The present study is aimed at the postulation of Ut genes in loose smut‐resistant bread wheat (Triticum aestivum L.) genotypes and establishing a correlation with their pedigree. Loose smut caused by Ustilago segetum tritici (Ust) is an internal seed‐borne disease of wheat that can be managed through chemical seed treatment. However, due to the absence of evident symptoms, seed treatment is not a regular practice in the farming community. Thus, the use of resistant cultivars is an efficient and sustainable approach for the management of loose smut of wheat. The majority of current wheat cultivars are susceptible to loose smut. Therefore, there is a pressing need for the development of resistant cultivars, which requires the identification of resistant donors with known resistant genes. In this study, field screening for 3 years resulted in the identification of 124 bread wheat genotypes conferring stable resistance against Ust race T11. Molecular marker‐based identification of Ut genes (Ut4–Ut11) revealed the presence of these genes either singly or in combination in 118 genotypes. Among them, six genotypes showed different combinations of five Ut genes, namely, WH 1218 and HI 1633 (Ut4, Ut6, Ut8, Ut9, Ut11), HD 3377 (Ut4, Ut6, Ut8, Ut9, Ut10), WH 1218 and HI 1633 (Ut4, Ut6, Ut9, Ut10, Ut11), and HD 3226 (Ut4, Ut5, Ut6, Ut9, Ut11). The genotypes with multiple genes for loose smut resistance can be used as donors for transferring the resistance into the high‐yielding cultivars. Furthermore, the pedigree of each genotype was analyzed to find the gene source of the postulated Ut genes. None of the genotypes showed consistent association with the gene source of the postulated Ut gene present in the pedigree. Thus, no association between molecular marker‐based postulation and pedigree of genotypes was inferred. However, the root pedigree of common parents revealed five putative sources of loose smut resistance, that is, Chris, Thatcher, Federation, New‐Thatch, and Ostka‐Galicyjska, in most of the genotypes under evaluation in the present study.

中文翻译：

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揭示印度面包小麦种质中松散的黑穗病抗性：基因假设和系谱分析


本研究旨在假设松散的抗黑穗病面包小麦 （Triticum aestivum L.） 基因型中的 Ut 基因，并建立与它们的系系的相关性。由 Ustilago segetum tritici （Ust） 引起的松散黑穗病是小麦的一种内部种子传播疾病，可以通过化学种子处理来控制。然而，由于没有明显的症状，种子处理在农业社区并不是一种常规做法。因此，使用抗性品种是管理小麦松散黑穗病的有效且可持续的方法。目前的大多数小麦品种都容易受到松散黑穗病的影响。因此，迫切需要开发抗性栽培品种，这需要识别具有已知抗性基因的抗性供体。在这项研究中，为期 3 年的田间筛选鉴定出 124 种面包小麦基因型，这些基因型赋予了对 Ust 种族 T11 的稳定抗性。基于分子标记的 Ut 基因鉴定 （Ut4-Ut11） 揭示了这些基因单独或组合存在于 118 种基因型中。其中，6个基因型表现出5个Ut基因的不同组合，分别为WH 1218和HI 1633（Ut4、Ut6、Ut8、Ut9、Ut11）、HD 3377（Ut4、Ut6、Ut8、Ut9、Ut10）、WH 1218和HI 1633（Ut4、Ut6、Ut9、Ut10、Ut11）和HD 3226（Ut4、Ut5、Ut6、Ut9、Ut11）。具有松散黑穗病抗性多个基因的基因型可用作将抗性转移到高产品种的供体。此外，分析了每种基因型的谱系，以找到假设的 Ut 基因的基因来源。没有一个基因型显示出与家系中存在的假设 Ut 基因的基因来源的一致关联。 因此，没有推断出基于分子标记的假设与基因型谱系之间的关联。然而，共同父母的根系谱揭示了松散黑穗病耐药性的五个假定来源，即 Chris、Thatcher、Federation、New-Thatch 和 Ostka-Galicyjska，在本研究中评估的大多数基因型中。