in the study of topological materials.

角分辨光发射光谱法（ARPES）是一种基于光电效应的实验技术，可以说是探测固体电子结构的最有效方法。过去十年见证了ARPES的显着进步，包括软X射线ARPES的快速发展，时间分辨ARPES，自旋分辨ARPES和空间分辨ARPES，以及能量和动量分辨率的显着提高。因此，ARPES已成为拓扑材料研究中必不可少的实验探针，这些拓扑材料具有可以通过ARPES直接检测的特征性非平凡的本体和表面电子结构。在过去的几年中，ARPES在拓扑材料的几个里程碑式发现中起着至关重要的作用，包括拓扑绝缘体和拓扑狄拉克和魏尔半金属的识别。在本技术评论中，我们评估了不同ARPES技术的最新发展，并说明了这些技术在拓扑材料研究中的应用能力。