Piezo-generated charge mapping revealed through direct piezoelectric force microscopy.,Nature Communications

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Piezo-generated charge mapping revealed through direct piezoelectric force microscopy.
Nature Communications ( IF 14.7 ) Pub Date : 2017-10-24 , DOI: 10.1038/s41467-017-01361-2
A Gomez ₁ , M Gich ₁ , A Carretero-Genevrier ₂ , T Puig ₁ , X Obradors ₁

Affiliation

While piezoelectric and ferroelectric materials play a key role in many everyday applications, there are still a number of open questions related to their physics. To enhance our understanding of piezoelectrics and ferroelectrics, nanoscale characterization is essential. Here, we develop an atomic force microscopy based mode that obtains a direct quantitative analysis of the piezoelectric coefficient d₃₃. We report nanoscale images of piezogenerated charge in a thick single crystal of periodically poled lithium niobate (PPLN), a bismuth ferrite (BiFO₃) thin film, and lead zirconate titanate (PZT) by applying a force and recording the current produced by these materials. The quantification of d₃₃ coefficients for PPLN (14 ± 3 pC per N) and BFO (43 ± 6 pC per N) is in agreement with the values reported in the literature. Even stronger evidence of the reliability of the method is provided by an equally accurate measurement of the significantly larger d₃₃ of PZT.

中文翻译：

通过直接压电力显微镜揭示压电产生的电荷图。

虽然压电和铁电材料在许多日常应用中发挥着关键作用，但仍然存在许多与其物理相关的悬而未决的问题。为了增强我们对压电和铁电体的理解，纳米级表征至关重要。在这里，我们开发了一种基于原子力显微镜的模式，可以获得压电系数 d ₃₃的直接定量分析。我们通过施加力并记录这些材料产生的电流，报告了周期性极化铌酸锂 (PPLN)、铁酸铋 (BiFO ₃ ) 薄膜和锆钛酸铅 (PZT) 厚单晶中压电生成电荷的纳米级图像。 PPLN（14 ± 3 pC/N）和 BFO（43 ± 6 pC/N）的 d ₃₃系数的量化与文献中报告的值一致。对显着更大的 PZT d ₃₃进行同样准确的测量，提供了该方法可靠性的更有力证据。

更新日期：2017-10-24

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