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Unearthing [3-(Dimethylamino)propyl]aluminium(III) Complexes as Novel Atomic Layer Deposition (ALD) Precursors for Al2O3: Synthesis, Characterization and ALD Process Development
Chemistry - A European Journal ( IF 3.9 ) Pub Date : 2017-07-24 14:25:27 , DOI: 10.1002/chem.201702939
Lukas Mai 1 , Maximilian Gebhard 1 , Teresa de los Arcos 2 , Ignacio Giner 2 , Felix Mitschker 3 , Manuela Winter 1 , Harish Parala 1 , Peter Awakowicz 3 , Guido Grundmeier 2 , Anjana Devi 1
Affiliation  

Identification and synthesis of intramolecularly donor-stabilized aluminium(III) complexes, which contain a 3-(dimethylamino)propyl (DMP) ligand, as novel atomic layer deposition (ALD) precursors has enabled the development of new and promising ALD processes for Al2O3 thin films at low temperatures. Key for this promising outcome is the nature of the ligand combination that leads to heteroleptic Al complexes encompassing optimal volatility, thermal stability and reactivity. The first ever example of the application of this family of Al precursors for ALD is reported here. The process shows typical ALD like growth characteristics yielding homogeneous, smooth and high purity Al2O3 thin films that are comparable to Al2O3 layers grown by well-established, but highly pyrophoric, trimethylaluminium (TMA)-based ALD processes. This is a significant development based on the fact that these compounds are non-pyrophoric in nature and therefore should be considered as an alternative to the industrial TMA-based Al2O3 ALD process used in many technological fields of application.

中文翻译:

挖掘出[3-(二甲基氨基)丙基]铝(III)配合物作为Al2O3的新型原子层沉积(ALD)前体:合成,表征和ALD工艺开发

分子内供体稳定的铝(III)配合物,其中包含3-(二甲基氨基)丙基(DMP)配体,作为新型原子层沉积(ALD)前体的鉴定与合成,已经为Al 2开发了新的有前途的ALD工艺低温下的O 3薄膜。这种有希望的结果的关键是配体组合的性质,该配体组合导致杂合的Al络合物具有最佳的挥发性,热稳定性和反应性。这里报道了该Al前体家族在ALD中的应用的第一个例子。该过程示出了样生长特性典型的ALD得到均匀,光滑和高纯度的Al 2 ö 3薄膜是相当的Al 2O 3层通过成熟的但高度发火的三甲基铝(TMA)基ALD工艺生长。这些化合物本质上是非发火的,因此应被视为在许多技术应用领域中使用的基于工业TMA的Al 2 O 3 ALD工艺的替代品,这是一项重大进展。
更新日期:2017-07-25
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