当前位置：
X-MOL 学术
›
ACS Appl. Mater. Interfaces
›
论文详情
Our official English website, www.x-mol.net, welcomes your
feedback! (Note: you will need to create a separate account there.)
Effects of Illumination Direction on the Surface Potential of CH3NH3PbI3 Perovskite Films Probed by Kelvin Probe Force Microscopy
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2019-03-27 00:00:00 , DOI: 10.1021/acsami.8b21774 Chao Yang 1 , Peng Du 1 , Zhensheng Dai , Huiqin Li , Xudong Yang , Qianli Chen 1
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2019-03-27 00:00:00 , DOI: 10.1021/acsami.8b21774 Chao Yang 1 , Peng Du 1 , Zhensheng Dai , Huiqin Li , Xudong Yang , Qianli Chen 1
Affiliation
|
The development of organic–inorganic hybrid perovskite solar cells requires critical understanding in the charge-carrier behaviors in the perovskite light absorbers and devices. Kelvin probe force microscopy (KPFM) has been applied as a powerful tool to probe the electrical potential distribution of perovskite films and devices, providing fundamental insights into their charge-carrier properties. When measuring the material photoresponses, various approaches have been employed to illuminate the samples. Here, we measured the surface potential of the layer in the regular mesoporous structure (CH3NH3PbI3/m-TiO2/c-TiO2/FTO) and inverted planar structure (CH3NH3PbI3/NiO/FTO) devices via KPFM. Effects of two representative illumination methods are compared—illumination from top, and from underneath through the transparent glass substrate. By comparing the variation in surface potential under two illumination methods, the surface potential of the perovskite-absorbing layer in a regular structure is higher than that in the inverted structure. The potential difference in two structures implies that the photogenerated charge carriers are injected to the TiO2 electron-transport layer and NiO hole-transport layer, resulting in positive charges and negative charges accumulated in the perovskite-absorbing layer. We demonstrated that the illumination direction has an impact on the surface potential measurement. For the CH3NH3PbI3/TiO2 structure, illumination from underneath facilitates a larger potential change. While for the CH3NH3PbI3/NiO structure with insensitive photoresponse in potential change, the illumination direction has a minor effect.
中文翻译：
开尔文探针力显微镜探测照明方向对CH 3 NH 3 PbI 3钙钛矿薄膜表面电势的影响
有机-无机杂化钙钛矿太阳能电池的发展需要对钙钛矿光吸收器和器件中的载流子行为有严格的了解。开尔文探针力显微镜（KPFM）已被用作探测钙钛矿膜和器件的电势分布的强大工具，从而提供了对其电荷载流子特性的基本了解。当测量材料的光响应时，已经采用了各种方法来照亮样品。在此，我们测量了规则介孔结构（CH 3 NH 3 PbI 3 / m-TiO 2 / c-TiO 2 / FTO）和倒置平面结构（CH 3 NH 3碘化铅3经由KPFM /的NiO / FTO）设备。比较了两种代表性照明方法的效果-从顶部照明，以及从下方通过透明玻璃基板的照明。通过比较两种照射方法下的表面电势的变化，规则结构中的钙钛矿吸收层的表面电势高于倒置结构中的钙钛矿吸收层的表面电势。两种结构的电势差意味着将光生电荷载流子注入TiO 2电子传输层和NiO空穴传输层，从而在钙钛矿吸收层中积累正电荷和负电荷。我们证明了照明方向对表面电势测量有影响。对于CH 3 NH3 PbI 3 / TiO 2结构，从下面照射有助于更大的电势变化。对于电位变化不敏感的CH 3 NH 3 PbI 3 / NiO结构，照射方向的影响较小。
更新日期：2019-03-27
中文翻译：
开尔文探针力显微镜探测照明方向对CH 3 NH 3 PbI 3钙钛矿薄膜表面电势的影响
有机-无机杂化钙钛矿太阳能电池的发展需要对钙钛矿光吸收器和器件中的载流子行为有严格的了解。开尔文探针力显微镜（KPFM）已被用作探测钙钛矿膜和器件的电势分布的强大工具，从而提供了对其电荷载流子特性的基本了解。当测量材料的光响应时，已经采用了各种方法来照亮样品。在此，我们测量了规则介孔结构（CH 3 NH 3 PbI 3 / m-TiO 2 / c-TiO 2 / FTO）和倒置平面结构（CH 3 NH 3碘化铅3经由KPFM /的NiO / FTO）设备。比较了两种代表性照明方法的效果-从顶部照明，以及从下方通过透明玻璃基板的照明。通过比较两种照射方法下的表面电势的变化，规则结构中的钙钛矿吸收层的表面电势高于倒置结构中的钙钛矿吸收层的表面电势。两种结构的电势差意味着将光生电荷载流子注入TiO 2电子传输层和NiO空穴传输层，从而在钙钛矿吸收层中积累正电荷和负电荷。我们证明了照明方向对表面电势测量有影响。对于CH 3 NH3 PbI 3 / TiO 2结构，从下面照射有助于更大的电势变化。对于电位变化不敏感的CH 3 NH 3 PbI 3 / NiO结构，照射方向的影响较小。
京公网安备 11010802027423号