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Capillary Force-Assisted CsPbBr3–xIx (x = 0, 1) Columnar Crystal Film for X-ray Detectors with Ultrahigh Electric Field and Sensitivity
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2024-12-18 , DOI: 10.1021/acsami.4c18212
Sixin Chen, Meng Xu, Zhaolin Song, Yiran Shi, Ruichen Bai, Wanqi Jie, Menghua Zhu

Inorganic halide perovskite thin-film X-ray detectors have attracted great research interest in recent years due to their high sensitivity, low detection limit, and facile fabrication process. The poor crystal quality of the thin film with uncontrollable thickness and low background voltage during detection limits its practical application. Here, a high-quality CsPbBr3–xIx (x = 0, 1) columnar crystal film is prepared by an improved melt-confined method with a porous anodic aluminum oxide (AAO) template, which stabilizes the disorder perovskite systems of CsPbBr2I by stress. The AAO-CsPbBr3–xIx (x = 0) detectors exhibit high detection accuracy and photoelectric conversion capability with an ultrahigh sensitivity of 32,399.5 μC·Gyair–1·cm–2 at 2142.9 V mm–1 under 20 kVp X-rays and 19,217.4 μC·Gyair–1·cm–2 with a higher background electric field of 6666.7 V mm–1 for AAO-CsPbBr3–xIx (x = 1). Moreover, the AAO-CsPbBr3–xIx (x = 1) film detector acquires a lower detection limit of 7.65 nGy·s–1 and a higher X-ray imaging spatial resolution of 1.6 LP/mm and 8.6 nGy·s–1 and 1.4 LP/mm for AAO-CsPbBr3–xIx (x = 0). The facile, high-quality columnar crystal film devices display great potential for low-energy and low-dose X-ray imaging in flat panel detection applications.

中文翻译:


毛细管力辅助 CsPbBr3–xIx (x = 0, 1) 柱状晶体膜,用于具有超高电场和灵敏度的 X 射线探测器



无机卤化物钙钛矿薄膜 X 射线探测器因其高灵敏度、低检出限和简单的制造工艺,近年来引起了极大的研究兴趣。薄膜的晶体质量差,厚度不可控,检测过程中背景电压低,限制了其实际应用。在这里,通过改进的熔融限制方法和多孔阳极氧化铝 (AAO) 模板制备了高质量的 CsPbBr3–xIxx = 0, 1) 柱状晶体膜,该模板通过应力稳定了 CsPbBr2I 的无序钙钛矿系统。AAO-CsPbBr3–xIxx = 0) 探测器具有较高的探测精度和光电转换能力,具有 32,399.5 μC·在 2142.9 V mm–1 下 Gyair–1·cm–2 在 20 kVp X 射线和 19,217.4 μC·Gy空气–1·cm–2 具有 6666.7 V mm–1 的较高背景电场,对于 AAO-CsPbBr3–xIxx = 1)。此外,AAO-CsPbBr3–xIxx = 1) 胶片探测器的检测下限为 7.65 nGy·s–1,较高的 X 射线成像空间分辨率为 1.6 LP/mm,AAO-CsPbBr3–xIxx = 0) 为 8.6 nGy·s–1 和 1.4 LP/mm。这种简便、高质量的柱状晶体薄膜器件在平板检测应用中显示出低能量和低剂量 X 射线成像的巨大潜力。
更新日期:2024-12-19
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