使用V <sub>2</sub> O <sub>5</sub>和PEDOT：PSS复合层改善有机太阳能电池运行稳定性的XPS分析：不同大气条件的影响,The Journal of Physical Chemistry C

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使用V ₂ O ₅和PEDOT：PSS复合层改善有机太阳能电池运行稳定性的XPS分析：不同大气条件的影响
The Journal of Physical Chemistry C ( IF 3.3 ) Pub Date : 2017-03-30 00:00:00 , DOI: 10.1021/acs.jpcc.6b13016
Haya Alhummiany , Saqib Rafique ₁ , Khaulah Sulaiman ₁

Affiliation

这项工作研究了由掺有五氧化二钒（V ₂ O ₅）的混合空穴传输层（HTL）制成的有机太阳能电池（OSC）的增强的稳定性。）（3,4-乙撑二氧噻吩）：聚（苯乙烯磺酸盐）（PEDOT：PSS）中的纳米颗粒。通过使用原始的PEDOT：PSS HTL及其混合变体，可在受控的环境大气条件下制造OSC。分别通过使用光伏和X射线光电子能谱（XPS）测量进行稳定性和降解分析。归一化的光伏特性表明，当在充氮手套箱中进行制造并封装7天后对器件进行测试时，具有混合HTL的OSC优于原始器件，并保持了其性能。但是，在周围空气中制造和表征的OSC在光伏性能方面表现出严重的下降，主要是由于两种器件型号的短路电流和开路电压都急剧下降。此外，将XPS应用于探测HTL变体在环境空气中老化下的稳定性。器件的不稳定性主要归因于铟从阳极扩散到HTL中，其浓度在原始HTL暴露于环境的250小时内从0.4％增至2.8％，而杂化HTL的铟含量却没有显着增加。这证实了由于存在钒而引起的铟扩散的显着降低在原始HTL暴露于环境的250小时内达到8％，而杂种HTL的铟含量却没有显着增加。这证实了由于存在钒而引起的铟扩散的显着降低在原始HTL暴露于环境的250小时内达到8％，而杂种HTL的铟含量却没有显着增加。这证实了由于存在钒而引起的铟扩散的显着降低₂ O ₅纳米粒子。

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XPS Analysis of the Improved Operational Stability of Organic Solar Cells Using a V2O5 and PEDOT:PSS Composite Layer: Effect of Varied Atmospheric Conditions

This work investigates the enhanced stability of organic solar cells (OSCs) fabricated with a hybrid hole-transport layer (HTL) incorporating vanadium pentaoxide (V₂O₅) nanoparticles in poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS). OSCs have been fabricated in controlled and ambient atmospheric conditions by employing a pristine PEDOT:PSS HTL and its hybrid variant. Stability and degradation analyses were carried out by using photovoltaic and X-ray photoelectron spectroscopy (XPS) measurements, respectively. Normalized photovoltaic characteristics showed that OSCs with hybrid HTL outperformed the pristine device and retained their performance as compared to their pristine counterparts when the fabrication was carried out in a nitrogen-filled glovebox and devices were tested after encapsulation for 7 days. However, OSCs that were fabricated and characterized in ambient air showed severe degradation in photovoltaic performance, mainly due to a drastic decay in the short circuit current and open circuit voltage for both device variants. Further, XPS was applied to probe the stability of HTL variants under aging in ambient air. The device instability was mainly ascribed to indium diffusion from the anode into the HTL, and its concentration increased from 0.4 to 2.8% within 250 h of ambient exposure of pristine HTL, while an insignificant increase was recorded in the indium content of the hybrid HTL. This confirms the remarkable reduction in indium diffusion brought about by the presence of V₂O₅ nanoparticles.

更新日期：2017-03-30

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