聚合物刷子接枝到可变形表面的原子力显微镜研究：刷子的定量特性和基体力学,Macromolecules

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聚合物刷子接枝到可变形表面的原子力显微镜研究：刷子的定量特性和基体力学
Macromolecules ( IF 5.1 ) Pub Date : 2016-12-22 00:00:00 , DOI: 10.1021/acs.macromol.6b02149
Maxim E. Dokukin , Hidenori Kuroki ₁ , Sergiy Minko ₂ , Igor Sokolov

Affiliation

聚合物刷（端链拴在基材上的聚合物链）已通过原子力显微镜（AFM）进行了广泛研究。用AFM探针挤压样品表面时，会收集力-压痕曲线。这些曲线的分析允许通过使用适当的刷子机械变形模型来获得平衡的刷子厚度和接枝密度。然而，当基板可变形时，这种方法变得不准确，这是经常的情况。在这种情况下，收集的力-距离曲线包括有关刷子和基材变形的信息。在这里，我们描述了一种同时考虑了刷子变形和基材变形的方法。通过将该方法用于测量接枝到在不同酸度的水性介质中溶胀的交联聚（2-乙烯基吡啶）底物的聚环氧乙烷，可以证明本方法的定量精度。通过分析AFM力曲线，我们可以同时获得接枝密度，平衡刷厚度和基材的杨氏模量。通过对衬底杨氏模量的独立测量以及使用椭偏仪对刷子厚度的直接测量来验证该方法。该方法证明了基材的杨氏模量的估计值和直接测量值与刷子的分子特性之间有很好的一致性。我们同时获得了接枝密度，平衡刷厚度和基材的杨氏模量。通过对衬底杨氏模量的独立测量以及使用椭偏仪对刷子厚度的直接测量来验证该方法。该方法证明了基材的杨氏模量的估计值和直接测量值与刷子的分子特性之间有很好的一致性。我们同时获得了接枝密度，平衡刷厚度和基材的杨氏模量。通过对衬底杨氏模量的独立测量以及使用椭偏仪对刷子厚度的直接测量来验证该方法。该方法证明了基底的杨氏模量的估计值和直接测量值与刷子的分子特性之间的很好的一致性。

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AFM Study of Polymer Brush Grafted to Deformable Surfaces: Quantitative Properties of the Brush and Substrate Mechanics

Polymers brushes (polymer chains end-tethered to a substrate) have been extensively studied with atomic force microscopy (AFM). Force–indentation curves are collected while squeezing the sample surface with the AFM probe. The analysis of these curves allows obtaining the equilibrium brush thickness and grafting density by using an appropriate model for mechanical deformation of the brush. However, this approach becomes inaccurate when the substrate is deformable, which is frequently the case. In this situation, the collected force–distance curves include information about both the brush and substrate deformations. Here we describe a method which takes into account both the brush and substrate deformations. Quantitative accuracy of the presented method is demonstrated by applying the method to measuring a poly(ethylene oxide) brush grafted to the cross-linked poly(2-vinylpyridine) substrate swollen in aqueous media of different acidity. By analyzing the AFM force curves, we simultaneously obtain the grafting density, equilibrium brush thickness, and the Young’s modulus of the substrate. The method is verified by independent measurements of the substrate Young’s modulus and direct measurements of the brush thickness using ellipsometry. The method demonstrates a very good agreement between the estimated and directly measured Young’s modulus of the substrate and molecular characteristics of the brush.

更新日期：2016-12-22

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