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Molecular Structure Analysis in a Dip-Coated Thin Film of Poly(2-perfluorooctylethyl acrylate) by Infrared Multiple-Angle Incidence Resolution Spectrometry
Macromolecules ( IF 5.1 ) Pub Date : July 1, 2008 , DOI: 10.1021/ma800850k
Masaya Matsunaga 1 , Toshio Suzuki 1 , Kiyoshi Yamamoto 1 , Takeshi Hasegawa 1
Affiliation  

Infrared multiple-angle incidence resolution spectrometry (IR-MAIRS) has been employed to study molecular orientation in a thin film of poly(2-perfluorooctylethyl acrylate) (C8FA) coated on a Si substrate. Since the coated C8FA film exhibits a highly effective water and oil repellency, the structure−property relationship has intensively been studied mainly by use of X-ray diffractometry (XRD) thus far. Regardless, XRD provides details of molecular structure only for the crystallized parts in the film, and as a result a limited region of the perfluoroalkyl group is selectively analyzed. To overcome this analytical limitation, IR-MAIRS has first been employed for analysis of a polymer thin film coated on a solid substrate. The discussion after the IR-MAIRS measurements coupled with XRD analysis provided details not only in the polymer thin film but also about structure of the substrate surface, through which a structure determination factor of the polymer film has been revealed.

中文翻译:

聚(2-全氟辛基丙烯酸乙酯)浸涂薄膜中分子结构的红外多角度入射分辨光谱分析

红外多角度入射分辨光谱法(IR-MAIRS)已用于研究涂在Si衬底上的聚(2-氟代丙烯酸全氟辛基乙酯)(C8FA)薄膜中的分子取向。由于涂覆的C8FA膜表现出高效的拒水拒油性,因此到目前为止,主要通过使用X射线衍射仪(XRD)对其结构-性能关系进行了深入研究。无论如何,XRD仅提供膜中结晶部分的分子结构细节,因此有选择地分析了全氟烷基的有限区域。为了克服这一分析限制,IR-MAIRS首先用于分析涂覆在固体基材上的聚合物薄膜。
更新日期:2017-01-31
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