The deterioration of the endurance performance in the Hf‐based antiferroelectric (AFE) material is a crucial challenge in the reliability of its device applications, and it is important to identify the mechanism for further optimizations. In this work, a stochastic AFE dynamic model is proposed to characterize the fatigue behaviors induced by thermal noise‐induced lattice vibration. Through the analysis of the noise‐assisted phase transition between the antiferroelectric and ferroelectric (FE) phases, the impact of the thermal effect on endurance is evaluated and the results are in good agreement with the experiments. Both temperature and dipole coupling strength are found to be the key factors in noise‐induced fatigue. Furthermore, the thermal noise‐induced stochastic dynamics is found to have a profound impact in the AFE‐based memory's reliability, and the memory window demonstrates direct dependency on temperature and domain dynamics.

中文翻译：

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多域 Hf 基反铁电材料中热噪声诱导的相变：疲劳和耐久性能


基于 Hf 的反铁电 （AFE） 材料的耐久性能恶化是其器件应用可靠性的关键挑战，确定进一步优化的机制非常重要。在这项工作中，提出了一个随机 AFE 动力学模型来表征热噪声引起的晶格振动引起的疲劳行为。通过分析反铁电相和铁电 （FE） 相之间的噪声辅助相变，评估了热效应对耐久性的影响，结果与实验结果吻合较好。温度和偶极耦合强度都是噪声诱导疲劳的关键因素。此外，研究发现，热噪声诱导的随机动力学对基于 AFE 的存储器的可靠性有深远影响，并且存储器窗口表现出对温度和域动力学的直接依赖性。