Precisely quantifying the adhesion energy of delicate nanobelts on rough substrates remains challenging due to their disparate surface properties and nanoscale dimensions. To overcome these challenges, we propose an optical microscopy-based bridging method to quantify the adhesion energy of ZnS nanobelts on Si substrates in air. Our results revealed that the nanobelt–smooth substrate interfacial system exhibits an enhanced adhesion due to electrostatic interactions between the polar nanobelt surfaces and the polarized Si substrate. While, for the nanobelt–rough substrate system, adhesion energy values decreased from 0.23 to 0.10 J/m2, showing an inverse square root relationship with increasing roughness from 0.17 to 1.12 nm, deviating from the trend predicted by the parallel plate model, due to the real contact separation distance influenced by surface asperities and nanobelt–substrate conformity. Our method offers a simple and accurate approach for characterizing roughness-dependent adhesion of nanobelt–substrate systems in air, providing valuable insights for device fabrication and performance stability.

中文翻译：

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基于光学显微镜的桥接方法，用于量化空气中 ZnS 纳米带在硅衬底上的粗糙度依赖性粘附力


由于粗糙基材上的精密纳米带具有不同的表面特性和纳米级尺寸，精确量化其粘附能仍然具有挑战性。为了克服这些挑战，我们提出了一种基于光学显微镜的桥接方法来量化空气中 ZnS 纳米带在 Si 衬底上的粘附能。我们的结果表明，由于极性纳米带表面和极化 Si 衬底之间的静电相互作用，纳米带-光滑衬底界面系统表现出增强的粘附力。而对于纳米带-粗糙基材系统，粘附能值从 0.23 J/m2 降低到 0.10 J/m2，表现出与粗糙度从 0.17 增加到 1.12 nm 的平方根反比关系，偏离了平行板模型预测的趋势，因为实际接触分离距离受表面粗糙度和纳米带-基材一致性的影响。我们的方法提供了一种简单而准确的方法来表征纳米带-基材系统在空气中的粗糙度依赖性粘附力，为器件制造和性能稳定性提供了有价值的见解。