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Die Failure Degree Evaluation Method in Multi-Die IGBT Power Modules Based on Turn-Off Gate Voltage Undershoot and Overshoot
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-12-16 , DOI: 10.1109/jestpe.2024.3518626 Mingchao Zhou, Lei Wang, Lijun Diao, Yanbei Sha, Ningning Wei, Zheming Jin, Benchao Zhu
中文翻译：
基于关断栅极电压下冲和过冲的多晶粒 IGBT 功率模块失效度评估方法
更新日期：2024-12-16
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-12-16 , DOI: 10.1109/jestpe.2024.3518626 Mingchao Zhou, Lei Wang, Lijun Diao, Yanbei Sha, Ningning Wei, Zheming Jin, Benchao Zhu
中文翻译：
基于关断栅极电压下冲和过冲的多晶粒 IGBT 功率模块失效度评估方法
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