In technology, old or new, from basic imaging through a camera lens to advanced applications such as fluorescence microscopy and optical lithography, there are countless examples that would be inconceivable without the utilization of focused light. As technology evolves, the demands on spatially confined light fields grow but so do the challenges of accurately characterizing these complex fields. This study introduces a technique to measure the full vectorial nature of light, reaching sub/wavelength spatial resolution while capturing the 3D amplitude and phase for both electric and magnetic fields. This is achieved based on a polarization-resolved far-field analysis of light scattered by a single spherical nanoparticle acting as a local probe. For experimental verification, the method is applied to tightly focused light fields under various input scenarios. Offering high resolution, precision, and flexibility, this technique shows great promise for both fundamental research and applications in technologies relying on highly localized light fields.

中文翻译：

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纳米级矢量电场和磁场测量


在技术中，无论新旧，从通过相机镜头进行基本成像到荧光显微镜和光学光刻等高级应用，如果没有利用聚焦光，无数的例子是不可想象的。随着技术的发展，对空间受限光场的需求越来越大，但准确表征这些复杂光场的挑战也越来越大。本研究介绍了一种测量光的全矢量性质的技术，在捕获电场和磁场的 3D 振幅和相位的同时达到亚/波长空间分辨率。这是基于对充当局部探针的单个球形纳米颗粒散射的光的偏振分辨远场分析实现的。为了进行实验验证，该方法应用于各种输入场景下的紧密聚焦光场。该技术具有高分辨率、高精度和灵活性，在依赖高度局部光场的技术的基础研究和应用方面显示出巨大的前景。