Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface,Advanced Materials Interfaces

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Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface
Advanced Materials Interfaces ( IF 4.3 ) Pub Date : 2019-05-01 , DOI: 10.1002/admi.201900364
Mikhail N. Drozdov ₁ , Pavel A. Yunin ₁ , Vlad V. Travkin ₁ , Andrey I. Koptyaev ₂ , Georgy L. Pakhomov _{1,

2}

Affiliation

Formamidinium‐lead‐iodide (FAPbI₃) perovskite films are subjected to a long‐term action of the constant electrical current in the dark, using planar vacuum‐deposited gold electrodes. The current‐induced transformation is monitored by the time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) mapping complemented by microscopic, spectroscopic methods, and X‐ray diffraction. The migration of chemical species inside the lateral interelectrode gap is clearly visualized by ToF‐SIMS. Those species correspond to both electrode material and perovskite itself, so that the perovskite/electrode interface becomes disrupted. As a result, the interelectrode gap shrinks, which is reflected in the surface images.

中文翻译：

钙钛矿/电极界面的电流诱导转变的直接成像

使用平面真空沉积金电极，在黑暗中对恒定电流进行长期作用的钙钛矿型碘化铅-碘化铅（FAPbI ₃）膜。通过飞行时间二次离子质谱（ToF-SIMS）映射，并辅以显微镜，光谱法和X射线衍射，可以监测电流诱导的转变。ToF-SIMS可以清楚地观察到横向电极间隙内部化学物质的迁移。这些种类既对应于电极材料又对应于钙钛矿本身，因此钙钛矿/电极界面被破坏。结果，电极间间隙缩小，这反映在表面图像中。

更新日期：2019-05-01

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