This paper investigated the structural evolution of carbon deposition on a Ni/YSZ cermet of a SOFC. The Ni/YSZ cermet was heated in CH₄/Ar environment with a thermobalance. It was observed that carbon deposition preferentially occurred on Ni particles, and the area on which carbon deposited touched the Ni/YSZ interfaces. Meanwhile, carbon deposition was not found on some of the Ni/YSZ interfaces. The Ni/Zr interfaces had various defects, suggesting that the defect pattern may be an important factor for carbon deposition. XANES spectra showed that structural defects and C–H bonds were present in the nascent carbon deposition. As carbon deposition advanced, a graphite structure developed and C–H bonds diminished. Reactants produced from CH₄ cracking converted to a nascent amorphous carbon at the Ni/YSZ interface, and then contributed to the growth of carbon deposition on Ni surfaces, leading to the deposition of carbon encapsulating the Ni particles.

本文研究了SOFC的Ni / YSZ金属陶瓷上碳沉积的结构演变。将Ni / YSZ金属陶瓷在具有热天平的CH ₄ / Ar环境中加热。观察到碳沉积优先发生在Ni颗粒上，并且碳沉积的区域接触Ni / YSZ界面。同时，在某些Ni / YSZ界面上未发现碳沉积。Ni / Zr界面具有各种缺陷，表明缺陷模式可能是碳沉积的重要因素。XANES光谱表明，新生碳沉积中存在结构缺陷和CH键。随着碳沉积的发展，石墨结构逐渐发展，CH键减少。由CH ₄产生的反应物 裂纹在Ni / YSZ界面处转变为新生的无定形碳，然后促进了Ni表面上碳沉积的增长，从而导致包封Ni颗粒的碳沉积。