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SmallNet: A Small Defects Detection Network for Magnetic Chips Based on Context-Weighted Aggregation and Feature Multiscale Loop Fusion
IEEE Transactions on Automation Science and Engineering ( IF 5.9 ) Pub Date : 2024-12-20 , DOI: 10.1109/tase.2024.3517537 Weijian Liang, Yaoru Sun, Siyu Zhang, Lizhi Bai, Jun Yang
更新日期：2024-12-20
IEEE Transactions on Automation Science and Engineering ( IF 5.9 ) Pub Date : 2024-12-20 , DOI: 10.1109/tase.2024.3517537 Weijian Liang, Yaoru Sun, Siyu Zhang, Lizhi Bai, Jun Yang
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