In situ and operando (scanning) transmission electron microscopy [(S)TEM] is a powerful characterization technique that uses imaging, diffraction, and spectroscopy to gain nano-to-atomic scale insights into the structure–property relationships in materials. This technique is both customizable and complex because many factors impact the ability to collect structural, compositional, and bonding information from a sample during environmental exposure or under application of an external stimulus. In the past two decades, in situ and operando (S)TEM methods have diversified and grown to encompass additional capabilities, higher degrees of precision, dynamic tracking abilities, enhanced reproducibility, and improved analytical tools. Much of this growth has been shared through the community and within commercialized products that enable rapid adoption and training in this approach. This tutorial aims to serve as a guide for students, collaborators, and nonspecialists to learn the important factors that impact the success of in situ and operando (S)TEM experiments and assess the value of the results obtained. As this is not a step-by-step guide, readers are encouraged to seek out the many comprehensive resources available for gaining a deeper understanding of in situ and operando (S)TEM methods, property measurements, data acquisition, reproducibility, and data analytics.

中文翻译：

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用于分析纳米级结构-性能关系的原位和原位（扫描）透射电子显微镜教程


原位和原位（扫描）透射电子显微镜 [（S）TEM] 是一种强大的表征技术，它使用成像、衍射和光谱来获得对材料结构-性能关系的纳米到原子级见解。该技术既可定制又复杂，因为许多因素会影响在环境暴露期间或施加外部刺激时从样品中收集结构、成分和粘合信息的能力。在过去的二十年里，原位和原位 （S）TEM 方法已经多样化并发展到包括额外的功能、更高的精度、动态跟踪能力、增强的重现性和改进的分析工具。这种增长的大部分是通过社区和商业化产品共享的，这些产品支持这种方法的快速采用和培训。本教程旨在为学生、合作者和非专业人士提供指南，以学习影响原位和原位 （S）TEM 实验成功的重要因素，并评估所获结果的价值。由于这不是分步指南，因此鼓励读者寻找许多可用的综合资源，以更深入地了解原位和原位 （S）TEM 方法、特性测量、数据采集、可重复性和数据分析。